Functional Group-Selective Adsorption Using Scanning Tunneling Microscopy

ACS Nano ◽  
2012 ◽  
Vol 6 (4) ◽  
pp. 3597-3603 ◽  
Author(s):  
Young Hwan Min ◽  
Eun Hee Park ◽  
Do Hwan Kim ◽  
Sehun Kim
Keyword(s):  
Scanning Tunneling Microscopy ◽  
Functional Group ◽  
Selective Adsorption ◽  
Scanning Tunneling ◽  
Tunneling Microscopy

Polypyrrole-Modified Tips for Functional Group Recognition in Scanning Tunneling Microscopy

1999 ◽  
Vol 71 (9) ◽  
pp. 1699-1705 ◽  
Author(s):  
Takashi Ito ◽  
Philippe Bühlmann ◽  
Yoshio Umezawa
Keyword(s):  
Scanning Tunneling Microscopy ◽  
Functional Group ◽  
Scanning Tunneling ◽  
Tunneling Microscopy

Self-Assembly and Functional Group Effect of Asymmetric Disulfides on Graphite Studied by Scanning Tunneling Microscopy

1999 ◽  
Vol 38 (Part 1, No. 6B) ◽  
pp. 3897-3900 ◽  
Author(s):  
Jaegeun Noh ◽  
Dongsun Lee ◽  
Masahiko Hara ◽  
Haiwon Lee ◽  
Hiroyuki Sasabe ◽  
...  
Keyword(s):  
Scanning Tunneling Microscopy ◽  
Self Assembly ◽  
Functional Group ◽  
Scanning Tunneling ◽  
Group Effect ◽  
Tunneling Microscopy

Functional Group Identification in Scanning Tunneling Microscopy of Molecular Adsorbates

1996 ◽  
Vol 100 (32) ◽  
pp. 13747-13759 ◽  
Author(s):  
Donna M. Cyr ◽  
Bhawani Venkataraman ◽  
George W. Flynn ◽  
Andrew Black ◽  
George M. Whitesides
Keyword(s):  
Scanning Tunneling Microscopy ◽  
Functional Group ◽  
Group Identification ◽  
Scanning Tunneling ◽  
Tunneling Microscopy ◽  
Molecular Adsorbates

Functional Group Contrast in Scanning Tunneling Microscopy Images of Substituted Phenylethers

2001 ◽  
Vol 7 (S2) ◽  
pp. 850-851
Author(s):  
I. H. Musselman ◽  
K. H. Kangasniemi ◽  
A. J. M. Lubag ◽  
J. K. Franceschetti ◽  
H. S. Lee ◽  
...  
Keyword(s):  
Scanning Tunneling Microscopy ◽  
Functional Group ◽  
Energy Levels ◽  
Pyrolytic Graphite ◽  
Image Interpretation ◽  
Adsorbed Molecule ◽  
Scanning Tunneling ◽  
Chemical Information ◽  
Tunneling Microscopy ◽  
Stm Images

Numerous scanning tunneling microscopy (STM) studies of adsorbates at gas/solid and liquid/solid interfaces have been reported. Although early STM experiments of these systems were concerned primarily with visualizing molecules at the atomic level, the focus has shifted to extracting chemical information from STM images, including the identity of atoms or of functional groups within an adsorbed molecule. However, STM image interpretation continues to be an immense challenge and one currently debated issue of critical importance is the mechanism(s) by which the image contrast reveals atomic and molecular structure. Recently, a combination of electronic and geometric factors was proposed. The electronic factor addresses the coupling between the energy levels of the adsorbate and the Fermi level of the surface whereas the geometric factor is related to the spatial overlap between the STM tip and the functional group.A previous study in our laboratory of a homologous series of para-halogenated phenyloctadecyl ethers (X-POEs, where X = H, CI, Br, I), physisorbed onto highly oriented pyrolytic graphite (HOPG), revealed a bias-dependent contrast in STM images resembling calculated (HyperChem) electron density contours of bonding molecular orbitals.

A study on α-RuCl3 crystal structure by scanning tunneling microscopy

1989 ◽  
Vol 47 ◽  
pp. 30-31
Author(s):  
H.-J. Cantow ◽  
H. Hillebrecht ◽  
S. Magonov ◽  
H. W. Rotter ◽  
G. Thiele
Keyword(s):  
Crystal Structure ◽  
Density Distribution ◽  
Scanning Tunneling Microscopy ◽  
Electron Density ◽  
Structure Determination ◽  
Electron Density Distribution ◽  
Scanning Tunneling ◽  
Monoclinic Space Group ◽  
Tunneling Microscopy ◽  
X Ray

From X-ray analysis, the conclusions are drawn from averaged molecular informations. Thus, limitations are caused when analyzing systems whose symmetry is reduced due to interatomic interactions. In contrast, scanning tunneling microscopy (STM) directly images atomic scale surface electron density distribution, with a resolution up to fractions of Angstrom units. The crucial point is the correlation between the electron density distribution and the localization of individual atoms, which is reasonable in many cases. Thus, the use of STM images for crystal structure determination may be permitted. We tried to apply RuCl3 - a layered material with semiconductive properties - for such STM studies. From the X-ray analysis it has been assumed that α-form of this compound crystallizes in the monoclinic space group C2/m (AICI3 type). The chlorine atoms form an almost undistorted cubic closed package while Ru occupies 2/3 of the octahedral holes in every second layer building up a plane hexagon net (graphite net). Idealizing the arrangement of the chlorines a hexagonal symmetry would be expected. X-ray structure determination of isotypic compounds e.g. IrBr3 leads only to averaged positions of the metal atoms as there exist extended stacking faults of the metal layers.

Roughness measurements of nonlinear optical polymer films by scanning tunneling microscopy

1989 ◽  
Vol 47 ◽  
pp. 22-23
Author(s):  
I. H. Musselman ◽  
R.-T. Chen ◽  
P. E. Russell
Keyword(s):  
Surface Roughness ◽  
Scanning Tunneling Microscopy ◽  
Nonlinear Optical ◽  
Polymer Surface ◽  
Light Extinction ◽  
Scanning Tunneling ◽  
Silicon Substrates ◽  
Tunneling Microscopy ◽  
Optical Polymer ◽  
Total Light

Scanning tunneling microscopy (STM) has been used to characterize the surface roughness of nonlinear optical (NLO) polymers. A review of STM of polymer surfaces is included in this volume. The NLO polymers are instrumental in the development of electrooptical waveguide devices, the most fundamental of which is the modulator. The most common modulator design is the Mach Zehnder interferometer, in which the input light is split into two legs and then recombined into a common output within the two dimensional waveguide. A π phase retardation, resulting in total light extinction at the output of the interferometer, can be achieved by changing the refractive index of one leg with respect to the other using the electrooptic effect. For best device performance, it is essential that the NLO polymer exhibit minimal surface roughness in order to reduce light scattering. Scanning tunneling microscopy, with its high lateral and vertical resolution, is capable of quantifying the NLO polymer surface roughness induced by processing. Results are presented below in which STM was used to measure the surface roughness of films produced by spin-coating NLO-active polymers onto silicon substrates.

Practical applications of scanning tunneling microscopy

1989 ◽  
Vol 47 ◽  
pp. 18-19
Author(s):  
D. R. Denley
Keyword(s):  
High Resolution ◽  
Scanning Tunneling Microscopy ◽  
Quantitative Information ◽  
Digital Data ◽  
Scanning Tunneling ◽  
Ambient Atmosphere ◽  
Tunneling Microscopy ◽  
Clear Trend ◽  
Practical Applications ◽  
Promising Tool

Scanning tunneling microscopy (STM) has recently been introduced as a promising tool for analyzing surface atomic structure. We have used STM for its extremely high resolution (especially the direction normal to surfaces) and its ability for imaging in ambient atmosphere. We have examined surfaces of metals, semiconductors, and molecules deposited on these materials to achieve atomic resolution in favorable cases.When the high resolution capability is coupled with digital data acquisition, it is simple to get quantitative information on surface texture. This is illustrated for the measurement of surface roughness of evaporated gold films as a function of deposition temperature and annealing time in Figure 1. These results show a clear trend for which the roughness, as well as the experimental deviance of the roughness is found to be minimal for evaporation at 300°C. It is also possible to contrast different measures of roughness.

Scanning tunneling microscopy of polymers: A status report

1989 ◽  
Vol 47 ◽  
pp. 330-331
Author(s):  
P.E. Russell ◽  
I.H. Musselman
Keyword(s):  
High Resolution ◽  
Scanning Tunneling Microscopy ◽  
Sample Surface ◽  
Atomic Scale ◽  
Constant Current ◽  
Scanning Tunneling ◽  
Status Report ◽  
Tunneling Microscopy ◽  
Research Issues ◽  
Wide Range

Scanning tunneling microscopy (STM) has evolved rapidly in the past few years. Major developments have occurred in instrumentation, theory, and in a wide range of applications. In this paper, an overview of the application of STM and related techniques to polymers will be given, followed by a discussion of current research issues and prospects for future developments. The application of STM to polymers can be conveniently divided into the following subject areas: atomic scale imaging of uncoated polymer structures; topographic imaging and metrology of man-made polymer structures; and modification of polymer structures. Since many polymers are poor electrical conductors and hence unsuitable for use as a tunneling electrode, the related atomic force microscopy (AFM) technique which is capable of imaging both conductors and insulators has also been applied to polymers.The STM is well known for its high resolution capabilities in the x, y and z axes (Å in x andy and sub-Å in z). In addition to high resolution capabilities, the STM technique provides true three dimensional information in the constant current mode. In this mode, the STM tip is held at a fixed tunneling current (and a fixed bias voltage) and hence a fixed height above the sample surface while scanning across the sample surface.

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