scholarly journals True Atomic-Resolution Imaging of (101̅4) Calcite in Aqueous Solution by Frequency Modulation Atomic Force Microscopy

Langmuir ◽  
2009 ◽  
Vol 25 (5) ◽  
pp. 2850-2853 ◽  
Author(s):  
Sebastian Rode ◽  
Noriaki Oyabu ◽  
Kei Kobayashi ◽  
Hirofumi Yamada ◽  
Angelika Kühnle
Keyword(s):  
Aqueous Solution ◽  
Atomic Force Microscopy ◽  
Frequency Modulation ◽  
Atomic Resolution ◽  
Force Microscopy ◽  
Atomic Force ◽  
Resolution Imaging

scholarly journals Understanding 2D atomic resolution imaging of the calcite surface in water by frequency modulation atomic force microscopy

2016 ◽  
Vol 27 (41) ◽  
pp. 415709 ◽  
Author(s):  
John Tracey ◽  
Keisuke Miyazawa ◽  
Peter Spijker ◽  
Kazuki Miyata ◽  
Bernhard Reischl ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Frequency Modulation ◽  
Atomic Resolution ◽  
Force Microscopy ◽  
Atomic Force ◽  
Resolution Imaging

Atomic-Resolution Imaging of Aragonite (001) Surface in Water by Frequency Modulation Atomic Force Microscopy

2012 ◽  
Vol 51 (8S3) ◽  
pp. 08KB09 ◽  
Author(s):  
Yuki Araki ◽  
Katsuo Tsukamoto ◽  
Noriaki Oyabu ◽  
Kei Kobayashi ◽  
Hirofumi Yamada
Keyword(s):  
Atomic Force Microscopy ◽  
Frequency Modulation ◽  
Atomic Resolution ◽  
Force Microscopy ◽  
Atomic Force ◽  
Resolution Imaging

Atomic-Resolution Imaging of Aragonite (001) Surface in Water by Frequency Modulation Atomic Force Microscopy

2012 ◽  
Vol 51 ◽  
pp. 08KB09 ◽  
Author(s):  
Yuki Araki ◽  
Katsuo Tsukamoto ◽  
Noriaki Oyabu ◽  
Kei Kobayashi ◽  
Hirofumi Yamada
Keyword(s):  
Atomic Force Microscopy ◽  
Frequency Modulation ◽  
Atomic Resolution ◽  
Force Microscopy ◽  
Atomic Force ◽  
Resolution Imaging

Atomic-Resolution Imaging of Graphite–Water Interface by Frequency Modulation Atomic Force Microscopy

2011 ◽  
Vol 4 (12) ◽  
pp. 125102 ◽  
Author(s):  
Kazuhiro Suzuki ◽  
Noriaki Oyabu ◽  
Kei Kobayashi ◽  
Kazumi Matsushige ◽  
Hirofumi Yamada
Keyword(s):  
Atomic Force Microscopy ◽  
Frequency Modulation ◽  
Atomic Resolution ◽  
Water Interface ◽  
Force Microscopy ◽  
Atomic Force ◽  
Resolution Imaging

Atomic Resolution Imaging on Si(100)2×1 and Si(100)2×1:H Surfaces with Noncontact Atomic Force Microscopy

2000 ◽  
Vol 39 (Part 2, No. 2A) ◽  
pp. L113-L115 ◽  
Author(s):  
Kousuke Yokoyama ◽  
Taketoshi Ochi ◽  
Akira Yoshimoto ◽  
Yasuhiro Sugawara ◽  
Seizo Morita
Keyword(s):  
Atomic Force Microscopy ◽  
Atomic Resolution ◽  
Force Microscopy ◽  
Atomic Force ◽  
Resolution Imaging
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