Detailed Structure of Hairy Mixed Micelles Formed by Phosphatidylcholine and PEGylated Phospholipids in Aqueous Media

Langmuir ◽  
2005 ◽  
Vol 21 (8) ◽  
pp. 3279-3290 ◽  
Author(s):  
Lise Arleth ◽  
Beena Ashok ◽  
Hayat Onyuksel ◽  
Pappannan Thiyagarajan ◽  
Jaby Jacob ◽  
...  
2001 ◽  
Vol 4 (4) ◽  
pp. 359-365 ◽  
Author(s):  
Hetal Gandhi ◽  
Snehal Modi ◽  
Nirmesh Jain ◽  
Pratap Bahadur

1999 ◽  
Vol 2 (2) ◽  
pp. 213-221 ◽  
Author(s):  
Sambhav Vora ◽  
Alex George ◽  
Hemangi Desai ◽  
Pratap Bahadur

1998 ◽  
Vol 1 (4) ◽  
pp. 507-514 ◽  
Author(s):  
Alex George ◽  
Sambhav Vora ◽  
Arti Dogra ◽  
Hemangi Desai ◽  
Pratap Bahadur

Langmuir ◽  
2004 ◽  
Vol 20 (14) ◽  
pp. 5745-5752 ◽  
Author(s):  
Alfredo Lainez ◽  
Patricia del Burgo ◽  
Elena Junquera ◽  
Emilio Aicart

Author(s):  
Patrick Echlin

A number of papers have appeared recently which purport to have carried out x-ray microanalysis on fully frozen hydrated samples. It is important to establish reliable criteria to be certain that a sample is in a fully hydrated state. The morphological appearance of the sample is an obvious parameter because fully hydrated samples lack the detailed structure seen in their freeze dried counterparts. The electron scattering by ice within a frozen-hydrated section and from the surface of a frozen-hydrated fracture face obscures cellular detail. (Fig. 1G and 1H.) However, the morphological appearance alone can be quite deceptive for as Figures 1E and 1F show, parts of frozen-dried samples may also have the poor morphology normally associated with fully hydrated samples. It is only when one examines the x-ray spectra that an assurance can be given that the sample is fully hydrated.


Author(s):  
H. Takaoka ◽  
M. Tomita ◽  
T. Hayashi

High resolution transmission electron microscopy (HRTEM) is the effective technique for characterization of detailed structure of semiconductor materials. Oxygen is one of the important impurities in semiconductors. Detailed structure of highly oxygen doped silicon has not clearly investigated yet. This report describes detailed structure of highly oxygen doped silicon observed by HRTEM. Both samples prepared by Molecular beam epitaxy (MBE) and ion implantation were observed to investigate effects of oxygen concentration and doping methods to the crystal structure.The observed oxygen doped samples were prepared by MBE method in oxygen environment on (111) substrates. Oxygen concentration was about 1021 atoms/cm3. Another sample was silicon of (100) orientation implanted with oxygen ions at an energy of 180 keV. Oxygen concentration of this sample was about 1020 atoms/cm3 Cross-sectional specimens of (011) orientation were prepared by argon ion thinning and were observed by TEM at an accelerating voltage of 400 kV.


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