Therapist in Double Exposure

1964 ◽  
Vol 9 (1) ◽  
pp. 2-3
Author(s):  
FRED FOSMIRE
Keyword(s):  
Double Exposure

A Device for Magnification Measurement

1972 ◽  
Vol 30 ◽  
pp. 622-623
Author(s):  
J.A. Eades ◽  
A. van Dun
Keyword(s):  
Electron Microscope ◽  
Small Displacement ◽  
Private Communication ◽  
Piezoelectric Crystal ◽  
Double Exposure ◽  
Standard Methods ◽  
Elegant Method ◽  
The Right ◽  
Piezo Electric

The measurement of magnification in the electron microscope is always troublesome especially when a goniometer stage is in use, since there can be wide variations from calibrated values. One elegant method (L.M.Brown, private communication) of avoiding the difficulties of standard methods would be to fit a device which displaces the specimen a small but known distance and recording the displacement by a double exposure. Such a device would obviate the need for changing the specimen and guarantee that the magnification was measured under precisely the conditions used.Such a small displacement could be produced by any suitable transducer mounted in one of the specimen translation mechanisms. In the present case a piezoelectric crystal was used. Modern synthetic piezo electric ceramics readily give reproducible displacements in the right range for quite modest voltages (for example: Joyce and Wilson, 1969).

Double exposure forecasting lens

Futures ◽  
2010 ◽  
Vol 42 (1) ◽  
pp. 95-97
Author(s):  
Irving H. Buchen
Keyword(s):  
Double Exposure

Definition of 15nm half pitch grating structures by electron beam lithography double exposure techniques

2013 ◽  
Vol 110 ◽  
pp. 224-228 ◽  
Author(s):  
Jens Bolten ◽  
Namil Koo ◽  
Thorsten Wahlbrink ◽  
Heinrich Kurz
Keyword(s):  
Electron Beam ◽  
Electron Beam Lithography ◽  
Double Exposure ◽  
Definition Of

Holographic Evaluation of Edge Delamination in Bars Bonded to a Rigid Support With Foam-Adhesive

1996 ◽  
Vol 118 (3) ◽  
pp. 330-334 ◽  
Author(s):  
S. Qin ◽  
H. M. Shang ◽  
C. L. Giam ◽  
C. E. Tee
Keyword(s):  
Theoretical Analysis ◽  
Rapid Detection ◽  
Iterative Procedure ◽  
Point Load ◽  
Nonlinear Relationship ◽  
Rigid Support ◽  
Double Exposure ◽  
Simple Method ◽  
Exposure Holography ◽  
Edge Delamination

When a bar having one end bonded to a rigid support with foam-adhesive is loaded, the high peeling stresses at the bonded edge foster edge delamination along the interface of bonding. Upon inspection by double exposure holography, with an incremental point load applied at the free end of the bar between exposures, the indistinct fringe perturbation and the unknown resilience of the foam-adhesive (quantified by its foundation modulus) impede unambiguous evaluation of the condition of adhesion. This paper describes a simple method for rapid detection and assessment of artificially created edge delamination in such bar structures. The theoretical analysis elucidates the suitability of modelling the bar as partially clamped, and having an equivalent slope at its support related to the foundation modulus. Two dimensionless parameters are defined, which have between them a linear relationship for a nondelaminated bonding but a nonlinear relationship for a delaminated one. Finally, a simple iterative procedure is described for estimating the delaminated length without having to predetermine the elasticity of the support.

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