Helium Detection via Field Ionization from Carbon Nanotubes

Nano Letters ◽  
2003 ◽  
Vol 3 (10) ◽  
pp. 1455-1458 ◽  
Author(s):  
David J. Riley ◽  
Mark Mann ◽  
Donald A. MacLaren ◽  
Paul C. Dastoor ◽  
William Allison ◽  
...  
Keyword(s):  
Carbon Nanotubes ◽  
Field Ionization

Field ionization using densely spaced arrays of nickel-tipped carbon nanotubes

2011 ◽  
Vol 505 (4-6) ◽  
pp. 126-129 ◽  
Author(s):  
Jun Luo ◽  
Lewis P. Mark ◽  
Anastassios E. Giannakopulos ◽  
Alex W. Colburn ◽  
Julie V. Macpherson ◽  
...  
Keyword(s):  
Carbon Nanotubes ◽  
Field Ionization

scholarly journals Field ionization detection of helium using a planar array of carbon nanotubes

2012 ◽  
Vol 85 (11) ◽  
Author(s):  
K. M. O'Donnell ◽  
A. Fahy ◽  
M. Barr ◽  
W. Allison ◽  
P. C. Dastoor
Keyword(s):  
Carbon Nanotubes ◽  
Field Ionization ◽  
Ionization Detection ◽  
Planar Array

A novel conductive humidity sensor based on field ionization from carbon nanotubes

2007 ◽  
Vol 133 (2) ◽  
pp. 467-471 ◽  
Author(s):  
Jia-Rui Huang ◽  
Min-Qiang Li ◽  
Zhong-Ying huang ◽  
Jin-Huai Liu
Keyword(s):  
Carbon Nanotubes ◽  
Humidity Sensor ◽  
Field Ionization

scholarly journals Integrated atom detector based on field ionization near carbon nanotubes

2009 ◽  
Vol 80 (6) ◽  
Author(s):  
B. Grüner ◽  
M. Jag ◽  
A. Stibor ◽  
G. Visanescu ◽  
M. Häffner ◽  
...  
Keyword(s):  
Carbon Nanotubes ◽  
Field Ionization

Field-assisted ionization theory for microscopists

1994 ◽  
Vol 52 ◽  
pp. 820-821
Author(s):  
Patrick P. Camus
Keyword(s):  
Electric Field ◽  
Electron Tunneling ◽  
Ionization Probability ◽  
Critical Distance ◽  
Tunneling Probability ◽  
Field Ionization ◽  
Radius Of Curvature ◽  
Field Evaporation ◽  
A Value ◽  
Ion Emission

The theory of field ion emission is the study of electron tunneling probability enhanced by the application of a high electric field. At subnanometer distances and kilovolt potentials, the probability of tunneling of electrons increases markedly. Field ionization of gas atoms produce atomic resolution images of the surface of the specimen, while field evaporation of surface atoms sections the specimen. Details of emission theory may be found in monographs.Field ionization (FI) is the phenomena whereby an electric field assists in the ionization of gas atoms via tunneling. The tunneling probability is a maximum at a critical distance above the surface,xc, Fig. 1. Energy is required to ionize the gas atom at xc, I, but at a value reduced by the appliedelectric field, xcFe, while energy is recovered by placing the electron in the specimen, φ. The highest ionization probability occurs for those regions on the specimen that have the highest local electric field. Those atoms which protrude from the average surfacehave the smallest radius of curvature, the highest field and therefore produce the highest ionizationprobability and brightest spots on the imaging screen, Fig. 2. This technique is called field ion microscopy (FIM).

Structural phenomena in the growth of carbon nanotubes

1993 ◽  
Vol 51 ◽  
pp. 750-751
Author(s):  
Jun Jiao
Keyword(s):  
Carbon Nanotubes ◽  
Growth Mechanism ◽  
Carbonaceous Material ◽  
Cluster Growth ◽  
Structural Elements ◽  
Rich Variety ◽  
Different Shapes ◽  
Point To Point

HREM studies of the carbonaceous material deposited on the cathode of a Huffman-Krätschmer arc reactor have shown a rich variety of multiple-walled nano-clusters of different shapes and forms. The preparation of the samples, as well as the variety of cluster shapes, including triangular, rhombohedral and pentagonal projections, are described elsewhere.The close registry imposed on the nanotubes, focuses attention on the cluster growth mechanism. The strict parallelism in the graphitic separation of the tube walls is maintained through changes of form and size, often leading to 180° turns, and accommodating neighboring clusters and defects. Iijima et. al. have proposed a growth scheme in terms of pentagonal and heptagonal defects and their combinations in a hexagonal graphitic matrix, the first bending the surface inward, and the second outward. We report here HREM observations that support Iijima’s suggestions, and add some new features that refine the interpretation of the growth mechanism. The structural elements of our observations are briefly summarized in the following four micrographs, taken in a Hitachi H-8100 TEM operating at an accelerating voltage of 200 kV and with a point-to-point resolution of 0.20 nm.

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