Direct Imaging of Charge Transport in Progressively Reduced Graphene Oxide Using Electrostatic Force Microscopy

ACS Nano ◽  
2015 ◽  
Vol 9 (3) ◽  
pp. 2981-2988 ◽  
Author(s):  
Sibel Ebru Yalcin ◽  
Charudatta Galande ◽  
Rajesh Kappera ◽  
Hisato Yamaguchi ◽  
Ulises Martinez ◽  
...  
Nanoscale ◽  
2012 ◽  
Vol 4 (22) ◽  
pp. 7231 ◽  
Author(s):  
Cristina Gómez-Navarro ◽  
Francisco J. Guzmán-Vázquez ◽  
Julio Gómez-Herrero ◽  
Juan J. Saenz ◽  
G. M. Sacha

2018 ◽  
Vol 9 ◽  
pp. 1146-1155 ◽  
Author(s):  
Yue Shen ◽  
Ying Wang ◽  
Yuan Zhou ◽  
Chunxi Hai ◽  
Jun Hu ◽  
...  

Electrostatic force spectroscopy (EFS) is a method for monitoring the electrostatic force microscopy (EFM) phase with high resolution as a function of the electrical direct current bias applied either to the probe or sample. Based on the dielectric constant difference of graphene oxide (GO) sheets (reduced using various methods), EFS can be used to characterize the degree of reduction of uniformly reduced one-atom-thick GO sheets at the nanoscale. In this paper, using thermally or chemically reduced individual GO sheets on mica substrates as examples, we characterize their degree of reduction at the nanoscale using EFS. For the reduced graphene oxide (rGO) sheets with a given degree of reduction (sample n), the EFS curve is very close to a parabola within a restricted area. We found that the change in parabola opening direction (or sign the parabola opening value) indicates the onset of reduction on GO sheets. Moreover, the parabola opening value, the peak bias value (tip bias leads to the peak or valley EFM phases) and the EFM phase contrast at a certain tip bias less than the peak value can all indicate the degree of reduction of rGO samples, which is positively correlated with the dielectric constant. In addition, we gave the ranking of degree for reduction on thermally or chemically reduced GO sheets and evaluated the effects of the reducing conditions. The identification of the degree of reduction of GO sheets using EFS is important for reduction strategy optimization and mass application of GO, which is highly desired owing to its mechanical, thermal, optical and electronic applications. Furthermore, as a general and quantitative technique for evaluating the small differences in the dielectric properties of nanomaterials, the EFS technique will extend and facilitate its nanoscale electronic devices applications in the future.


2020 ◽  
Vol 10 (21) ◽  
pp. 7703
Author(s):  
Woo Hyun Nam ◽  
Hyung Mo Jeong ◽  
Jong-Hyeong Lim ◽  
Jong-Min Oh ◽  
Hiesang Sohn ◽  
...  

ZnO is utilized as a promising material for various electronic and energy areas due to its outstanding chemical stability, abundance, non-toxicity, and low cost. However, controlling electronic transport properties of ZnO by facile strategy is still necessary for wider applications. Here, we synthesized reduced graphene oxide incorporated Al-doped ZnO nanocomposite thin film prepared by the electrospray deposition method and investigated the electronic transport behavior. The electron transport in pristine Al-doped ZnO thin film is strongly affected by grain boundary scattering, but significant enhancement of carrier mobility is observed in reduced graphene oxide-incorporated Al-doped ZnO nanocomposite thin film. The results demonstrate that this hybrid strategy with graphene has an important effect on the charge transport behavior in ZnO polycrystalline materials.


2015 ◽  
Vol 163 (2) ◽  
pp. H147-H153 ◽  
Author(s):  
Josephine Selvaraj ◽  
Satyajit Gupta ◽  
Raghavi Anand ◽  
Sebastian Fiechter ◽  
Vaidyanathan (Ravi) Subramanian

2016 ◽  
Vol 49 (41) ◽  
pp. 415303 ◽  
Author(s):  
Yue Shen ◽  
Ying Wang ◽  
Yuan Zhou ◽  
Anting Shi ◽  
Jun Hu ◽  
...  

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