Synthesis and Characterization of Monomeric Organogallium−Nitrogen Compounds, Et2GaNMe[C6H2(2,4,6-t-Bu)3], Me2GaNMe[C6H2(2,4,6-t-Bu)3], MeGa{NH[C6H2(2,4,6-t-Bu)3]}2, and Ga{NH[C6H2(2,4,6-t-Bu)3]}3

2001 ◽  
Vol 20 (5) ◽  
pp. 945-949 ◽  
Author(s):  
O. T. Beachley, ◽  
Daniel B. Rosenblum ◽  
David J. MacRae
1981 ◽  
Vol 36 (5) ◽  
pp. 551-555 ◽  
Author(s):  
Gilbert Brands ◽  
Alfred Golloch

The missing compounds of the series of sulfurdiimines R1 - N = S = N-R2 with R1/2 = C6H5, C6F5, C6H5S, C6F5S were prepared, and all ten compounds investigated. Thermal stability, UV/VIS-, IR-and 19F-NMR-spectra depend strongly on the combination of the substituents


1971 ◽  
Vol 10 (10) ◽  
pp. 2343-2345 ◽  
Author(s):  
Eugene F. Rothgery ◽  
Paul J. Busse ◽  
Kurt Niedenzu

1996 ◽  
Vol 61 (10) ◽  
pp. 3572-3572
Author(s):  
Lawrence T. Scott ◽  
Atena Necula

2018 ◽  
Vol 2 (1) ◽  
pp. 7
Author(s):  
S Chirino ◽  
Jaime Diaz ◽  
N Monteblanco ◽  
E Valderrama

The synthesis and characterization of Ti and TiN thin films of different thicknesses was carried out on a martensitic stainless steel AISI 410 substrate used for tool manufacturing. The mechanical parameters between the interacting surfaces such as thickness, adhesion and hardness were measured. By means of the scanning electron microscope (SEM) the superficial morphology of the Ti/TiN interface was observed, finding that the growth was of columnar grains and by means of EDAX the existence of titanium was verified.  Using X-ray diffraction (XRD) it was possible to observe the presence of residual stresses (~ -3.1 GPa) due to the different crystalline phases in the coating. Under X-ray photoemission spectroscopy (XPS) it was possible to observe the molecular chemical composition of the coating surface, being Ti-N, Ti-N-O and Ti-O the predominant ones.


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