A Scanning Probe Microscopy Based Assay for Single-Walled Carbon Nanotube Metallicity

Nano Letters ◽  
2009 ◽  
Vol 9 (4) ◽  
pp. 1668-1672 ◽  
Author(s):  
Wei Lu ◽  
Yao Xiong ◽  
Abdou Hassanien ◽  
Wei Zhao ◽  
Ming Zheng ◽  
...  
Keyword(s):  
Carbon Nanotube ◽  
Scanning Probe Microscopy ◽  
Scanning Probe ◽  
Single Walled Carbon Nanotube ◽  
Probe Microscopy ◽  
Single Walled Carbon

scholarly journals Supramolecular structures of terbium(iii) porphyrin double-decker complexes on a single-walled carbon nanotube surface

RSC Advances ◽  
2019 ◽  
Vol 9 (48) ◽  
pp. 28135-28145
Author(s):  
Ahmed I. A. Abd El-Mageed ◽  
Takuji Ogawa
Keyword(s):  
Carbon Nanotubes ◽  
Scanning Probe Microscopy ◽  
Single Walled Carbon Nanotubes ◽  
Supramolecular Structures ◽  
Scanning Probe ◽  
Single Walled Carbon Nanotube ◽  
Single Walled Carbon ◽  
Double Decker ◽  
Walled Carbon Nanotubes ◽  
First Time

For the first time, using scanning probe microscopy, the supramolecular structures of terbium porphyrin double-decker complexes were observed on single-walled carbon nanotubes surfaces, where the molecules formed a well-ordered self-assembled array.

Electrical Properties of Pd-contacted Single-walled Carbon Nanotubes: A Scanning Probe Microscopy Study

2010 ◽  
Vol 1258 ◽  
Author(s):  
Oleg Kononenko ◽  
S I Bozhko ◽  
V N Matveev ◽  
V T Volkov ◽  
M A Knyazev ◽  
...  
Keyword(s):  
Carbon Nanotubes ◽  
Scanning Probe Microscopy ◽  
Contact Potential Difference ◽  
Single Walled Carbon Nanotubes ◽  
Scanning Probe ◽  
Contact Potential ◽  
Reliable Technique ◽  
Probe Microscopy ◽  
Single Walled Carbon ◽  
Walled Carbon Nanotubes

AbstractPd is widely used in producing electrodes to single-walled carbon nanotubes (SWNT). However up to now its ability to form ohmic contacts to SWNTs was not employed in scanning probe microscopy (SPM). Here we present a study of SWNTs with Pd electrodes by SPM using Pd-coated tips. SWNTs were selectively grown on oxidized silicon substrates by low pressure CVD method. Pd electrodes were prepared to SWNTs to fabricate two terminal structures for SWNTs resistance measurements. It is shown that SPM Kelvin mode is a reliable technique for SWNT detection on insulating substrate. Contact potential difference between Pd electrode and SWNT is measured using the Kelvin mode.

scholarly journals Growth and fabrication with single-walled carbon nanotube probe microscopy tips

2000 ◽  
Vol 76 (21) ◽  
pp. 3136-3138 ◽  
Author(s):  
Chin Li Cheung ◽  
Jason H. Hafner ◽  
Teri W. Odom ◽  
Kyoungha Kim ◽  
Charles M. Lieber
Keyword(s):  
Carbon Nanotube ◽  
Single Walled Carbon Nanotube ◽  
Probe Microscopy ◽  
Single Walled Carbon

ChemInform Abstract: High-Yield Assembly of Individual Single-Walled Carbon Nanotube Tips for Scanning Probe Microscopies.

ChemInform ◽  
2010 ◽  
Vol 32 (22) ◽  
pp. no-no
Author(s):  
Jason H. Hafner ◽  
Chin-Li Cheung ◽  
Tjerk H. Oosterkamp ◽  
Charles M. Lieber
Keyword(s):  
Carbon Nanotube ◽  
Scanning Probe ◽  
High Yield ◽  
Single Walled Carbon Nanotube ◽  
Single Walled Carbon

High Aspect Ratio Silicon Dioxide-Coated Single-Walled Carbon Nanotube Scanning Probe Nanoelectrodes

2009 ◽  
Vol 113 (16) ◽  
pp. 6815-6820 ◽  
Author(s):  
Yoshie Narui ◽  
Donato M. Ceres ◽  
Jinyu Chen ◽  
Konstantinos P. Giapis ◽  
C. Patrick Collier
Keyword(s):  
Carbon Nanotube ◽  
Aspect Ratio ◽  
Silicon Dioxide ◽  
High Aspect Ratio ◽  
Scanning Probe ◽  
Single Walled Carbon Nanotube ◽  
Single Walled Carbon
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