Dynamic Properties of a Phospholipid Thin Film at an Air/Water Interface with a Periodic Change in Surface Area

Langmuir ◽  
1997 ◽  
Vol 13 (26) ◽  
pp. 7125-7134 ◽  
Author(s):  
Masakazu Makino ◽  
Kenichi Yoshikawa
Langmuir ◽  
1986 ◽  
Vol 2 (3) ◽  
pp. 349-354 ◽  
Author(s):  
Yen Lane. Chen ◽  
Masahito. Sano ◽  
Masami. Kawaguchi ◽  
Hyuk. Yu ◽  
George. Zografi

1996 ◽  
Vol 69 (12) ◽  
pp. 3429-3434 ◽  
Author(s):  
Masakazu Makino ◽  
Mamoru Kamiya ◽  
Toshio Ishii ◽  
Kenichi Yoshikawa

Langmuir ◽  
1999 ◽  
Vol 15 (5) ◽  
pp. 1716-1724 ◽  
Author(s):  
Alan R. Esker ◽  
Lan-Hui Zhang ◽  
Carl E. Olsen ◽  
Kwanghyun No ◽  
Hyuk Yu

Soft Matter ◽  
2018 ◽  
Vol 14 (23) ◽  
pp. 4750-4761 ◽  
Author(s):  
Christian Appel ◽  
Martin Kraska ◽  
Christian Rüttiger ◽  
Markus Gallei ◽  
Bernd Stühn

First evidence for thin film breakup of a polymer film observed by in situ Surface X-ray scattering at the air–water interface.


2018 ◽  
Vol 2018 ◽  
pp. 1-10 ◽  
Author(s):  
Lin Zhu ◽  
Fang Chen ◽  
Xiaoyan Ma ◽  
Xiu Qiang ◽  
Zhiguang Li ◽  
...  

The aggregation behavior of three tadpole-shaped Polyhedral oligomeric silsesquioxane (POSS) based block copolymers using different blocks poly(methyl methacrylate) (PMMA) and poly(trifluoroethyl methacrylate) (PTFEMA) with different block sequence and ratio (POSS-PTFEMA161-b-PMMA236, POSS-PMMA277-b-PTFEMA130, and POSS-PMMA466-b-PTFEMA172) was investigated on the air-water interface. The interfacial rheology of three block copolymers was studied by surface pressure isotherm, compression modulus measurements, and compression and expansion hysteresis analysis on the Langmuir trough. The block sequence and ratio play a great role in self-assembly behavior at the interface. Based on surface pressure isotherm analysis, a thin film with low elasticity was achieved for the POSS-PTFEMA161-b-PMMA236. Moreover, for the block copolymer with same segment sequence (POSS-PMMA2-b-PTFEMA), the thin film compression capability is increased with increasing the PMMA ratio. The morphology of the deposited LB thin film was illustrated by atomic force microscopy (AFM) and X-ray photoelectron spectroscopy (XPS). We observed that a thin film was composed by crater-shaped quasi-2D micelles for POSS-PTFEMA-b-PMMA, while it was proved that only flaky texture was observed for both POSS-PMMA277-b-PTFEMA130 and POSS-PMMA466-b-PTFEMA172. The thickness and area of flaky aggregates were greatly related to PMMA ratio. The different interface self-assembly structure evolution was proposed based on the interfacial rheology and thin film morphology studies.


2003 ◽  
Vol 268 (1) ◽  
pp. 50-57 ◽  
Author(s):  
Juan M. Rodrı́guez Patino ◽  
Sara E. Molina Ortiz ◽  
Cecilio Carrera Sánchez ◽  
Maria Rosario Rodrı́guez Niño ◽  
Maria Cristina Añón

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