Novel Materials for Large Change in Refractive Index:  Synthesis and Photochemical Reaction of the Ladderlike Poly(silsesquioxane) Containing Norbornadiene, Azobenzene, and Anthracene Groups in the Side Chains

2006 ◽  
Vol 39 (5) ◽  
pp. 1759-1765 ◽  
Author(s):  
Hiroto Kudo ◽  
Masaru Yamamoto ◽  
Tadatomi Nishikubo ◽  
Osamu Moriya
Keyword(s):  
Refractive Index ◽  
Photochemical Reaction ◽  
Large Change ◽  
Side Chains ◽  
Novel Materials

THIN-LAYER HOLOGRAPHIC PHOTOPOLYMER MATERIALS WITH A LARGE CHANGE IN THE REFRACTIVE INDEX

2021 ◽  
Vol 57 (6) ◽  
pp. 29-37
Author(s):  
D. I. Derevianko ◽  
E. F. Pen ◽  
V. V. Shelkovnikov ◽  
S. I. Aliev
Keyword(s):  
Refractive Index ◽  
Thin Layer ◽  
Large Change

The Effect of Refractive Index of the Medium on the Position of the Camera Lens in Schlieren Optics

1973 ◽  
Vol 51 (20) ◽  
pp. 3309-3312 ◽  
Author(s):  
L. Ivan Epstein ◽  
Percival Nixon ◽  
Alfred J. Richard
Keyword(s):  
Refractive Index ◽  
Linear Relation ◽  
Large Change ◽  
Optic Axis ◽  
Liquid Column ◽  
Camera Lens ◽  
Component Systems ◽  
Schlieren Optics

A linear relation has been established between the plane of focus for schlieren optics in the ultracentrifuge cell along the optic axis, and the refractive index of the liquid contained in the cell. Such a relation shows that there occurs a defocussing effect when a large change in refractive index is generated in the liquid column during centrifugation of multi-component systems.

Fabrication of refractive index distributions in polymer using a photochemical reaction

2000 ◽  
Vol 87 (2) ◽  
pp. 638-642 ◽  
Author(s):  
Takeshi Kada ◽  
Atsushi Obara ◽  
Toshiyuki Watanabe ◽  
Seizo Miyata ◽  
Chuan Xin Liang ◽  
...  
Keyword(s):  
Refractive Index ◽  
Photochemical Reaction

Novel iridium complexes with polymer side-chains

2004 ◽  
Vol 846 ◽  
Author(s):  
Elisabeth Holder ◽  
Veronica Marin ◽  
Emine Tekin ◽  
Dmitry Kozodaev ◽  
Michael A. R. Meier ◽  
...  
Keyword(s):  
Optical Properties ◽  
Morphological Properties ◽  
Side Chains ◽  
Iridium Complexes ◽  
Light Emitting ◽  
Force Microscopy ◽  
Novel Materials ◽  
Atomic Force ◽  
Local Current ◽  
Potential Applications

ABSTRACTThe focus of the presented research lies on the synthesis of novel charged iridium(III) compounds with potential applications in light-emitting electrochemical cells. The design involves iridium(III)-based materials with polymer side-chains leading to linear light-emitting polymer arrangements.To study the electro-optical properties of such light-emitting polymers conventional and combinatorial deposition methods are used. Straightforward screening approaches are introduced. The combinatorial efforts engage the processing via inkjet printing and the screening of the optical properties using plate reader technologies based on steady state UV-vis and fluorescence. Furthermore, the morphological properties are investigated using optical interferometry and atomic force microscopy (AFM). Overall it can be shown that novel materials can be deposited revealing high-quality thin films, which allow the screening of electro-optical features using combinatorial methods. Some initial local current density studies by AFM have also been performed to characterize the current injection and transport properties of the novel materials.

New developments in photochromic materials showing large change in the refractive index

2008 ◽  
Author(s):  
Andrea Bianco ◽  
Chiara Bertarelli ◽  
Giovanni Dassa ◽  
Giorgio Toso ◽  
Marta Lanata ◽  
...  
Keyword(s):  
Refractive Index ◽  
Large Change ◽  
New Developments ◽  
Photochromic Materials

Physical Behavior of Fluorine Atoms in the Fabricated Transparent SiO2 Thin Film at Room Temperature

1998 ◽  
Vol 555 ◽  
Author(s):  
H lizuka ◽  
M Murahara
Keyword(s):  
Thin Film ◽  
Refractive Index ◽  
Photochemical Reaction ◽  
Oxidation Reaction ◽  
Room Temperature ◽  
Annealing Temperature ◽  
Reaction Chamber ◽  
Si Substrate ◽  
Physical Behavior ◽  
Sio2 Thin Film

AbstractThis paper describe the growth of a transparent SiO2 thin film performed by using Xe2• excimer lamp at room temperature. In this study, NF., and O2 mixture gases was employed as a reaction gas. A silicon substrate was placed in a reaction chamber, which was filled with NF3 and O2 mixture gases. The mixture gases were exposed to the Xe2• excimer lamplight, and SiF4 and NO2 gases were produced by photochemical reaction. Subsequently SiF4 adsorbed onto the Si substrate. SiO2 was formed by oxidation reaction between SiF4 and NO2. These processes occur spontaneously, and SiO2 film is grown. The refractive index of fabrication SiO2 thin film is 1.32. By annealing at 200°C, the refractive index of this filn was increased to 1.44. Further increase in the annealing temperature, resulted in a higher refractive index and lower density of fluorine atoms.

Wavelength Dependence of the Photorefractive and Photodiffractive Properties of Holographic Thin Films Based on Bacteriorhodopsin

1990 ◽  
Vol 218 ◽  
Author(s):  
Robert R. Birge ◽  
K. Can Izgi ◽  
Jeffrey A. Stuart ◽  
Jack R. Tallent
Keyword(s):  
Refractive Index ◽  
Large Change ◽  
Wave Theory ◽  
Wavelength Dependence ◽  
Solute Concentration ◽  
Maximum Efficiency ◽  
Optical Absorption Spectroscopy ◽  
Phase Component ◽  
Absorption Component ◽  
Negative Band

AbstractThe photorefractive and photodiffractive properties of a 2 × 10−3 M, 30μim thin film of bacteriorhodopsin at - 40°C are analyzed by using optical absorption spectroscopy, the Kramers- Kronig transformation and coupled wave theory. Conversion of M to bR generates a dispersion in the refractive index that has a broad negative band from 450 to 540 nm [Δn500nm - -0.0016] and a broad positive band from 590 to 700 nm [Δn605nm - 0.0016]. The large change in refractive index for moderate solute concentration is due to the formation of the protonated Schiff base chromophore in bR which generates a large red shift in the absorption spectrum as well as a large increase in oscillator strength. The integrated diffraction efficiency from 300 - 800nm is dominated by refractive index contributions (ηphase) which are maximum in regions of minimal bR and M absorption. The maximum in the refractive (phase) component occurs at 451 nm (ηphase - 9.7%) whereas the maximum in the absorption component occurs at 575 nm (ηabs - 2.2%). The maximum efficiency of diffraction is observed at ∼440 nm (ηtotal - 10.7%). Adequate diffractive performance for most applications is predicted for write wavelengths in the regions 380 - 420 & 500 - 650 nm and for read wavelengths from 380 to 740 nm.

scholarly journals Synthesis and Photochemical Reaction of Poly(ester)s Containing Donor–Acceptor Type Norbornadiene Residues in the Both Main and Side Chains

2005 ◽  
Vol 37 (4) ◽  
pp. 246-254 ◽  
Author(s):  
Yoshitomo Ono ◽  
Naoyuki Kawashima ◽  
Hiroto Kudo ◽  
Takabumi Nagai ◽  
Tadatomi Nishikubo
Keyword(s):  
Photochemical Reaction ◽  
Side Chains ◽  
Donor Acceptor

TEM characterization of proton-exchanged LiNbO3 optical waveguides

1986 ◽  
Vol 44 ◽  
pp. 480-481
Author(s):  
W. E. Lee
Keyword(s):  
Refractive Index ◽  
Benzoic Acid ◽  
Optical Waveguides ◽  
Total Internal Reflection ◽  
Index Of Refraction ◽  
Optical Measurements ◽  
Lithium Ions ◽  
Wide Channel ◽  
Tem Characterization

An optical waveguide consists of a several-micron wide channel with a slightly different index of refraction than the host substrate; light can be trapped in the channel by total internal reflection.Optical waveguides can be formed from single-crystal LiNbO3 using the proton exhange technique. In this technique, polished specimens are masked with polycrystal1ine chromium in such a way as to leave 3-13 μm wide channels. These are held in benzoic acid at 249°C for 5 minutes allowing protons to exchange for lithium ions within the channels causing an increase in the refractive index of the channel and creating the waveguide. Unfortunately, optical measurements often reveal a loss in waveguiding ability up to several weeks after exchange.

X-ray microprobe for materials science

1994 ◽  
Vol 52 ◽  
pp. 56-57
Author(s):  
G.E. Ice
Keyword(s):  
Crystallographic Orientation ◽  
Local Structure ◽  
Materials Science ◽  
Chemical Information ◽  
X Ray Diffraction ◽  
Ray Optics ◽  
X Ray ◽  
Novel Materials ◽  
New Information ◽  
Elemental Sensitivity

The increasing availability of synchrotron x-ray sources has stimulated the development of advanced hard x-ray (E≥5 keV) microprobes. With new x-ray optics these microprobes can achieve micron and submicron spatial resolutions. The inherent elemental and crystallographic sensitivity of an x-ray microprobe and its inherently nondestructive and penetrating nature will have important applications to materials science. For example, x-ray fluorescent microanalysis of materials can reveal elemental distributions with greater sensitivity than alternative nondestructive probes. In materials, segregation and nonuniform distributions are the rule rather than the exception. Common interfaces to whichsegregation occurs are surfaces, grain and precipitate boundaries, dislocations, and surfaces formed by defects such as vacancy and interstitial configurations. In addition to chemical information, an x-ray diffraction microprobe can reveal the local structure of a material by detecting its phase, crystallographic orientation and strain.Demonstration experiments have already exploited the penetrating nature of an x-ray microprobe and its inherent elemental sensitivity to provide new information about elemental distributions in novel materials.

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