scholarly journals Estimating the daytime Equatorial Ionization Anomaly strength from electric field proxies

2008 ◽  
Vol 113 (A9) ◽  
pp. n/a-n/a ◽  
Author(s):  
C. Stolle ◽  
C. Manoj ◽  
H. Lühr ◽  
S. Maus ◽  
P. Alken
2009 ◽  
Vol 114 (A3) ◽  
pp. n/a-n/a ◽  
Author(s):  
N. Balan ◽  
K. Shiokawa ◽  
Y. Otsuka ◽  
S. Watanabe ◽  
G. J. Bailey

1997 ◽  
Vol 15 (2) ◽  
pp. 255-262 ◽  
Author(s):  
P. T. Jayachandran ◽  
P. Sri Ram ◽  
V. V. Somayajulu ◽  
P. V. S. Rama Rao

Abstract. The unique geometry of the geomagnetic field lines over the equatorial ionosphere coupled with the E-W electric field causes the equatorial ionization anomaly (EIA) and equatorial spread-F (ESF). Ionosonde data obtained at a chain of four stations covering equator to anomaly crest region (0.3 to 33 °N dip) in the Indian sector are used to study the role of EIA and the associated processes on the occurrence of ESF. The study period pertains to the equinoctial months (March, April, September and October) of 1991. The ratios of critical frequency of F-layer (ƒ0F2) and electron densities at an altitude of 270 km between Ahmedabad (33 °N dip) and Waltair (20 °N dip) are found to shoot up in the afternoon hours on spread-F days showing strengthening of the EIA in the afternoon hours. The study confirms the earlier conclusions made by Raghava Rao et al. and Alex et al. that a well-developed EIA is one of the conditions conducive for the generation of ESF. This study also shows that the location of the crest is also important in addition to the strength of the anomaly.


Radio Science ◽  
2018 ◽  
Vol 53 (5) ◽  
pp. 683-697 ◽  
Author(s):  
Sovit M. Khadka ◽  
Cesar E. Valladares ◽  
Robert Sheehan ◽  
Andrew J. Gerrard

Author(s):  
G. F. Rempfer

In photoelectron microscopy (PEM), also called photoemission electron microscopy (PEEM), the image is formed by electrons which have been liberated from the specimen by ultraviolet light. The electrons are accelerated by an electric field before being imaged by an electron lens system. The specimen is supported on a planar electrode (or the electrode itself may be the specimen), and the accelerating field is applied between the specimen, which serves as the cathode, and an anode. The accelerating field is essentially uniform except for microfields near the surface of the specimen and a diverging field near the anode aperture. The uniform field forms a virtual image of the specimen (virtual specimen) at unit lateral magnification, approximately twice as far from the anode as is the specimen. The diverging field at the anode aperture in turn forms a virtual image of the virtual specimen at magnification 2/3, at a distance from the anode of 4/3 the specimen distance. This demagnified virtual image is the object for the objective stage of the lens system.


Author(s):  
Patrick P. Camus

The theory of field ion emission is the study of electron tunneling probability enhanced by the application of a high electric field. At subnanometer distances and kilovolt potentials, the probability of tunneling of electrons increases markedly. Field ionization of gas atoms produce atomic resolution images of the surface of the specimen, while field evaporation of surface atoms sections the specimen. Details of emission theory may be found in monographs.Field ionization (FI) is the phenomena whereby an electric field assists in the ionization of gas atoms via tunneling. The tunneling probability is a maximum at a critical distance above the surface,xc, Fig. 1. Energy is required to ionize the gas atom at xc, I, but at a value reduced by the appliedelectric field, xcFe, while energy is recovered by placing the electron in the specimen, φ. The highest ionization probability occurs for those regions on the specimen that have the highest local electric field. Those atoms which protrude from the average surfacehave the smallest radius of curvature, the highest field and therefore produce the highest ionizationprobability and brightest spots on the imaging screen, Fig. 2. This technique is called field ion microscopy (FIM).


1993 ◽  
Vol 3 (8) ◽  
pp. 1201-1225 ◽  
Author(s):  
G. N�ron de Surgy ◽  
J.-P. Chabrerie ◽  
O. Denoux ◽  
J.-E. Wesfreid

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