Grain Structure in Block Copolymer Thin Films Studied by Guided Wave Depolarized Light Scattering

2005 ◽  
Vol 38 (10) ◽  
pp. 4282-4288 ◽  
Author(s):  
Bruce A. Garetz ◽  
Maurice C. Newstein ◽  
Jeffrey D. Wilbur ◽  
Amish J. Patel ◽  
David A. Durkee ◽  
...  
Keyword(s):  
Thin Films ◽  
Light Scattering ◽  
Block Copolymer ◽  
Guided Wave ◽  
Grain Structure ◽  
Depolarized Light Scattering

Order−Disorder Transitions in Block Copolymer Thin Films Studied by Guided Wave Depolarized Light Scattering with Grating Couplers

2008 ◽  
Vol 41 (12) ◽  
pp. 4464-4470 ◽  
Author(s):  
Jeffrey D. Wilbur ◽  
Zhuangxi Fang ◽  
Bruce A. Garetz ◽  
Maurice C. Newstein ◽  
Nitash P. Balsara
Keyword(s):  
Thin Films ◽  
Light Scattering ◽  
Block Copolymer ◽  
Guided Wave ◽  
Grating Couplers ◽  
Depolarized Light Scattering

Measurement and Analysis of the Angular Guided-Wave Depolarized Light Scattering Patterns from Block Copolymer Thin Films

2010 ◽  
Vol 43 (23) ◽  
pp. 10071-10077
Author(s):  
Zhuangxi Fang ◽  
Maurice C. Newstein ◽  
Bruce A. Garetz ◽  
Nitash P. Balsara
Keyword(s):  
Thin Films ◽  
Light Scattering ◽  
Block Copolymer ◽  
Guided Wave ◽  
Measurement And Analysis ◽  
Depolarized Light Scattering

scholarly journals Evolution of Grain Structure during Disorder-to-Order Transitions in a Block Copolymer/Salt Mixture Studied by Depolarized Light Scattering

2014 ◽  
Vol 47 (16) ◽  
pp. 5784-5792 ◽  
Author(s):  
Xin Wang ◽  
Jacob L. Thelen ◽  
Alexander A. Teran ◽  
Mahati Chintapalli ◽  
Issei Nakamura ◽  
...  
Keyword(s):  
Light Scattering ◽  
Block Copolymer ◽  
Grain Structure ◽  
Salt Mixture ◽  
Depolarized Light Scattering

scholarly journals Confined versus Unconfined Crystallization in Block Copolymer/Salt Mixtures Studied by Depolarized Light Scattering

2019 ◽  
Vol 52 (3) ◽  
pp. 982-991 ◽  
Author(s):  
Xiuhong Li ◽  
Whitney S. Loo ◽  
Xi Jiang ◽  
Xin Wang ◽  
Michael D. Galluzzo ◽  
...  
Keyword(s):  
Light Scattering ◽  
Block Copolymer ◽  
Salt Mixtures ◽  
Depolarized Light Scattering

Thermoreversible Changes in Aligned and Cross-Linked Block Copolymer Melts Studied by Two Color Depolarized Light Scattering

2012 ◽  
Vol 45 (18) ◽  
pp. 7590-7598 ◽  
Author(s):  
Jeffrey D. Wilbur ◽  
Enrique D. Gomez ◽  
Mark W. Ellsworth ◽  
Bruce A. Garetz ◽  
Nitash P. Balsara
Keyword(s):  
Light Scattering ◽  
Block Copolymer ◽  
Copolymer Melts ◽  
Depolarized Light Scattering

Birefringence and Depolarized Light Scattering of an Ordered Block Copolymer Melt under Shear Flow

2000 ◽  
Vol 33 (10) ◽  
pp. 3719-3730 ◽  
Author(s):  
H. Wang ◽  
M. C. Newstein ◽  
M. Y. Chang ◽  
N. P. Balsara ◽  
B. A. Garetz
Keyword(s):  
Light Scattering ◽  
Block Copolymer ◽  
Shear Flow ◽  
Depolarized Light Scattering

TEM studies of solid-state reactions in sputter-deposited Nb/Al multilayer thin films

1996 ◽  
Vol 54 ◽  
pp. 1020-1021
Author(s):  
F. Ma ◽  
S. Vivekanand ◽  
K. Barmak ◽  
C. Michaelsen
Keyword(s):  
Thin Films ◽  
Solid State ◽  
Stoichiometric Composition ◽  
Analytical Electron Microscopy ◽  
Grain Structure ◽  
Solid State Reactions ◽  
Multilayer Thin Films ◽  
X Ray Diffraction ◽  
X Ray ◽  
Sputter Deposited

Solid state reactions in sputter-deposited Nb/Al multilayer thin films have been studied by transmission and analytical electron microscopy (TEM/AEM), differential scanning calorimetry (DSC) and X-ray diffraction (XRD). The Nb/Al multilayer thin films for TEM studies were sputter-deposited on (1102)sapphire substrates. The periodicity of the films is in the range 10-500 nm. The overall composition of the films are 1/3, 2/1, and 3/1 Nb/Al, corresponding to the stoichiometric composition of the three intermetallic phases in this system.Figure 1 is a TEM micrograph of an as-deposited film with periodicity A = dA1 + dNb = 72 nm, where d's are layer thicknesses. The polycrystalline nature of the Al and Nb layers with their columnar grain structure is evident in the figure. Both Nb and Al layers exhibit crystallographic texture, with the electron diffraction pattern for this film showing stronger diffraction spots in the direction normal to the multilayer. The X-ray diffraction patterns of all films are dominated by the Al(l 11) and Nb(l 10) peaks and show a merging of these two peaks with decreasing periodicity.

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