Characterization of the Surface to Thiol Bonding in Self-Assembled Monolayer Films of C12H25SH on InP(100) by Angle-Resolved X-ray Photoelectron Spectroscopy
Keyword(s):
X Ray
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2012 ◽
Vol 405
(5)
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pp. 1479-1495
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2001 ◽
Vol 114-116
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pp. 371-374
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2009 ◽
Vol 113
(28)
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pp. 12260-12271
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2013 ◽
Vol 31
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pp. 104-107
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2000 ◽
Vol 461
(1-3)
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pp. 199-207
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