Visualizing the Subsurface of Soft Matter: Simultaneous Topographical Imaging, Depth Modulation, and Compositional Mapping with Triple Frequency Atomic Force Microscopy

ACS Nano ◽  
2013 ◽  
Vol 7 (11) ◽  
pp. 10387-10396 ◽  
Author(s):  
Daniel Ebeling ◽  
Babak Eslami ◽  
Santiago De Jesus Solares
Keyword(s):  
Atomic Force Microscopy ◽  
Soft Matter ◽  
Force Microscopy ◽  
Triple Frequency ◽  
Atomic Force ◽  
Imaging Depth

scholarly journals Nano-rheology of hydrogels using direct drive force modulation atomic force microscopy

Soft Matter ◽  
2015 ◽  
Vol 11 (41) ◽  
pp. 8165-8178 ◽  
Author(s):  
Prathima C. Nalam ◽  
Nitya N. Gosvami ◽  
Matthew A. Caporizzo ◽  
Russell J. Composto ◽  
Robert W. Carpick
Keyword(s):  
Atomic Force Microscopy ◽  
Soft Matter ◽  
Applied Strain ◽  
Strain Rates ◽  
Direct Drive ◽  
Force Microscopy ◽  
Atomic Force ◽  
Material Contact ◽  
Contact Mechanical ◽  
Probe Material

A quantitative and novel nanoscale viscoelastic spectroscopy tool for soft matter was developed. The study highlights the transition in the probe–material contact mechanical behavior of hydrogels especially when the applied strain rates and the material relaxation become comparable.

scholarly journals Imaging of viscoelastic soft matter with small indentation using higher eigenmodes in single-eigenmode amplitude-modulation atomic force microscopy

2018 ◽  
Vol 9 ◽  
pp. 1116-1122 ◽  
Author(s):  
Miead Nikfarjam ◽  
Enrique A López-Guerra ◽  
Santiago D Solares ◽  
Babak Eslami
Keyword(s):  
Atomic Force Microscopy ◽  
Amplitude Modulation ◽  
Soft Matter ◽  
Short Paper ◽  
Lower Sensitivity ◽  
Viscoelastic Materials ◽  
Force Microscopy ◽  
Atomic Force ◽  
Oscillation Frequencies ◽  
Small Indentation

In this short paper we explore the use of higher eigenmodes in single-eigenmode amplitude-modulation atomic force microscopy (AFM) for the small-indentation imaging of soft viscoelastic materials. In viscoelastic materials, whose response depends on the deformation rate, the tip–sample forces generated as a result of sample deformation increase as the tip velocity increases. Since the eigenfrequencies in a cantilever increase with eigenmode order, and since higher oscillation frequencies lead to higher tip velocities for a given amplitude (in viscoelastic materials), the sample indentation can in some cases be reduced by using higher eigenmodes of the cantilever. This effect competes with the lower sensitivity of higher eigenmodes, due to their larger force constant, which for elastic materials leads to greater indentation for similar amplitudes, compared with lower eigenmodes. We offer a short theoretical discussion of the key underlying concepts, along with numerical simulations and experiments to illustrate a simple recipe for imaging soft viscoelastic matter with reduced indentation.

scholarly journals Imaging of soft matter with tapping-mode atomic force microscopy and non-contact-mode atomic force microscopy

2007 ◽  
Vol 18 (8) ◽  
pp. 084009 ◽  
Author(s):  
Chih-Wen Yang ◽  
Ing-Shouh Hwang ◽  
Yen Fu Chen ◽  
Chia Seng Chang ◽  
Din Ping Tsai
Keyword(s):  
Atomic Force Microscopy ◽  
Soft Matter ◽  
Contact Mode ◽  
Tapping Mode ◽  
Force Microscopy ◽  
Atomic Force ◽  
Mode Atomic Force Microscopy
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