Crossover from Josephson Effect to Single Interface Andreev Reflection in Asymmetric Superconductor/Nanowire Junctions

Nano Letters ◽  
2014 ◽  
Vol 14 (9) ◽  
pp. 4977-4981 ◽  
Author(s):  
H. Y. Günel ◽  
N. Borgwardt ◽  
I. E. Batov ◽  
H. Hardtdegen ◽  
K. Sladek ◽  
...  
Keyword(s):  
Josephson Effect ◽  
Andreev Reflection ◽  
Single Interface

scholarly journals Revealing the interference effect of Majorana fermions in a topological Josephson junction

2018 ◽  
Vol 9 ◽  
pp. 520-529 ◽  
Author(s):  
Jie Liu ◽  
Tiantian Yu ◽  
Juntao Song
Keyword(s):  
Josephson Junction ◽  
Interference Effect ◽  
Josephson Effect ◽  
Andreev Reflection ◽  
Local Density ◽  
Localized States ◽  
Majorana Fermions ◽  
Local Density Of States ◽  
Single Side ◽  
Period Oscillation

We study theoretically the local density of states (DOS) in a topological Josephson junction. We show that the well-known 4π Josephson effect originates from the interference effect between two Majorana fermions (MFs) that are localized at the Josephson junction. In addition, the DOS for electrons (holes) shows the 4π interference information along each parity conserved energy spectrum. The DOS displays a 2π period oscillation when two trivial states interfere with each other. This means that the DOS information may be used to distinguish the MFs from trivial localized states. We suggest that the interference effect and the DOS can be detected by using two STM leads or two normal leads. A single side lead can only detect the Andreev reflection tunneling process in the junction, which cannot reveal information about the interference effect in general. However, using two side leads, we can reveal information about the interference effect of the MFs as well as the DOS by combining Andreev reflection with the electron transmission process.

Dc Josephson effect and Andreev reflection

1991 ◽  
Vol 78 (4) ◽  
pp. 299-302 ◽  
Author(s):  
Akira Furusaki ◽  
Masaru Tsukada
Keyword(s):  
Josephson Effect ◽  
Andreev Reflection

scholarly journals Josephson effect and Andreev reflection in Ba1–xNaxFe2As2 (x = 0.25 and 0.35) point contacts

2014 ◽  
Vol 40 (10) ◽  
pp. 919-924 ◽  
Author(s):  
V. V. Fisun ◽  
O. P. Balkashin ◽  
O. E. Kvitnitskaya ◽  
I. A. Korovkin ◽  
N. V. Gamayunova ◽  
...  
Keyword(s):  
Josephson Effect ◽  
Andreev Reflection ◽  
Point Contacts
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