X-Ray Reflectivity Measurements of Layer-by-Layer Films at the Solid/Liquid Interface

Langmuir ◽  
2008 ◽  
Vol 24 (21) ◽  
pp. 12093-12096 ◽  
Author(s):  
Svetlana Erokhina ◽  
Tatiana Berzina ◽  
Luigi Cristofolini ◽  
Victor Erokhin ◽  
Claudia Folli ◽  
...  
Keyword(s):  
Liquid Interface ◽  
Layer By Layer ◽  
X Ray ◽  
Solid Liquid Interface ◽  
Solid Liquid

On The Decoration of Layer-By-Layer Films for the X-Ray Reflectivity Study at the Solid-Liquid Interface

2015 ◽  
Vol 5 (1) ◽  
pp. 39-41
Author(s):  
Svetlana Erokhina ◽  
Elena Dellacasa ◽  
Vladimir Sorokin ◽  
Laura Pastorino
Keyword(s):  
Liquid Interface ◽  
Layer By Layer ◽  
X Ray ◽  
Solid Liquid Interface ◽  
Solid Liquid

scholarly journals Structure of Synthetic Transmembrane Lipid Membranes at the Solid/Liquid Interface Studied by Specular X-ray Reflectivity

2008 ◽  
Vol 112 (32) ◽  
pp. 10041-10044 ◽  
Author(s):  
Thomas Schubert ◽  
Peter C. Seitz ◽  
Emanuel Schneck ◽  
Makoto Nakamura ◽  
Motonari Shibakami ◽  
...  
Keyword(s):  
Lipid Membranes ◽  
Liquid Interface ◽  
X Ray ◽  
Solid Liquid Interface ◽  
Solid Liquid

Crystal Growth Of A Decagonal AI-Co-Ni Quasicrystal

1998 ◽  
Vol 553 ◽  
Author(s):  
J.Q. Guo ◽  
T. J. Sato ◽  
T. Kimura ◽  
T. Hirano ◽  
A. P. Tsai
Keyword(s):  
Liquid Interface ◽  
Floating Zone ◽  
Solute Redistribution ◽  
Zone Method ◽  
Decagonal Quasicrystal ◽  
X Ray ◽  
State Growth ◽  
Solid Liquid Interface ◽  
Solid Liquid ◽  
Very High

AbstractWe have grown a decagonal single quasicrystal with a size of centimeter order in an A172Co16Ni12 alloy by floating zone method at a growth rate of 0.5 mm/h. The single decagonal quasicrystal has been inspected by Laue X-ray as well as neutron diffraction, revealing a very high quasicrystalline quality. By quenching the liquid during growth, a flat solid-liquid interface has been directly observed. There exists solute redistribution at the growing solid-liquid interface. At steady state growth Al is enriched and Co, Ni are depleted in front of solid-liquid interface. Solute partition ratios of Al, Co and Ni were determined to be about 0.91, 1.57 and 1.08, respectively.

Surface X-ray scattering of high index plane of platinum containing kink atoms in solid–liquid interface: Pt(310)=3(100)–(110)

2008 ◽  
Vol 53 (21) ◽  
pp. 6070-6075 ◽  
Author(s):  
Nagahiro Hoshi ◽  
Akira Nakahara ◽  
Masashi Nakamura ◽  
Kazushi Sumitani ◽  
Osami Sakata
Keyword(s):  
Liquid Interface ◽  
High Index ◽  
X Ray ◽  
X Ray Scattering ◽  
Solid Liquid Interface ◽  
Solid Liquid ◽  
High Index Plane ◽  
Ray Scattering

X-ray diffraction evidence of ordering in a normal liquid near the solid-liquid interface

2000 ◽  
Vol 50 (4) ◽  
pp. 487-493 ◽  
Author(s):  
C.-J Yu ◽  
A. G Richter ◽  
J Kmetko ◽  
A Datta ◽  
P Dutta
Keyword(s):  
Liquid Interface ◽  
X Ray Diffraction ◽  
X Ray ◽  
Normal Liquid ◽  
Solid Liquid Interface ◽  
Solid Liquid
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