Electronic Structure of Ruthenium Cumulene Complexes [Cl(PH3)4RuCnH2]+(n= 1−8) and of Their Reduced States. Bonding and Properties of the Cationic, Neutral, and Anionic Series with Respect to the Cumulenic Chain Length

2003 ◽  
Vol 22 (8) ◽  
pp. 1638-1644 ◽  
Author(s):  
Nathalie Auger ◽  
Daniel Touchard ◽  
Stéphane Rigaut ◽  
Jean-François Halet ◽  
Jean-Yves Saillard
1993 ◽  
Vol 98 (10) ◽  
pp. 7969-7980 ◽  
Author(s):  
P. Gribi ◽  
G. Isenmann ◽  
E. Sigmund ◽  
G. Quapil ◽  
N. Holl ◽  
...  

2003 ◽  
Vol 75 (8) ◽  
pp. 999-1020 ◽  
Author(s):  
H. A. Fogarty ◽  
D. L. Casher ◽  
Roman Imhof ◽  
T. Schepers ◽  
D. W. Rooklin ◽  
...  

The making and breaking of σ bonds is an integral part of almost all photochemical reactions. Yet, the electronic states of σ electrons are not nearly as well understood as the states of π-electron systems. Efforts in our laboratory to enhance the current state of their understanding are described, using the specific example of oligosilanes. We address the intrinsically cyclic nature of σ delocalization and its dependence on chain length and conformation, both in terms of theory and spectroscopic experiments, from the simplest disilane chromophore to the spectral properties of the individual conformers of permethylated heptasilane. We also describe a new low-energy luminescence from certain conformers of permethylated oligosilanes.


2019 ◽  
Vol 4 (5) ◽  
pp. 995-999 ◽  
Author(s):  
Sharad Amin ◽  
Jamie M. Cameron ◽  
Julie A. Watts ◽  
Darren A. Walsh ◽  
Victor Sans ◽  
...  

Double-chain redox-active surfactants based on hybrid polyoxometalates show solvent-dependent assembly into nanoscale micellar architectures.


ChemInform ◽  
2010 ◽  
Vol 24 (37) ◽  
pp. no-no
Author(s):  
P. GRIBI ◽  
G. ISENMANN ◽  
E. SIGMUND ◽  
G. QUAPIL ◽  
N. HOLL ◽  
...  

Author(s):  
S.J. Splinter ◽  
J. Bruley ◽  
P.E. Batson ◽  
D.A. Smith ◽  
R. Rosenberg

It has long been known that the addition of Cu to Al interconnects improves the resistance to electromigration failure. It is generally accepted that this improvement is the result of Cu segregation to Al grain boundaries. The exact mechanism by which segregated Cu increases service lifetime is not understood, although it has been suggested that the formation of thin layers of θ-CuA12 (or some metastable substoichiometric precursor, θ’ or θ”) at the boundaries may be necessary. This paper reports measurements of the local electronic structure of Cu atoms segregated to Al grain boundaries using spatially resolved EELS in a UHV STEM. It is shown that segregated Cu exists in a chemical environment similar to that of Cu atoms in bulk θ-phase precipitates.Films of 100 nm thickness and nominal composition Al-2.5wt%Cu were deposited by sputtering from alloy targets onto NaCl substrates. The samples were solution heat treated at 748K for 30 min and aged at 523K for 4 h to promote equilibrium grain boundary segregation. EELS measurements were made using a Gatan 666 PEELS spectrometer interfaced to a VG HB501 STEM operating at 100 keV. The probe size was estimated to be 1 nm FWHM. Grain boundaries with the narrowest projected width were chosen for analysis. EDX measurements of Cu segregation were made using a VG HB603 STEM.


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