Polymer Nanowire Elastic Moduli Measured with Digital Pulsed Force Mode AFM†

Langmuir ◽  
2005 ◽  
Vol 21 (22) ◽  
pp. 10214-10218 ◽  
Author(s):  
Saravanarajan Shanmugham ◽  
Jonghwa Jeong ◽  
Abdullah Alkhateeb ◽  
D. Eric Aston
Keyword(s):  
Elastic Moduli ◽  
Force Mode ◽  
Pulsed Force Mode Afm

Investigation of the perovskite ceramic Li0.30La0.56TiO3 by Pulsed Force Mode AFM for pH sensor application

2009 ◽  
Vol 138 (1) ◽  
pp. 193-200 ◽  
Author(s):  
Mickaël Roffat ◽  
Olivier Noël ◽  
Olivier Soppera ◽  
Odile Bohnke
Keyword(s):  
Ph Sensor ◽  
Sensor Application ◽  
Force Mode ◽  
Pulsed Force Mode Afm ◽  
Perovskite Ceramic

Digital Pulsed Force Mode AFM and Confocal Raman Microscopy in Drug-Eluting Coatings Research

2011 ◽  
Vol 1318 ◽  
Author(s):  
G. Haugstad ◽  
K. Wormuth
Keyword(s):  
Structural Changes ◽  
Raman Microscopy ◽  
Confocal Raman Microscopy ◽  
Characterization Methods ◽  
Drug Elution ◽  
Force Mode ◽  
Confocal Raman ◽  
Amorphous Drug ◽  
Pulsed Force Mode Afm ◽  
Time Frames

ABSTRACTControlled release of amorphous drug from a polymer matrix depends intimately upon the degree of mixing of drug and polymer, the susceptibility of the drug to crystallization, and the ability of the drug to dissolve and diffuse through water-swollen polymer. Characterization methods ideally would follow these processes on the molecular level in situ and in real time. We move closer to this ideal state of characterization through application of two imaging methods: digital pulsed force mode atomic force microscopy (D-PFM AFM) and confocal Raman microscopy (CRM). We examine model spin-coated films ~1 μm thick containing the drug dexamethasone dispersed in poly(n-alkyl methacrylate) homopolymer and blend coatings. We report aqueous-immersion studies of surface and subsurface structural changes due to drug elution over time frames ranging from very fast (a few minutes) to slow (tens of hours).

scholarly journals 1P323 Molecular mapping using Pulsed-Force-Mode AFM in solution

2005 ◽  
Vol 45 (supplement) ◽  
pp. S112
Author(s):  
H. Haruta ◽  
T. Morii ◽  
H. Yoshimura ◽  
T. Okada ◽  
Y. Ogawa ◽  
...  
Keyword(s):  
Molecular Mapping ◽  
Force Mode ◽  
Pulsed Force Mode Afm

Investigation of pulsed laser deposited crystalline PTFE thin layer with pulsed force mode AFM

2004 ◽  
Vol 453-454 ◽  
pp. 239-244 ◽  
Author(s):  
N Kresz ◽  
J Kokavecz ◽  
T Smausz ◽  
B Hopp ◽  
M Csete ◽  
...  
Keyword(s):  
Thin Layer ◽  
Pulsed Laser ◽  
Force Mode ◽  
Pulsed Force Mode Afm

Epitaxial Growth in Dislocation-Free Strained Alloy Films

2002 ◽  
Vol 715 ◽  
Author(s):  
Zhi-Feng Huang ◽  
Rashmi C. Desai
Keyword(s):  
Deposition Rate ◽  
Elastic Moduli ◽  
Composition Dependence ◽  
Critical Thickness ◽  
Lattice Misfit ◽  
Misfit Strain ◽  
Joint Stability ◽  
Alloy Films ◽  
The Stability ◽  
Stability Results

AbstractThe morphological and compositional instabilities in the heteroepitaxial strained alloy films have attracted intense interest from both experimentalists and theorists. To understand the mechanisms and properties for the generation of instabilities, we have developed a nonequilibrium, continuum model for the dislocation-free and coherent film systems. The early evolution processes of surface pro.les for both growing and postdeposition (non-growing) thin alloy films are studied through a linear stability analysis. We consider the coupling between top surface of the film and the underlying bulk, as well as the combination and interplay of different elastic effects. These e.ects are caused by filmsubstrate lattice misfit, composition dependence of film lattice constant (compositional stress), and composition dependence of both Young's and shear elastic moduli. The interplay of these factors as well as the growth temperature and deposition rate leads to rich and complicated stability results. For both the growing.lm and non-growing alloy free surface, we determine the stability conditions and diagrams for the system. These show the joint stability or instability for film morphology and compositional pro.les, as well as the asymmetry between tensile and compressive layers. The kinetic critical thickness for the onset of instability during.lm growth is also calculated, and its scaling behavior with respect to misfit strain and deposition rate determined. Our results have implications for real alloy growth systems such as SiGe and InGaAs, which agree with qualitative trends seen in recent experimental observations.

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