Study of Long-Range Tilt Orientation in Fatty Acid Monolayers by Dynamic Scanning Force Microscopy

Langmuir ◽  
1998 ◽  
Vol 14 (4) ◽  
pp. 875-879 ◽  
Author(s):  
L. F. Chi ◽  
M. Gleiche ◽  
H. Fuchs
Keyword(s):  
Fatty Acid ◽  
Long Range ◽  
Scanning Force Microscopy ◽  
Force Microscopy ◽  
Scanning Force ◽  
Dynamic Scanning

scholarly journals Molecular-resolution imaging of pentacene on KCl(001)

2012 ◽  
Vol 3 ◽  
pp. 186-191 ◽  
Author(s):  
Julia L Neff ◽  
Jan Götzen ◽  
Enhui Li ◽  
Michael Marz ◽  
Regina Hoffmann-Vogel
Keyword(s):  
High Resolution ◽  
Scanning Force Microscopy ◽  
Force Microscopy ◽  
Molecular Arrangement ◽  
Domain Boundaries ◽  
Different Types ◽  
Scanning Force ◽  
High Resolution Images ◽  
Resolution Imaging ◽  
Dynamic Scanning

The growth of pentacene on KCl(001) at submonolayer coverage was studied by dynamic scanning force microscopy. At coverages below one monolayer pentacene was found to arrange in islands with an upright configuration. The molecular arrangement was resolved in high-resolution images. In these images two different types of patterns were observed, which switch repeatedly. In addition, defects were found, such as a molecular vacancy and domain boundaries.

scholarly journals Calibration of oscillation amplitude in dynamic scanning force microscopy

2013 ◽  
Vol 24 (18) ◽  
pp. 185701 ◽  
Author(s):  
Juan Francisco González Martínez ◽  
Inés Nieto-Carvajal ◽  
Jaime Colchero
Keyword(s):  
Oscillation Amplitude ◽  
Scanning Force Microscopy ◽  
Force Microscopy ◽  
Scanning Force ◽  
Dynamic Scanning

scholarly journals Theoretical study of short- and long-range forces and atom transfer in scanning force microscopy

1992 ◽  
Vol 46 (16) ◽  
pp. 10411-10422 ◽  
Author(s):  
S. Ciraci ◽  
E. Tekman ◽  
A. Baratoff ◽  
Inder P. Batra
Keyword(s):  
Long Range ◽  
Theoretical Study ◽  
Scanning Force Microscopy ◽  
Atom Transfer ◽  
Force Microscopy ◽  
Scanning Force

Contrast inversion in non-contact Dynamic Scanning Force Microscopy: What is high and what is low?

2010 ◽  
Vol 110 (7) ◽  
pp. 789-800 ◽  
Author(s):  
E. Palacios-Lidón ◽  
C. Munuera ◽  
C. Ocal ◽  
J. Colchero
Keyword(s):  
Scanning Force Microscopy ◽  
Force Microscopy ◽  
Scanning Force ◽  
Dynamic Scanning ◽  
Contrast Inversion
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