scholarly journals Low energy neutral atoms in the magnetosphere

2001 ◽  
Vol 28 (6) ◽  
pp. 1143-1146 ◽  
Author(s):  
T. E. Moore ◽  
M. R. Collier ◽  
J. L. Burch ◽  
D. J. Chornay ◽  
S. A. Fuselier ◽  
...  
Keyword(s):  
Low Energy ◽  
Neutral Atoms

What Does Our Heliosphere Look Like in Energetic Neutral Atoms? Some Recommendations for a Low-Energy ENA Camera Onboard the Interstellar Probe

2019 ◽  
Author(s):  
André Galli ◽  
Peter Wurz ◽  
Jens Kleimann ◽  
Horst Fichtner ◽  
Yoshifumi Futaana ◽  
...  
Keyword(s):  
Low Energy ◽  
Neutral Atoms ◽  
Energetic Neutral Atoms ◽  
Interstellar Probe

Low energy neutral atoms imaging of the Moon

2006 ◽  
Vol 54 (2) ◽  
pp. 132-143 ◽  
Author(s):  
Yoshifumi Futaana ◽  
Stas Barabash ◽  
Mats Holmström ◽  
Anil Bhardwaj
Keyword(s):  
Low Energy ◽  
The Moon ◽  
Neutral Atoms

Can we use graphene as a conversion surface for a neutral particle detector?

2020 ◽  
Author(s):  
Alexander Grigoriev ◽  
Andrei Fedorov ◽  
Nicolas André
Keyword(s):  
Secondary Electron ◽  
Grazing Angle ◽  
Secondary Electron Emission ◽  
Incident Beam ◽  
Particle Energy ◽  
Low Energy ◽  
Wafer Surface ◽  
Neutral Atoms ◽  
Energetic Neutral Atoms ◽  
First Case

<p>An important technique of modern space plasma diagnostics is a detection and imaging of low energy (below 10 keV) energetic neutral atoms (ENA). Any space mission devoted to study of the planetary plasma environments, planetary magnetospheres and heliosphere boundaries, needs a low energy ENA imaging sensor in its payload list. A common approach to the ENA detection/imaging is to make energetic neutral atoms glance a high quality conductive surface and either produce a secondary electron, or produce a positive or negative reflection ion. In the first case we can collect and detect the yielded secondary electron and generate a start signal. The reflected neutral atom can be directed to another surface with a high secondary electron yield. Thus we can measure a time-of-flight of the reflected particle to get its velocity. In the second case we can analyze the reflected ion in an electrostatic analyzer to get the particle energy.</p><p>Many types of conversion surfaces have been investigated over last decades in order to optimize an ENA sensor properties. We investigated properties of a thin layer of graphene applied to a silicon wafer surface. The experimental setup consisted of a secondary electron detector, neutral/ions separator and a high resolution particle imager. We used an incident He beam with energy of 200 eV - 3000 eV. We obtained a secondary electron emission, particle reflection efficiency, scattering properties, and a positive ion production rate as a function of the incident beam energy and the grazing angle. The experiment results show that 1) Graphene is a good source of secondary electrons even for low energy incident particles; 2) ENA scatter from the graphene surface similar to other surface types; 3) Graphene does not convert incident ENA to positive ions, especially for high grazing angles.</p>

Charge transfer in low-energy collisions ofHe2+andLi3+with various neutral atoms

1984 ◽  
Vol 29 (5) ◽  
pp. 2448-2452 ◽  
Author(s):  
Mark T. Stollberg ◽  
Hai-Woong Lee
Keyword(s):  
Charge Transfer ◽  
Low Energy ◽  
Neutral Atoms

ELENA microchannel plate detector: absolute detection efficiency for low energy neutral atoms

2013 ◽  
Vol 52 (5) ◽  
pp. 051206 ◽  
Author(s):  
Rosanna Rispoli ◽  
Elisabetta De Angelis ◽  
Luca Colasanti ◽  
Nello Vertolli ◽  
Stefano Orsini ◽  
...  
Keyword(s):  
Detection Efficiency ◽  
Low Energy ◽  
Microchannel Plate ◽  
Neutral Atoms
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