In Situ Atomic Force Microscopy Observation of Change in Thickness of Nickel Hydroxide Layer on Ni Electrode

Langmuir ◽  
1996 ◽  
Vol 12 (10) ◽  
pp. 2332-2333 ◽  
Author(s):  
A. Kowal ◽  
R. Niewiara ◽  
B. Perończyk ◽  
J. Haber
2017 ◽  
Vol 121 (9) ◽  
pp. 095304 ◽  
Author(s):  
Y. M. Lu ◽  
J. F. Zeng ◽  
J. C. Huang ◽  
S. Y. Kuan ◽  
T. G. Nieh ◽  
...  

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