Chemical and Morphological Analysis of Surface Enrichment in a Biodegradable Polymer Blend by Phase-Detection Imaging Atomic Force Microscopy

1998 ◽  
Vol 31 (7) ◽  
pp. 2278-2283 ◽  
Author(s):  
X. Chen ◽  
S. L. McGurk ◽  
M. C. Davies ◽  
C. J. Roberts ◽  
K. M. Shakesheff ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Polymer Blend ◽  
Biodegradable Polymer ◽  
Morphological Analysis ◽  
Phase Detection ◽  
Surface Enrichment ◽  
Force Microscopy ◽  
Atomic Force

Phase Contrast Imaging in Atomic Force Microscopy

1997 ◽  
Vol 3 (S2) ◽  
pp. 1275-1276
Author(s):  
Sergei Magonov
Keyword(s):  
Atomic Force Microscopy ◽  
Phase Contrast ◽  
Phase Changes ◽  
Phase Imaging ◽  
Phase Detection ◽  
Contrast Imaging ◽  
Force Microscopy ◽  
Atomic Force ◽  
Resonance Frequencies ◽  
Soft Samples

Phase detection in TappingMode™ enhances capabilities of Atomic Force Microscopy (AFM) for soft samples (polymers and biological materials). Changes of amplitude and phase changes of a fast oscillating probe are caused by tip-sample force interactions. Height images reflect the amplitude changes, and in most cases they present a sample topography. Phase images show local differences between phases of free-oscillating probe and of probe interacting with a sample surface. These differences are related to the change of the resonance frequency of the probe either by attractive or repulsive tip-sample forces. Therefore phase detection helps to choose attractive or repulsive force regime for surface imaging and to minimize tip-sample force. For heterogeneous materials the phase imaging allows to distinguish individual components and to visualize their distribution due to differences in phase contrast. This is typically achieved in moderate tapping, when set-point amplitude, Asp, is about half of the amplitude of free-oscillating cantilever, Ao. In contrast, light tapping with Asp close to Ao is best suited for recording a true topography of the topmost surface layer of soft samples. Examples of phase imaging of polymers obtained with a scanning probe microscope Nanoscope® IIIa (Digital Instruments). Si probes (225 μk long, resonance frequencies 150-200 kHz) were used.

scholarly journals High-speed atomic force microscopy with phase-detection

2012 ◽  
Vol 12 (3) ◽  
pp. 989-994 ◽  
Author(s):  
Donghyeok Lee ◽  
Hyunsoo Lee ◽  
N.S. Lee ◽  
K.B. Kim ◽  
Yongho Seo
Keyword(s):  
Atomic Force Microscopy ◽  
High Speed ◽  
Phase Detection ◽  
Force Microscopy ◽  
Atomic Force

scholarly journals Bitumen morphologies by phase-detection atomic force microscopy

2006 ◽  
Vol 221 (1) ◽  
pp. 17-29 ◽  
Author(s):  
J-F. MASSON ◽  
V. LEBLOND ◽  
J. MARGESON
Keyword(s):  
Atomic Force Microscopy ◽  
Phase Detection ◽  
Force Microscopy ◽  
Atomic Force
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