A photographic study of changes of the infrared emission of the polar aurora

1951 ◽  
Vol 32 (5) ◽  
pp. 679 ◽  
Author(s):  
L. Herman ◽  
H. Leinbach
Keyword(s):  
Infrared Emission ◽  
Polar Aurora

Detection and Characterization of earth-like Planets

1997 ◽  
Vol 161 ◽  
pp. 299-311 ◽  
Author(s):  
Jean Marie Mariotti ◽  
Alain Léger ◽  
Bertrand Mennesson ◽  
Marc Ollivier
Keyword(s):  
Direct Detection ◽  
Contrast Ratio ◽  
Angular Size ◽  
Physical Nature ◽  
Major Axis ◽  
Infrared Emission ◽  
Space Technology ◽  
Semi Major Axis ◽  
Earth Like Planets ◽  
Visible Wavelengths

AbstractIndirect methods of detection of exo-planets (by radial velocity, astrometry, occultations,...) have revealed recently the first cases of exo-planets, and will in the near future expand our knowledge of these systems. They will provide statistical informations on the dynamical parameters: semi-major axis, eccentricities, inclinations,... But the physical nature of these planets will remain mostly unknown. Only for the larger ones (exo-Jupiters), an estimate of the mass will be accessible. To characterize in more details Earth-like exo-planets, direct detection (i.e., direct observation of photons from the planet) is required. This is a much more challenging observational program. The exo-planets are extremely faint with respect to their star: the contrast ratio is about 10−10at visible wavelengths. Also the angular size of the apparent orbit is small, typically 0.1 second of arc. While the first point calls for observations in the infrared (where the contrast goes up to 10−7) and with a coronograph, the latter implies using an interferometer. Several space projects combining these techniques have been recently proposed. They aim at surveying a few hundreds of nearby single solar-like stars in search for Earth-like planets, and at performing a low resolution spectroscopic analysis of their infrared emission in order to reveal the presence in the atmosphere of the planet of CO H2O and O3. The latter is a good tracer of the presence of oxygen which could be, like on our Earth, released by biological activity. Although extremely ambitious, these projects could be realized using space technology either already available or in development for others missions. They could be built and launched during the first decades on the next century.

Infrared Emission Spectroscopy as a Reliability Tool

1999 ◽  
Author(s):  
Q. Kim ◽  
S. Kayali
Keyword(s):  
Spatial Resolution ◽  
Emission Spectroscopy ◽  
Hot Spot ◽  
Cost Effective ◽  
Infrared Emission ◽  
Test System ◽  
Operating Conditions ◽  
Yield Enhancement ◽  
Infrared Emission Spectroscopy ◽  
Channel Temperature

Abstract In this paper, we report on a non-destructive technique, based on IR emission spectroscopy, for measuring the temperature of a hot spot in the gate channel of a GaAs metal/semiconductor field effect transistor (MESFET). A submicron-size He-Ne laser provides the local excitation of the gate channel and the emitted photons are collected by a spectrophotometer. Given the state of our experimental test system, we estimate a spectral resolution of approximately 0.1 Angstroms and a spatial resolution of approximately 0.9 μm, which is up to 100 times finer spatial resolution than can be obtained using the best available passive IR systems. The temperature resolution (<0.02 K/μm in our case) is dependent upon the spectrometer used and can be further improved. This novel technique can be used to estimate device lifetimes for critical applications and measure the channel temperature of devices under actual operating conditions. Another potential use is cost-effective prescreening for determining the 'hot spot' channel temperature of devices under normal operating conditions, which can further improve device design, yield enhancement, and reliable operation. Results are shown for both a powered and unpowered MESFET, demonstrating the strength of our infrared emission spectroscopy technique as a reliability tool.

Failure Analysis of Short Faults on Advanced Wire-Bond and Flip-Chip Packages with Scanning SQUID Microscopy

2004 ◽  
Author(s):  
Steve K. Hsiung ◽  
Kevan V. Tan ◽  
Andrew J. Komrowski ◽  
Daniel J. D. Sullivan ◽  
Jan Gaudestad
Keyword(s):  
Magnetic Fields ◽  
Integrated Circuits ◽  
Quantum Interference ◽  
Flip Chip ◽  
Infrared Emission ◽  
Fault Analysis ◽  
Wire Bond ◽  
Overlay Design ◽  
Scanning Squid ◽  
Metal Layers

Abstract Scanning SQUID (Superconducting Quantum Interference Device) Microscopy, known as SSM, is a non-destructive technique that detects magnetic fields in Integrated Circuits (IC). The magnetic field, when converted to current density via Fast Fourier Transform (FFT), is particularly useful to detect shorts and high resistance (HR) defects. A short between two wires or layers will cause the current to diverge from the path the designer intended. An analyst can see where the current is not matching the design, thereby easily localizing the fault. Many defects occur between or under metal layers that make it impossible using visible light or infrared emission detecting equipment to locate the defect. SSM is the only tool that can detect signals from defects under metal layers, since magnetic fields are not affected by them. New analysis software makes it possible for the analyst to overlay design layouts, such as CAD Knights, directly onto the current paths found by the SSM. In this paper, we present four case studies where SSM successfully localized short faults in advanced wire-bond and flip-chip packages after other fault analysis methods failed to locate the defects.

Development of Models for Infrared Emission in the Upper Atmosphere.

1986 ◽  
Author(s):  
Peter P. Wintersteiner ◽  
Robert A. Joseph
Keyword(s):  
Infrared Emission ◽  
Upper Atmosphere

Directionally-Tailored Infrared Emission. AFRL STTR Program

2015 ◽  
Author(s):  
David Bruce Burckel ◽  
David W. Peters ◽  
Paul Davids ◽  
Paul J. Resnick ◽  
Paul G. Clem ◽  
...  
Keyword(s):  
Infrared Emission

scholarly journals Amphiprotism-Coupled Near-Infrared Emission in Extended Pyrazinacenes Containing Seven Linearly Fused Pyrazine Units

2019 ◽  
Vol 141 (50) ◽  
pp. 19570-19574 ◽  
Author(s):  
Gary J. Richards ◽  
Aël Cador ◽  
Shinji Yamada ◽  
Anna Middleton ◽  
Whitney A. Webre ◽  
...  
Keyword(s):  
Near Infrared ◽  
Infrared Emission ◽  
Near Infrared Emission

The Use of Ratio-Recording Interferometry for the Measurement of Infrared Emission Spectra: Applications to Oxide Films on Copper Surfaces

1975 ◽  
Vol 29 (6) ◽  
pp. 496-500 ◽  
Author(s):  
D. Kember ◽  
N. Sheppard
Keyword(s):  
Emission Spectra ◽  
Black Body ◽  
Infrared Emission ◽  
Thin Layers ◽  
Oxide Surface ◽  
Surface Layers ◽  
Selective Reflection ◽  
Copper Surfaces ◽  
Emission And Absorption Spectra ◽  
Direct Correspondence

Infrared emission spectra from metal samples with oxide surface layers are shown to be very advantageously studied using the spectrum-ratioing facility of a recording infrared interferometer. The emission from a given sample is ratioed against that from a black-body emitter at the same temperature so as to give emittance as a function of wavenumber directly. This method has very useful application to irregularly shaped metal emitters. In the absence of selective reflection there is a direct correspondence between emission and absorption spectra for thin layers of an emitting substance. However, the presence of selective reflection leads to reduced emission and to considerable differences in the appearance of “absorption” and emission spectra in regions of strong absorption. Emission spectra obtained from copper plates heated, above 150°C, for different periods in air are shown clearly to indicate the presence of cuprous, Cu(I), and cupric, Cu(II), oxides in the surface layer.

Broadband near-infrared emission of K3ScF6:Cr3+ phosphors for night vision imaging system sources

2021 ◽  
Vol 417 ◽  
pp. 129271
Author(s):  
Haojun Yu ◽  
Jian Chen ◽  
Ruiyu Mi ◽  
Juyu Yang ◽  
Yan-gai Liu
Keyword(s):  
Near Infrared ◽  
Imaging System ◽  
Infrared Emission ◽  
Night Vision ◽  
Near Infrared Emission
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