Characterization of Heterogeneous Regions in Polymer Systems Using Tapping Mode and Force Mode Atomic Force Microscopy

Langmuir ◽  
2000 ◽  
Vol 16 (24) ◽  
pp. 9448-9459 ◽  
Author(s):  
D. Raghavan ◽  
M. VanLandingham ◽  
X. Gu ◽  
T. Nguyen
Keyword(s):  
Atomic Force Microscopy ◽  
Polymer Systems ◽  
Tapping Mode ◽  
Force Microscopy ◽  
Atomic Force ◽  
Force Mode ◽  
Mode Atomic Force Microscopy

Characterization of Intermittent Contact in Tapping Mode Atomic Force Microscopy

2005 ◽  
Author(s):  
Xiaopeng Zhao ◽  
Harry Dankowicz
Keyword(s):  
Atomic Force Microscopy ◽  
Nonlinear Effects ◽  
Loss Of Stability ◽  
Tapping Mode ◽  
Force Microscopy ◽  
Strongly Nonlinear ◽  
Atomic Force ◽  
Dynamical Instabilities ◽  
Mode Atomic Force Microscopy

Tapping-mode atomic force microscopy has wide applications for probing the nanoscale surface and subsurface properties of numerous materials in a variety of environments. Strongly nonlinear effects due to large variations in the force field on the probe tip over very small length scales and the intermittency of contact with the sample, however, result in strong dynamical instabilities. These can result in a sudden loss of stability of low-contact-velocity oscillations of the atomic-force-microscope tip in favor of oscillations with high contact velocity, coexistence of stable oscillatory motions, and destructive, nonrepeatable, and unreliable characterization of the nanostructure. In this paper, dynamical systems tools for piecewise smooth systems are employed to characterize the loss of stability and associated parameter hysteresis phenomena.

Nonlinear dynamics as an essential tool for non-destructive characterization of soft nanostructures using tapping-mode atomic force microscopy

2006 ◽  
Vol 364 (1849) ◽  
pp. 3505-3520 ◽  
Author(s):  
Harry Dankowicz
Keyword(s):  
Atomic Force Microscopy ◽  
Near Field ◽  
Full Potential ◽  
Nonlinear Behaviour ◽  
Tapping Mode ◽  
Force Microscopy ◽  
Atomic Force ◽  
Steady State Responses ◽  
Mode Atomic Force Microscopy

Tapping-mode atomic force microscopy provides a means for successful and non-intrusive characterization of soft physical and biological structures at the nanoscale. Its full potential can only be realized, provided that the response of the oscillating probe tip to the strongly nonlinear, near-field force interactions with the structure and the intermittency of contact can be accurately modelled, analysed, controlled and interpreted. To this end, this paper reviews some experimental observations of fundamentally nonlinear behaviour of the tip dynamics. It discusses the nonlinear phenomenology that explains their presence in the tapping-mode operation of the atomic force microscope. Particular emphasis is placed on the coexistence of different steady-state responses and their origin in transitions across regions of rapidly varying force characteristics. The heuristics of a recently developed method for treating such transitions are presented and insights into its implications are drawn from related micro- and nanoscale applications.

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