Lunar surface composition and solar wind-Induced secondary ion mass spectrometry

1991 ◽  
Vol 18 (11) ◽  
pp. 2165-2168 ◽  
Author(s):  
R. C. Elphic ◽  
H. O. Funsten ◽  
B. L. Barraclough ◽  
D. J. McComas ◽  
M. T. Paffett ◽  
...  
Keyword(s):  
Mass Spectrometry ◽  
Solar Wind ◽  
Lunar Surface ◽  
Secondary Ion Mass Spectrometry ◽  
Surface Composition ◽  
Ion Mass Spectrometry ◽  
Lunar Surface Composition ◽  
Secondary Ion

scholarly journals ToF-SIMS studies of the surface of Pd/ZrO2-TiO2 catalyst used in the hydrodechlorination process

2007 ◽  
Vol 9 (3) ◽  
pp. 81-85 ◽  
Author(s):  
Jacek Grams ◽  
Jacek Góralski ◽  
Joanna Kleczewska ◽  
Bożena Szczepaniak ◽  
Tadeusz Paryjczak
Keyword(s):  
Mass Spectrometry ◽  
Secondary Ion Mass Spectrometry ◽  
Surface Composition ◽  
Time Of Flight ◽  
Tio2 Catalyst ◽  
Tof Sims ◽  
Ion Mass Spectrometry ◽  
Secondary Ion

ToF-SIMS studies of the surface of Pd/ZrO2-TiO2 catalyst used in the hydrodechlorination process Time-of-flight secondary ion mass spectrometry (ToF-SIMS) was used in order to obtain the information about the surface composition of Pd/ZrO2-TiO2 catalyst and to estimate the changes in the concentration of particular components on its surface during the hydrodechlorination of CCl4. The results demonstrated that the hydrodechlorination process led to the increase in the concentration of chlorine and the drop in the amount of surface accessible palladium, while the quantity of Pd-Cl bounds did not change considerably. It suggested that the presence of ZrO2 protected the surface of the studied catalyst against the formation of PdCl2.

Applications of Time-OF-Flight Secondary Ion Mass Spectrometry (TOF-SIMS)

1990 ◽  
Vol 48 (2) ◽  
pp. 308-309
Author(s):  
Bruno Schueler ◽  
Robert W. Odom
Keyword(s):  
Mass Spectrometry ◽  
Secondary Ion Mass Spectrometry ◽  
Structural Information ◽  
Time Of Flight ◽  
Biological Tissues ◽  
Polymer Surfaces ◽  
Tof Sims ◽  
Secondary Ions ◽  
Ion Mass Spectrometry ◽  
Secondary Ion

Time-of-flight secondary ion mass spectrometry (TOF-SIMS) provides unique capabilities for elemental and molecular compositional analysis of a wide variety of surfaces. This relatively new technique is finding increasing applications in analyses concerned with determining the chemical composition of various polymer surfaces, identifying the composition of organic and inorganic residues on surfaces and the localization of molecular or structurally significant secondary ions signals from biological tissues. TOF-SIMS analyses are typically performed under low primary ion dose (static SIMS) conditions and hence the secondary ions formed often contain significant structural information.This paper will present an overview of current TOF-SIMS instrumentation with particular emphasis on the stigmatic imaging ion microscope developed in the authors’ laboratory. This discussion will be followed by a presentation of several useful applications of the technique for the characterization of polymer surfaces and biological tissues specimens. Particular attention in these applications will focus on how the analytical problem impacts the performance requirements of the mass spectrometer and vice-versa.

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