Electrooptic Modulation in Thin Film Barium Titanate Plasmonic Interferometers

Nano Letters ◽  
2008 ◽  
Vol 8 (11) ◽  
pp. 4048-4052 ◽  
Author(s):  
Matthew J. Dicken ◽  
Luke A. Sweatlock ◽  
Domenico Pacifici ◽  
Henri J. Lezec ◽  
Kaushik Bhattacharya ◽  
...  
2004 ◽  
Vol 12 (24) ◽  
pp. 5962 ◽  
Author(s):  
Pingsheng Tang ◽  
D. J. Towner ◽  
T. Hamano ◽  
A. L. Meier ◽  
B. W. Wessels

APL Materials ◽  
2017 ◽  
Vol 5 (9) ◽  
pp. 099901
Author(s):  
Norihiro Suzuki ◽  
Minoru Osada ◽  
Motasim Billah ◽  
Zeid Abdullah Alothman ◽  
Yoshio Bando ◽  
...  

2017 ◽  
Vol 4 (18) ◽  
pp. 1700116 ◽  
Author(s):  
Michael Reinke ◽  
Yury Kuzminykh ◽  
Felix Eltes ◽  
Stefan Abel ◽  
Thomas LaGrange ◽  
...  

2011 ◽  
Vol 32 (1) ◽  
pp. 90-92 ◽  
Author(s):  
Chia-Yu Wei ◽  
Shu-Hao Kuo ◽  
Yu-Ming Hung ◽  
Wen-Chieh Huang ◽  
Feri Adriyanto ◽  
...  

Open Physics ◽  
2008 ◽  
Vol 6 (2) ◽  
Author(s):  
Milen Nenkov ◽  
Tamara Pencheva

AbstractA new approach for determination of refractive index dispersion n(λ) (the real part of the complex refractive index) and thickness d of thin films of negligible absorption and weak dispersion is proposed. The calculation procedure is based on determination of the phase thickness of the film in the spectral region of measured transmittance data. All points of measured spectra are included in the calculations. Barium titanate thin films are investigated in the spectral region 0.38–0.78 μm and their n(λ) and d are calculated. The approach is validated using Swanepoel’s method and it is found to be applicable for relatively thin films when measured transmittance spectra have one minimum and one maximum only.


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