Electrochemical Atomic Force Microscopy Using a Tip-Attached Redox Mediator for Topographic and Functional Imaging of Nanosystems

ACS Nano ◽  
2009 ◽  
Vol 3 (10) ◽  
pp. 2927-2940 ◽  
Author(s):  
Agnès Anne ◽  
Edmond Cambril ◽  
Arnaud Chovin ◽  
Christophe Demaille ◽  
Cédric Goyer
Keyword(s):  
Atomic Force Microscopy ◽  
Functional Imaging ◽  
Redox Mediator ◽  
Force Microscopy ◽  
Atomic Force

Electrostatic Forces on the Surface of Metals as Measured by Atomic Force Microscopy

2000 ◽  
Vol 10 (1-2) ◽  
pp. 15
Author(s):  
Eugene Sprague ◽  
Julio C. Palmaz ◽  
Cristina Simon ◽  
Aaron Watson
Keyword(s):  
Atomic Force Microscopy ◽  
Electrostatic Forces ◽  
Force Microscopy ◽  
Atomic Force
Sign in / Sign up

Export Citation Format

Share Document