Phase Separation in Class II Organically Modified Silicate Films As Probed by Phase-Imaging Atomic Force Microscopy

Langmuir ◽  
2005 ◽  
Vol 21 (14) ◽  
pp. 6137-6141 ◽  
Author(s):  
Jana Striova ◽  
Daniel A. Higgins ◽  
Maryanne M. Collinson
Keyword(s):  
Atomic Force Microscopy ◽  
Phase Separation ◽  
Class Ii ◽  
Phase Imaging ◽  
Force Microscopy ◽  
Atomic Force ◽  
Organically Modified

scholarly journals Applications of Atomic Force Microscopy in Textiles

2015 ◽  
Vol 10 (1) ◽  
pp. 155892501501000
Author(s):  
Serpil Koral Koc
Keyword(s):  
Atomic Force Microscopy ◽  
Cross Section ◽  
Cross Sections ◽  
Phase Imaging ◽  
Cotton Wool ◽  
Synthetic Fibers ◽  
Force Microscopy ◽  
Fiber Properties ◽  
Atomic Force ◽  
Potential Applications

Potential applications of atomic force microscopy (AFM) in textiles are explained. For this purpose samples were carefully selected from both natural and synthetic fibers. Cotton, wool, conventional polyethylene terepthalate (PET), antibacterial PET, and antistatic PET were investigated by means of 3D topography imaging, phase imaging, and calculation of their Rq values. The distribution of the additives in the cross sections of antibacterial PET and antistatic PET were analyzed. Moreover, differences between inner and outer cross section of trilobal PET was observed by force spectroscopy. The results are discussed considering the fiber properties. It is concluded that AFM is a powerful tool to investigate different properties of textile fibers, and it gives valuable information.

Phase Contrast Imaging in Atomic Force Microscopy

1997 ◽  
Vol 3 (S2) ◽  
pp. 1275-1276
Author(s):  
Sergei Magonov
Keyword(s):  
Atomic Force Microscopy ◽  
Phase Contrast ◽  
Phase Changes ◽  
Phase Imaging ◽  
Phase Detection ◽  
Contrast Imaging ◽  
Force Microscopy ◽  
Atomic Force ◽  
Resonance Frequencies ◽  
Soft Samples

Phase detection in TappingMode™ enhances capabilities of Atomic Force Microscopy (AFM) for soft samples (polymers and biological materials). Changes of amplitude and phase changes of a fast oscillating probe are caused by tip-sample force interactions. Height images reflect the amplitude changes, and in most cases they present a sample topography. Phase images show local differences between phases of free-oscillating probe and of probe interacting with a sample surface. These differences are related to the change of the resonance frequency of the probe either by attractive or repulsive tip-sample forces. Therefore phase detection helps to choose attractive or repulsive force regime for surface imaging and to minimize tip-sample force. For heterogeneous materials the phase imaging allows to distinguish individual components and to visualize their distribution due to differences in phase contrast. This is typically achieved in moderate tapping, when set-point amplitude, Asp, is about half of the amplitude of free-oscillating cantilever, Ao. In contrast, light tapping with Asp close to Ao is best suited for recording a true topography of the topmost surface layer of soft samples. Examples of phase imaging of polymers obtained with a scanning probe microscope Nanoscope® IIIa (Digital Instruments). Si probes (225 μk long, resonance frequencies 150-200 kHz) were used.

Synergy of Resonant Oscillatory Modes in Atomic Force Microscopy of Polymers

MRS Advances ◽  
2016 ◽  
Vol 1 (25) ◽  
pp. 1853-1858 ◽  
Author(s):  
Sergei Magonov ◽  
Sergey Belikov ◽  
John Alexander ◽  
Marko Surtchev
Keyword(s):  
Atomic Force Microscopy ◽  
Amplitude Modulation ◽  
Frequency Modulation ◽  
Phase Imaging ◽  
Force Microscopy ◽  
Atomic Force ◽  
Heterogeneous Samples ◽  
Modulation Mode

ABSTRACTThe set of oscillatory resonance AFM modes is expanded with frequency modulation mode and frequency imaging in amplitude modulation mode. The backgrounds of these modes are discussed and their capabilities are compared on the practical examples. The data show how these techniques complement the amplitude modulation with phase imaging. The frequency imaging enhances the compositional mapping of heterogeneous samples. Frequency modulation mode provides a superior capability in imaging at low tip-sample forces.

scholarly journals Use of Atomic Force Microscopy and Transmission Electron Microscopy for Correlative Studies of Bacterial Capsules

2008 ◽  
Vol 74 (17) ◽  
pp. 5457-5465 ◽  
Author(s):  
Oleg Stukalov ◽  
Anton Korenevsky ◽  
Terry J. Beveridge ◽  
John R. Dutcher
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Atomic Force Microscopy ◽  
Shewanella Oneidensis ◽  
Geobacter Sulfurreducens ◽  
Phase Imaging ◽  
Tem Analysis ◽  
Force Microscopy ◽  
Atomic Force ◽  
Transmission Electron

ABSTRACT Bacteria can possess an outermost assembly of polysaccharide molecules, a capsule, which is attached to their cell wall. We have used two complementary, high-resolution microscopy techniques, atomic force microscopy (AFM) and transmission electron microscopy (TEM), to study bacterial capsules of four different gram-negative bacterial strains: Escherichia coli K30, Pseudomonas aeruginosa FRD1, Shewanella oneidensis MR-4, and Geobacter sulfurreducens PCA. TEM analysis of bacterial cells using different preparative techniques (whole-cell mounts, conventional embeddings, and freeze-substitution) revealed capsules for some but not all of the strains. In contrast, the use of AFM allowed the unambiguous identification of the presence of capsules on all strains used in the present study, including those that were shown by TEM to be not encapsulated. In addition, the use of AFM phase imaging allowed the visualization of the bacterial cell within the capsule, with a depth sensitivity that decreased with increasing tapping frequency.

scholarly journals Atomic force microscopy of phase separation on ruptured, giant unilamellar vesicles

2018 ◽  
Author(s):  
Yanfei Jiang ◽  
Guy M. Genin ◽  
Kenneth M. Pryse ◽  
Elliot L. Elson
Keyword(s):  
Atomic Force Microscopy ◽  
Phase Separation ◽  
Model Systems ◽  
Study Phase ◽  
Dark Phase ◽  
Giant Unilamellar Vesicles ◽  
Unilamellar Vesicles ◽  
Force Microscopy ◽  
Atomic Force ◽  
Lipid Species

AbstractGiant unilamellar vesicles (GUVs) and supported lipid bilayers (SLBs) are synthetic model systems widely used in biophysical studies of lipid membranes. Phase separation behaviors of lipid species in these two model systems differ due to the lipid-substrate interactions that are present only for SLBs. Therefore, GUVs are believed to resemble natural cell membranes more closely, and a very large body of literature focuses on applying nano-characterization techniques to quantify phase separation on GUVs. However, one important technique, atomic force microscopy (AFM), has not yet been used successfully to study phase separation on GUVs. In the present study, we report that in binary systems, certain phase domains on GUVs retain their original shapes and patterns after the GUVs rupture on glass surfaces. This enabled AFM experiments on phase domains from binary GUVs containing 1,2-dilauroyl-sn-glycero-3-phosphocholine (DLPC) and either 1,2-dipalmitoyl-sn-glycero-3-phosphocholine (DPPC) or 1,2-distearoyl-sn-glycero-3-phosphocholine (DSPC). These DLPC/DSPC and DLPC/DPPC GUVs both presented two different gel phases, one of which (bright phase) included a relatively high concentration of DiI-C20 but excluded Bodipy-HPC, and the other of which (dark phase) excluded both probes. The bright phases are of interest because they seem to stabilize dark phases against coalescence. Results suggested that the gel phases labeled by DiI-C20 in the DLPC/DSPC membrane, which surround the dark gel phase, is an extra layer of membrane, indicating a highly curved structure that might stabilize the interior dark domains. This phenomenon was not found in the DLPC/DPPC membrane. These results show the utility of AFM on collapsed GUVs, and suggest a possible mechanism for stabilization of lipid domains.

scholarly journals Tapping Mode Atomic Force Microscopy (TMAFM) of Some Multi-Component Polymers

2013 ◽  
Vol 29 ◽  
pp. 96-103
Author(s):  
Rameshwar Adhikari
Keyword(s):  
Atomic Force Microscopy ◽  
Block Copolymers ◽  
Chemical Society ◽  
Phase Imaging ◽  
Force Microscopy ◽  
Molecular Arrangement ◽  
Atomic Force ◽  
Unit Cells ◽  
Potential Applications ◽  
Nanoscale Morphology

Atomic force microscopy (AFM) has been used frequently in polymer research in particular for imaging topography and phase morphology of multi-component polymers. In this work, we demonstrate the potential applications of the AFM in the study of morphology of multi-component polymers taking examples of some technically important semicrystalline polymers, blends and nanostructured block copolymers. The morphology of semicrystalline morphology could be determined ranging from molecular arrangement in the unit cells to the lamellar structure to the macroscopic morphology showing the spherulites of the polymers. Nanoscale morphology of block copolymers, nanocomposites and blends could be easily accessed by the aping mode AFM (TMAFM) phase imaging technique. It has been demonstrated that TMAFM phase imaging can be successfully utilized as a routine tool for the investigation of nanoscale morphology of the heterogeneous polymers.DOI: http://dx.doi.org/10.3126/jncs.v29i0.9258Journal of Nepal Chemical Society Vol. 29, 2012 Page:  96-103 Uploaded date: 12/5/2013 

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