Effect of Infrared Radiation and Air Flow on Fourier Transform Infrared External Reflection Spectra of Langmuir Monolayers

Langmuir ◽  
1997 ◽  
Vol 13 (3) ◽  
pp. 502-505 ◽  
Author(s):  
Hiroshi Sakai ◽  
Junzo Umemura
Keyword(s):  
Fourier Transform ◽  
Infrared Radiation ◽  
Air Flow ◽  
Langmuir Monolayers ◽  
Fourier Transform Infrared ◽  
Reflection Spectra

scholarly journals Accelerated climate aging of building materials and their characterization by Fourier transform infrared radiation analysis

2011 ◽  
Vol 36 (1) ◽  
pp. 99-112 ◽  
Author(s):  
Bjørn Petter Jelle ◽  
Tom-Nils Nilsen ◽  
Per Jostein Hovde ◽  
Arild Gustavsen
Keyword(s):  
Fourier Transform ◽  
Infrared Radiation ◽  
Building Materials ◽  
Fourier Transform Infrared

Fourier Transform Infrared Reflection Spectroscopy Studies of Organic Films Formed on Inorganic Substrates

1986 ◽  
Vol 40 (6) ◽  
pp. 794-797 ◽  
Author(s):  
A. Udagawa ◽  
T. Matsui ◽  
S. Tanaka
Keyword(s):  
Fourier Transform ◽  
Indium Tin Oxide ◽  
Incident Light ◽  
Fourier Transform Infrared ◽  
Inorganic Materials ◽  
Phase System ◽  
Angle Of Incidence ◽  
Reflection Spectra ◽  
Reflection Spectroscopy ◽  
Optimal Measurement

Reflection absorption spectroscopy on metal surfaces has been applied to reflection spectroscopy on nonmetallic inorganic materials with Fourier transform infrared spectroscopy. The optimal measurement conditions—polarization of incident light and angle of incidence—are discussed on the basis of a calculation using a model of a three-phase system consisting of air, an organic film, and an inorganic substrate. Reflection spectra of stearic acid films on glass substrates were obtained for both perpendicular and parallel polarized incident lights. The optimal measurement condition was for perpendicular polarization, at angle of incidence of 70°, although the signal-to-noise ratio (S/N) of reflection spectra under this condition was ten times less than the S/N of reflection absorption spectra. Reflection spectra on indium tin oxide substrates were obtained for only parallel polarized incident light, and the optimal angle of incidence was 73°. These results were in good agreement with the calculation results.

FR-IR Molecular Microanalysis System

1990 ◽  
Vol 48 (2) ◽  
pp. 270-271
Author(s):  
John A. Reffner ◽  
William T. Wihlborg
Keyword(s):  
Fourier Transform ◽  
Fourier Transform Infrared ◽  
Integrated System ◽  
Morphological Examination ◽  
Fully Integrated ◽  
Ir Microscopy ◽  
Normal Functions ◽  
Infrared Microspectroscopy ◽  
Infrared Spectral ◽  
Ft Ir

The IRμs™ is the first fully integrated system for Fourier transform infrared (FT-IR) microscopy. FT-IR microscopy combines light microscopy for morphological examination with infrared spectroscopy for chemical identification of microscopic samples or domains. Because the IRμs system is a new tool for molecular microanalysis, its optical, mechanical and system design are described to illustrate the state of development of molecular microanalysis. Applications of infrared microspectroscopy are reviewed by Messerschmidt and Harthcock.Infrared spectral analysis of microscopic samples is not a new idea, it dates back to 1949, with the first commercial instrument being offered by Perkin-Elmer Co. Inc. in 1953. These early efforts showed promise but failed the test of practically. It was not until the advances in computer science were applied did infrared microspectroscopy emerge as a useful technique. Microscopes designed as accessories for Fourier transform infrared spectrometers have been commercially available since 1983. These accessory microscopes provide the best means for analytical spectroscopists to analyze microscopic samples, while not interfering with the FT-IR spectrometer’s normal functions.

Fourier transform infrared spectrum of 13C32S2 in the 3v3 band region

1996 ◽  
Vol 89 (4) ◽  
pp. 1145-1155
Author(s):  
JACQUES WALRAND ◽  
GHISLAIN BLANQUET ◽  
JEAN-FRANCOIS BLAVIER ◽  
HARALD BREDOHL ◽  
IWAN DUBOIS
Keyword(s):  
Fourier Transform ◽  
Infrared Spectrum ◽  
Fourier Transform Infrared ◽  
Band Region
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