Multivariate Statistical Characterization of Charged and Uncharged Domain Walls in Multiferroic Hexagonal YMnO3 Single Crystal Visualized by a Spherical Aberration-Corrected STEM

Nano Letters ◽  
2013 ◽  
Vol 13 (10) ◽  
pp. 4594-4601 ◽  
Author(s):  
Takao Matsumoto ◽  
Ryo Ishikawa ◽  
Tetsuya Tohei ◽  
Hideo Kimura ◽  
Qiwen Yao ◽  
...  
Keyword(s):  
Single Crystal ◽  
Domain Walls ◽  
Spherical Aberration ◽  
Multivariate Statistical ◽  
Statistical Characterization ◽  
Aberration Corrected Stem ◽  
Aberration Corrected

Effect of chromatic aberration on atomic-resolved spherical aberration corrected STEM images

2009 ◽  
Vol 110 (1) ◽  
pp. 36-42 ◽  
Author(s):  
Koji Kuramochi ◽  
Takashi Yamazaki ◽  
Yasutoshi Kotaka ◽  
Masahiro Ohtsuka ◽  
Iwao Hashimoto ◽  
...  
Keyword(s):  
Spherical Aberration ◽  
Chromatic Aberration ◽  
Aberration Corrected Stem ◽  
Aberration Corrected

Characterization of Gold on Silicon Nanowires using Aberration-corrected STEM

2007 ◽  
Vol 13 (S02) ◽  
Author(s):  
SH Oh ◽  
K van Benthem ◽  
SI Molina ◽  
P Werner ◽  
D Kumar ◽  
...  
Keyword(s):  
Silicon Nanowires ◽  
Aberration Corrected Stem ◽  
Aberration Corrected

scholarly journals Cross-Sectional Characterization of SrTiO3/Si(001) Interfaces using Aberration-Corrected STEM

2015 ◽  
Vol 21 (S3) ◽  
pp. 1305-1306
Author(s):  
HsinWei Wu ◽  
Toshihiro Aoki ◽  
Agham B. Posadas ◽  
Alexander A. Demkov ◽  
David J. Smith
Keyword(s):  
Cross Sectional ◽  
Aberration Corrected Stem ◽  
Aberration Corrected

scholarly journals Atomic-Scale Characterization of Metals and Alloys Using Spherical-Aberration Corrected Scanning Transmission Electron Microscopy

2006 ◽  
Vol 12 (S02) ◽  
pp. 1344-1345
Author(s):  
D Williams ◽  
M Watanabe
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Scanning Transmission Electron Microscopy ◽  
Spherical Aberration ◽  
Atomic Scale ◽  
Transmission Electron ◽  
Scanning Transmission ◽  
Scale Characterization ◽  
Aberration Corrected

Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

Nanoscale Chemical and Structural Characterization of Transient Metallic Nanowires using Aberration-Corrected STEM-EELS

Nano Letters ◽  
2012 ◽  
Vol 12 (6) ◽  
pp. 2732-2739 ◽  
Author(s):  
Santhana K. Eswara Moorthy ◽  
Olivier Rousseau ◽  
Michel Viret ◽  
Mathieu Kociak
Keyword(s):  
Structural Characterization ◽  
Metallic Nanowires ◽  
Aberration Corrected Stem ◽  
Aberration Corrected

scholarly journals Aberration Corrected STEM Imaging of Domain Walls in Congruent LiNbO 3

2016 ◽  
Vol 22 (S3) ◽  
pp. 914-915 ◽  
Author(s):  
Debangshu Mukherjee ◽  
Greg Stone ◽  
Ke Wang ◽  
Venkatraman Gopalan ◽  
Nasim Alem
Keyword(s):  
Domain Walls ◽  
Aberration Corrected Stem ◽  
Aberration Corrected
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