In Situ Monitoring of Diffuse Double Layer Structure Changes of Electrochemically Addressable Self-Assembled Monolayers with an Atomic Force Microscope

Langmuir ◽  
1999 ◽  
Vol 15 (9) ◽  
pp. 3343-3347 ◽  
Author(s):  
Kai Hu ◽  
Zheng Chai ◽  
James K. Whitesell ◽  
Allen J. Bard
Keyword(s):  
Atomic Force Microscope ◽  
Layer Structure ◽  
In Situ Monitoring ◽  
Self Assembled Monolayers ◽  
Diffuse Double Layer ◽  
Atomic Force ◽  
Double Layer Structure ◽  
Structure Changes ◽  
Assembled Monolayers

Measurements of Single-Molecule Bond-Rupture Forces between Self-Assembled Monolayers of Organosilanes with the Atomic Force Microscope

Langmuir ◽  
1997 ◽  
Vol 13 (14) ◽  
pp. 3761-3768 ◽  
Author(s):  
L. A. Wenzler ◽  
G. L. Moyes ◽  
G. N. Raikar ◽  
R. L. Hansen ◽  
J. M. Harris ◽  
...  
Keyword(s):  
Atomic Force Microscope ◽  
Single Molecule ◽  
Self Assembled Monolayers ◽  
Bond Rupture ◽  
Atomic Force ◽  
Assembled Monolayers ◽  
Self Assembled

Electrokinetic Potentials of Binary Self-Assembled Monolayers on Gold:  Acid−Base Reactions and Double Layer Structure

2004 ◽  
Vol 108 (9) ◽  
pp. 2910-2917 ◽  
Author(s):  
Ruediger Schweiss ◽  
Dieter Pleul ◽  
Frank Simon ◽  
Andreas Janke ◽  
Petra B. Welzel ◽  
...  
Keyword(s):  
Double Layer ◽  
Layer Structure ◽  
Self Assembled Monolayers ◽  
Acid Base ◽  
Double Layer Structure ◽  
Assembled Monolayers ◽  
Self Assembled
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