Retrieving the vertical structure of the effective aerosol complex index of refraction from a combination of aerosol in situ and remote sensing measurements during TARFOX

2000 ◽  
Vol 105 (D8) ◽  
pp. 9949-9970 ◽  
Author(s):  
J. Redemann ◽  
R. P. Turco ◽  
K. N. Liou ◽  
P. B. Russell ◽  
R. W. Bergstrom ◽  
...  
Keyword(s):  
Remote Sensing ◽  
Vertical Structure ◽  
Index Of Refraction ◽  
Complex Index ◽  
Complex Index Of Refraction

Measurements of the Thermal Radiative Properties of Liquid Uranium

1993 ◽  
Vol 115 (4) ◽  
pp. 1013-1020 ◽  
Author(s):  
M. A. Havstad ◽  
W. McLean ◽  
S. A. Self
Keyword(s):  
Spectral Emissivity ◽  
Index Of Refraction ◽  
Radiative Properties ◽  
Optical Systems ◽  
Normal Spectral Emissivity ◽  
Complex Index ◽  
Thermal Radiative Properties ◽  
Infrared Wavelengths ◽  
Complex Index Of Refraction

Measurements of the thermal radiative properties of liquid uranium have been made using an instrument with two optical systems, one for measuring the complex index of refraction by ellipsometry, the other for measuring the normal spectral emissivity by direct comparison to an integral blackbody cavity. The measurements cover the wavelength range 0.4–10 μm with sample temperatures between 1410 and 1630 K. Two 5-KeV ion sputter guns and an Auger spectrometer produce and verify, in situ, atomically pure sample surfaces. Good agreement between the two methods is observed for the normal spectral emissivity, which varies with wavelength in a manner typical of transition metals. The two components of the complex index of refraction—the index of refraction and the extinction coefficient—increase with wavelength, from ~3 at 0.4 μm to ~20 at 9.5 μm. Both components of polarized reflectivity are shown for visible to infrared wavelengths.

scholarly journals Aerosol optical and microphysical retrievals from a hybrid multiwavelength lidar data set – DISCOVER-AQ 2011

2014 ◽  
Vol 7 (9) ◽  
pp. 3095-3112 ◽  
Author(s):  
P. Sawamura ◽  
D. Müller ◽  
R. M. Hoff ◽  
C. A. Hostetler ◽  
R. A. Ferrare ◽  
...  
Keyword(s):  
Remote Sensing ◽  
In Situ Measurements ◽  
Index Of Refraction ◽  
High Spectral Resolution ◽  
Lidar Data ◽  
Data Set ◽  
Microphysical Properties ◽  
Lidar Measurements ◽  
Multiwavelength Lidar

Abstract. Retrievals of aerosol microphysical properties (effective radius, volume and surface-area concentrations) and aerosol optical properties (complex index of refraction and single-scattering albedo) were obtained from a hybrid multiwavelength lidar data set for the first time. In July 2011, in the Baltimore–Washington DC region, synergistic profiling of optical and microphysical properties of aerosols with both airborne (in situ and remote sensing) and ground-based remote sensing systems was performed during the first deployment of DISCOVER-AQ. The hybrid multiwavelength lidar data set combines ground-based elastic backscatter lidar measurements at 355 nm with airborne High-Spectral-Resolution Lidar (HSRL) measurements at 532 nm and elastic backscatter lidar measurements at 1064 nm that were obtained less than 5 km apart from each other. This was the first study in which optical and microphysical retrievals from lidar were obtained during the day and directly compared to AERONET and in situ measurements for 11 cases. Good agreement was observed between lidar and AERONET retrievals. Larger discrepancies were observed between lidar retrievals and in situ measurements obtained by the aircraft and aerosol hygroscopic effects are believed to be the main factor in such discrepancies.

Optical properties of amorphous hydrogenated carbon films: A spectroscopic ellipsometry study

1987 ◽  
Vol 2 (5) ◽  
pp. 645-647 ◽  
Author(s):  
Shuhan Lin ◽  
Shuguang Chen
Keyword(s):  
Optical Properties ◽  
Spectroscopic Ellipsometry ◽  
Carbon Films ◽  
Index Of Refraction ◽  
The Real ◽  
Complex Index ◽  
Tentative Explanation ◽  
Amorphous Hydrogenated Carbon ◽  
Ellipsometry Data ◽  
Complex Index Of Refraction

Optical properties of plasma-deposited amorphous hydrogenated carbon films were studied by spectroscopic ellipsometry. From the ellipsometry data, the real and imaginary parts, n and k, of the complex index of refraction of the film have been deduced for photon energies between 2.0 and 4.0 eV for as-grown as well as for thermally annealed films. Here n and k showed considerable variation with subsequent annealing, even under 400°C. A tentative explanation of the results is proposed.

Complex index of refraction of dental enamel at CO_2 laser wavelengths

1987 ◽  
Vol 26 (20) ◽  
pp. 4447 ◽  
Author(s):  
Gaetan Duplain ◽  
Russell Boulay ◽  
P. A. Bélanger
Keyword(s):  
Dental Enamel ◽  
Index Of Refraction ◽  
Complex Index ◽  
Complex Index Of Refraction
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