Surface Studies of the Rearrangement of End Groups of a Polymer by ToF−SIMS and AFM

2000 ◽  
Vol 33 (15) ◽  
pp. 5588-5592 ◽  
Author(s):  
Lin Li ◽  
Kai-Mo Ng ◽  
Chi-Ming Chan ◽  
Ji-Yun Feng ◽  
Xin-Miao Zeng ◽  
...  
Keyword(s):  
Surface Studies ◽  
Tof Sims ◽  
End Groups

Investigation of fomblin Z-Dol end-groups on the magnetic recording disks by ToF-SIMS

2004 ◽  
Vol 231-232 ◽  
pp. 332-335
Author(s):  
M. Ishikawa ◽  
Y. Osawa ◽  
O. Ishiwata
Keyword(s):  
Magnetic Recording ◽  
Tof Sims ◽  
End Groups ◽  
Fomblin Z

Perfluoro-Poly(ethers) with Hydroxyl End Groups:  Analysis by TOF-SIMS

1998 ◽  
Vol 102 (38) ◽  
pp. 7331-7337 ◽  
Author(s):  
Paul H. Kasai ◽  
A. M. Spool
Keyword(s):  
Tof Sims ◽  
End Groups

Surface studies of halloysite nanotubes by XPS and ToF-SIMS

2011 ◽  
Vol 43 (4) ◽  
pp. 795-802 ◽  
Author(s):  
Kai-Mo Ng ◽  
Yiu-Ting R. Lau ◽  
Chi-Ming Chan ◽  
Lu-Tao Weng ◽  
Jingshen Wu
Keyword(s):  
Halloysite Nanotubes ◽  
Surface Studies ◽  
Tof Sims

1992 C R Burch prize TOF SIMS in polymer surface studies

Vacuum ◽  
1993 ◽  
Vol 44 (11-12) ◽  
pp. 1143-1160 ◽  
Author(s):  
Robert D Short ◽  
AP Ameen ◽  
ST Jackson ◽  
DJ Pawson ◽  
L O'Toole ◽  
...  
Keyword(s):  
Polymer Surface ◽  
Surface Studies ◽  
Tof Sims

Applications of Time-OF-Flight Secondary Ion Mass Spectrometry (TOF-SIMS)

1990 ◽  
Vol 48 (2) ◽  
pp. 308-309
Author(s):  
Bruno Schueler ◽  
Robert W. Odom
Keyword(s):  
Mass Spectrometry ◽  
Secondary Ion Mass Spectrometry ◽  
Structural Information ◽  
Time Of Flight ◽  
Biological Tissues ◽  
Polymer Surfaces ◽  
Tof Sims ◽  
Secondary Ions ◽  
Ion Mass Spectrometry ◽  
Secondary Ion

Time-of-flight secondary ion mass spectrometry (TOF-SIMS) provides unique capabilities for elemental and molecular compositional analysis of a wide variety of surfaces. This relatively new technique is finding increasing applications in analyses concerned with determining the chemical composition of various polymer surfaces, identifying the composition of organic and inorganic residues on surfaces and the localization of molecular or structurally significant secondary ions signals from biological tissues. TOF-SIMS analyses are typically performed under low primary ion dose (static SIMS) conditions and hence the secondary ions formed often contain significant structural information.This paper will present an overview of current TOF-SIMS instrumentation with particular emphasis on the stigmatic imaging ion microscope developed in the authors’ laboratory. This discussion will be followed by a presentation of several useful applications of the technique for the characterization of polymer surfaces and biological tissues specimens. Particular attention in these applications will focus on how the analytical problem impacts the performance requirements of the mass spectrometer and vice-versa.

New approaches to coupling TLC with TOF-SIMS

2005 ◽  
Vol 18 (101) ◽  
pp. 44-50 ◽  
Author(s):  
Andrej Oriňák ◽  
Guido Vering ◽  
Heinrich Arlinghaus ◽  
Jan Andersson ◽  
Ladislav Halas ◽  
...  
Keyword(s):  
New Approaches ◽  
Tof Sims
Sign in / Sign up

Export Citation Format

Share Document