Fabricating and Aligning π-Conjugated Polymer-Functionalized DNA Nanowires:  Atomic Force Microscopic and Scanning Near-Field Optical Microscopic Studies

Langmuir ◽  
2005 ◽  
Vol 21 (17) ◽  
pp. 7945-7950 ◽  
Author(s):  
Hidenobu Nakao ◽  
Hideki Hayashi ◽  
Futoshi Iwata ◽  
Hidenori Karasawa ◽  
Koji Hirano ◽  
...  
Keyword(s):  
Conjugated Polymer ◽  
Near Field ◽  
Atomic Force ◽  
Microscopic Studies

Heat Transfer Spectroscopy and “Heat Transfer-Distance” Curves

2008 ◽  
Author(s):  
Arvind Narayanaswamy ◽  
Sheng Shen ◽  
Gang Chen
Keyword(s):  
Heat Transfer ◽  
Radiative Transfer ◽  
Atomic Force Microscope ◽  
Near Field ◽  
Surface Force ◽  
Casimir Forces ◽  
Distance Curve ◽  
Transfer Distance ◽  
Atomic Force ◽  
Order Of Magnitude

Thermal radiative transfer between objects as well as near-field forces such as van der Waals or Casimir forces have their origins in the fluctuations of the electrodynamic field. Near-field radiative transfer between two objects can be enhanced by a few order of magnitude compared to the far-field radiative transfer that can be described by Planck’s theory of blackbody radiation and Kirchoff’s laws. Despite this common origin, experimental techniques of measuring near-field forces (using the surface force apparatus and the atomic force microscope) are more sophisticated than techniques of measuring near-field radiative transfer. In this work, we present an ultra-sensitive experimental technique of measuring near-field using a bi-material atomic force microscope cantilever as the thermal sensor. Just as measurements of near-field forces results in a “force distance curve”, measurement of near-field radiative transfer results in a “heat transfer-distance” curve. Results from the measurement of near-field radiative transfer will be presented.

Microscopic studies of fast phase transformations in GeSbTe films

2001 ◽  
Vol 674 ◽  
Author(s):  
Ralf Detemple ◽  
Inés Friedrich ◽  
Walter Njoroge ◽  
Ingo Thomas ◽  
Volker Weidenhof ◽  
...  
Keyword(s):  
Phase Transformation ◽  
Data Transfer ◽  
Optical Measurements ◽  
Transfer Rates ◽  
Force Microscopy ◽  
High Data ◽  
Atomic Force ◽  
Transmission Electron ◽  
Future Success ◽  
Microscopic Studies

ABSTRACTVital requirements for the future success of phase change media are high data transfer rates, i.e. fast processes to read, write and erase bits of information. The understanding and optimization of fast transformations is a considerable challenge since the processes only occur on a submicrometer length scale in actual bits. Hence both high temporal and spatial resolution is needed to unravel the essential details of the phase transformation. We employ a combination of fast optical measurements with microscopic analyses using atomic force microscopy (AFM) and transmission electron microscopy (TEM). The AFM measurements exploit the fact that the phase transformation from amorphous to crystalline is accompanied by a 6% volume reduction. This enables a measurement of the vertical and lateral speed of the phase transformation. Several examples will be presented showing the information gained by this combination of techniques.

scholarly journals Opto-mechanical probe for combining atomic force microscopy and optical near-field surface analysis

2014 ◽  
Vol 39 (16) ◽  
pp. 4800 ◽  
Author(s):  
C. H. van Hoorn ◽  
D. C. Chavan ◽  
B. Tiribilli ◽  
G. Margheri ◽  
A. J. G. Mank ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Surface Analysis ◽  
Near Field ◽  
Force Microscopy ◽  
Atomic Force ◽  
Mechanical Probe

In Situ Atomic Force Microscopic Studies of Single Tin Nanoparticle: Sodiation and Desodiation in Liquid Electrolyte

2017 ◽  
Vol 9 (34) ◽  
pp. 28620-28626 ◽  
Author(s):  
Mo Han ◽  
Chenbo Zhu ◽  
Qing Zhao ◽  
Chengcheng Chen ◽  
Zhanliang Tao ◽  
...  
Keyword(s):  
Liquid Electrolyte ◽  
Atomic Force ◽  
Microscopic Studies

Nano-scale imaging of chromosomes and DNA by scanning near-field optical/atomic force microscopy

2003 ◽  
Vol 97 (1-4) ◽  
pp. 81-87 ◽  
Author(s):  
Tomoyuki Yoshino ◽  
Shigeru Sugiyama ◽  
Shoji Hagiwara ◽  
Daisuke Fukushi ◽  
Motoharu Shichiri ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Near Field ◽  
Force Microscopy ◽  
Nano Scale ◽  
Atomic Force
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