scholarly journals Exploring Local Electrostatic Effects with Scanning Probe Microscopy: Implications for Piezoresponse Force Microscopy and Triboelectricity

ACS Nano ◽  
2014 ◽  
Vol 8 (10) ◽  
pp. 10229-10236 ◽  
Author(s):  
Nina Balke ◽  
Petro Maksymovych ◽  
Stephen Jesse ◽  
Ivan I. Kravchenko ◽  
Qian Li ◽  
...  
Keyword(s):  
Scanning Probe Microscopy ◽  
Piezoresponse Force Microscopy ◽  
Scanning Probe ◽  
Electrostatic Effects ◽  
Probe Microscopy ◽  
Force Microscopy

scholarly journals Micro-Area Ferroelectric, Piezoelectric and Conductive Properties of Single BiFeO3 Nanowire by Scanning Probe Microscopy

Nanomaterials ◽  
2019 ◽  
Vol 9 (2) ◽  
pp. 190 ◽  
Author(s):  
Shenglan Wu ◽  
Jing Zhang ◽  
Xiaoyan Liu ◽  
Siyi Lv ◽  
Rongli Gao ◽  
...  
Keyword(s):  
Scanning Probe Microscopy ◽  
Bismuth Ferrite ◽  
Piezoresponse Force Microscopy ◽  
Scanning Probe ◽  
Switching Behavior ◽  
X Ray Diffraction ◽  
Probe Microscopy ◽  
Force Microscopy ◽  
Atomic Force ◽  
Conductive Properties

Ferroelectric nanowires have attracted great attention due to their excellent physical properties. We report the domain structure, ferroelectric, piezoelectric, and conductive properties of bismuth ferrite (BFO, short for BiFeO3) nanowires characterized by scanning probe microscopy (SPM). The X-ray diffraction (XRD) pattern presents single phase BFO without other obvious impurities. The piezoresponse force microscopy (PFM) results indicate that the nanowires possess a multidomain configuration, and the maximum piezoelectric coefficient (d33) of single BFO nanowire is 22.21 pm/V. Poling experiments and local switching spectroscopy piezoresponse force microscopy (SS-PFM) demonstrate that there is sufficient polarization switching behavior and obvious piezoelectric properties in BFO nanowires. The conducting atomic force microscopy (C-AFM) results show that the current is just hundreds of pA at 8 V. These lay the foundation for the application of BFO nanowires in nanodevices.

Developments in Using Scanning Probe Microscopy To Study Molecules on Surfaces — From Thin Films and Single-Molecule Conductivity to Drug–Living Cell Interactions

2006 ◽  
Vol 59 (6) ◽  
pp. 359 ◽  
Author(s):  
Pall Thordarson ◽  
Rob Atkin ◽  
Wouter H. J. Kalle ◽  
Gregory G. Warr ◽  
Filip Braet
Keyword(s):  
Single Molecule ◽  
Scanning Probe Microscopy ◽  
Cell Interactions ◽  
Scanning Probe ◽  
Probe Microscopy ◽  
Force Microscopy ◽  
Atomic Force ◽  
Tunnelling Microscopy ◽  
Molecule Surface

Scanning probe microscopy (SPM) techniques, including atomic force microscopy (AFM) and scanning tunnelling microscopy (STM), have revolutionized our understanding of molecule–surface interactions. The high resolution and versatility of SPM techniques have helped elucidate the morphology of adsorbed surfactant layers, facilitated the study of electronically conductive single molecules and biomolecules connected to metal substrates, and allowed direct observation of real-time processes such as in situ DNA hybridization and drug–cell interactions. These examples illustrate the power that SPM possesses to study (bio)molecules on surfaces and will be discussed in depth in this review.

Industrial Applications of Scanning Probe Microscopy

1998 ◽  
Vol 4 (S2) ◽  
pp. 522-523
Author(s):  
S. Magonov
Keyword(s):  
Scanning Probe Microscopy ◽  
High Vacuum ◽  
Sample Surface ◽  
Industrial Applications ◽  
Ultra High Vacuum ◽  
Scanning Probe ◽  
Scanning Tunneling ◽  
Tunneling Microscopy ◽  
Probe Microscopy ◽  
Force Microscopy

The evolution of scanning tunneling microscopy (STM) into atomic force microscopy (AFM) have led to a family of scanning probe techniques which are widely applied in fundamental research and in industry. Visualization of the atomic- and molecular-scale structures and the possibility of modifying these structures using a sharp probe were demonstrated with the techniques on many materials. These unique capabilities initiated the further development of AFM and related methods generalized as scanning probe microscopy (SPM). The first STM experiments were performed in the clean conditions of ultra-high vacuum and on well-defined conducting or semi-conducting surfaces. These conditions restrict SPM applications to the real world that requires ambient-condition operation on the samples, many of which are insulators. AFM, which is based on the detection of forces between a tiny cantilever carrying a sharp tip and a sample surface, was introduced to satisfy these requirements. High lateral resolution and unique vertical resolution (angstrom scale) are essential AFM features.

Study of Polarization and Relaxation on Pb(Zr,Ti)O3 Thin Films by Scanning Probe Microscopy

2012 ◽  
Vol 463-464 ◽  
pp. 1484-1487
Author(s):  
Jian Shen ◽  
Huai Wu Zhang
Keyword(s):  
Scanning Probe Microscopy ◽  
Negative Charge ◽  
High Vacuum ◽  
Piezoresponse Force Microscopy ◽  
Scanning Probe ◽  
Relaxation Phenomena ◽  
Radio Frequency Magnetron Sputtering ◽  
Kelvin Probe ◽  
Force Microscopy ◽  
Pzt Thin Film

Polycrystalline Pb(Zr0.55T0.45)O3thin film was deposited on Pt/Ti/SiO2Si(100) by radio-frequency-magnetron sputtering method, the writing of charge bits and the polarization relaxation phenomena on the surface of PZT thin film was studied by Kelvin probe force microscopy and Piezoresponse force microscopy, respectively. It is found that the surface potential of the negative charge bits are higher than those of the corresponding positive ones, and the charge accumulates remarkably in high vacuum but relax more quickly. The domain images (contrast) reveal that the polarization magnitude is determined by the orientation of each grain, which is proved by the Ref 14. Taking the polarized area as whole, the relaxation of polarization magnitude (contrast) show that the polarized state in some grain can maintain at leas¬t 105s, but in other grain, the polarization disappear relatively quickly.

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