Lamellar Diblock Copolymer Grain Boundary Morphology. 4. Tilt Boundaries

1994 ◽  
Vol 27 (21) ◽  
pp. 6137-6144 ◽  
Author(s):  
Samuel P. Gido ◽  
Edwin L. Thomas
Keyword(s):  
Grain Boundary ◽  
Diblock Copolymer ◽  
Tilt Boundaries

Characterization of Tilt Boundaries by Ultra High Resolution Electron Microscopy

1984 ◽  
Vol 41 ◽  
Author(s):  
W. Krakow ◽  
J. T. Wetzel ◽  
D. A. Smith ◽  
G. Trafas
Keyword(s):  
High Resolution ◽  
Grain Boundary ◽  
Structural Information ◽  
Theoretical Work ◽  
High Resolution Electron Microscopy ◽  
Point Of View ◽  
Experimental Point ◽  
Structure Information ◽  
Resolution Electron ◽  
Tilt Boundaries

AbstractA high resolution electron microscope study of grain boundary structures in Au thin films has been undertaken from both a theoretical and experimental point of view. The criteria necessary to interpret images of tilt boundaries at the atomic level, which include electron optical and specimen effects, have been considered for both 200kV and the newer 400kV medium voltage microscopes. So far, the theoretical work has concentrated on two different [001] tilt bounda-ries where a resolution of 2.03Å is required to visualize bulk lattice structures on either side of the interface. Both a high angle boundary, (210) σ=5, and a low angle boundary, (910) σ=41, have been considered. Computational results using multislice dynamical diffraction and image simulations of relaxed bounda-ries viewed edge-on and with small amounts of beam and/or specimen inclina-tion have been obtained. It will be shown that some structural information concerning grain boundary dislocations can be observed at 200kV. However, many difficulties occur in the exact identification of the interface structure viewed experimentally for both [001] and [011] boundaries since the resolution required is near the performance limit of a 200kV microscope. The simulated results at 400kV indicate a considerable improvement will be realized in obtain-ing atomic structure information at the interface.

Microstructures of a-axis oriented YBCO films made by hybrid plasma sputtering

1995 ◽  
Vol 10 (4) ◽  
pp. 803-809 ◽  
Author(s):  
W. Ito ◽  
A. Oishi ◽  
S. Mahajan ◽  
Y. Yoshida ◽  
T. Morishita
Keyword(s):  
Electron Microscopy ◽  
Grain Boundary ◽  
Anisotropic Growth ◽  
Plan View ◽  
Plasma Sputtering ◽  
Transmission Electron ◽  
Hybrid Plasma ◽  
Tilt Boundaries ◽  
Symmetrical Tilt ◽  
Twist Boundaries

Microstructures of a-axis oriented YBa2Cu3O7−x films made by newly developed de 100 MHz hybrid plasma sputtering were investigated using transmission electron microscopy (TEM). The films deposited on (110) NdGaO3 and (100) SrTiO3 substrates were found to grow in a perfect epitaxial fashion and with clear interface. The plan view of the TEM image showed that both films were comprised of two kinds of grains having the c axis aligning along two perpendicular directions in the plane with equal probability. The structures of the grain boundary, however, were found to be very different for the two films from the plan views. The film on NdGaO3 showed a lot of twist boundaries, while the film on SrTiO3 consisted of many symmetrical tilt boundaries and basal-plane-faced tilt boundaries. The type of grain boundary is determined by the anisotropic growth rates of the film between c direction and a-b direction.

Interaction Between Lattice Dislocations and Grain Boundaries In Ordered Compounds

1990 ◽  
Vol 213 ◽  
Author(s):  
B.J. Pestman ◽  
J. Th. M. De Hosson ◽  
V. Vitek ◽  
F.W. Schapink
Keyword(s):  
Shear Stress ◽  
Grain Boundary ◽  
Grain Boundaries ◽  
Partial Dislocation ◽  
Atomistic Simulations ◽  
Many Body ◽  
Shockley Partial Dislocation ◽  
Screw Dislocations ◽  
Applied Shear Stress ◽  
Tilt Boundaries

ABSTRACTThe interaction of 1/2<1 1 0> screw dislocations with symmetric [1 1 0] tilt boundaries was investigated by atomistic simulations using many-body potentials representing ordered compounds. The calculations were performed with and without an applied shear stress. The observations were: absorption into the grain boundary, attraction of a lattice Shockley partial dislocation towards the grain boundary and transmission through the grain boundary under the influence of a shear stress. It was found that the interaction in ordered compounds shows similarities to the interaction in fcc.

Study of Dynamic Embrittlement in Alloy Bicrystals

1996 ◽  
Vol 458 ◽  
Author(s):  
R. G. Muthiah ◽  
J. A. Pfaendtner ◽  
C. J. McMahon ◽  
P. Lejcek ◽  
V. Paidar
Keyword(s):  
Growth Rate ◽  
Steady State ◽  
Crack Growth Rate ◽  
Grain Boundary ◽  
Crack Growth ◽  
Tilt Axis ◽  
Tilt Boundaries ◽  
Symmetrical Tilt ◽  
Dynamic Embrittlement ◽  
Crack Growth Rates

ABSTRACTIn a kinetic model [1] for the phenomenon of dynamic embrittlement, the cracking rate is predicted to be proportional to the diffusivity of the embrittling species along the grain boundary. To test this model, bicrystals of Cu-Sn and Fe-Si with Σ5 symmetrical tilt boundaries are used in which tin and sulfur, respectively, are the embrittling elements. The diffusivities parallel and perpendicular to the tilt axis are expected to be different, therefore the crack growth rates in these two directions should vary in the same ratio as the diffusivities.Preliminary measurements of crack growth rate along the [100] direction in the Cu-Sn alloy bicrystal are presented. The cracking occurred by decohesion along the grain boundary with almost no observable plasticity. The steady state crack growth was found to be approximately 10∼6 m/sec.

Statistical Analysis of Grain Boundaries in the Space of Macroscopic Boundary Parameters

2011 ◽  
Vol 702-703 ◽  
pp. 697-702 ◽  
Author(s):  
Adam Morawiec
Keyword(s):  
Experimental Data ◽  
Grain Boundary ◽  
Quantitative Measure ◽  
Data Sets ◽  
Tilt Boundaries ◽  
Analysis Application ◽  
Experimental Errors ◽  
Computational Part ◽  
Textured Materials

Current issues concerning the characterization of grain boundary networks via five-dimensional (5D) grain boundary distributions are considered. A quantitative measure of reliability of such distributions is adapted from conventional texture analysis. Application of the measure shows that with the currently available size of experimental data sets of boundary parameters, only strong components of the boundary distributions can be reliably evaluated. Improvements of the computational part of the analysis are possible if the the binning based on Euler and polar/azimuth angles is replaced by searching the data sets based on a suitably defined distance. Moreover, it is indicated that for textured materials the stereological approach has limited reliability. Finally, it is suggested that coherent twins can be used for estimating experimental errors, and that the distributions cannot be a basis for conclusions about tilt boundaries unless additional restrictions are applied. The approach used in the paper is theoretical with support by computer simulations.

Structure and Dissociation of 15° Tilt Boundaries in Germanium

1983 ◽  
Vol 25 ◽  
Author(s):  
W. Skrotzki ◽  
H. Wendt ◽  
C. B. Carter ◽  
D. L. Kohlstedt
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Grain Boundary ◽  
Czochralski Method ◽  
Boundary Plane ◽  
First Order ◽  
Grain Boundary Plane ◽  
Transmission Electron ◽  
Theoretical Predictions ◽  
Tilt Boundaries

ABSTRACTThe structure and dissociation of grain boundaries in Ge bicrystals, grown by the Czochralski method, have been analyzed by visible light and transmission electron microscopy. The seed crystals were oriented to yield either a symmetric or an asymmetric grain boundary plane with a 15° rotation about a common <110> direction. The asymmetric boundary, with a {111} boundary plane, dissociated along most of its length into a first order twin boundary (Σ 3) and a symmetric 55° grain boundary (Σ 41c). The symmetric 15° boundary is composed of an array of Lomer dislocations. Contrary to theoretical predictions, this boundary is stable.

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