Methods for Generating Protein Molecular Ions in ToF-SIMS

Langmuir ◽  
2004 ◽  
Vol 20 (9) ◽  
pp. 3704-3709 ◽  
Author(s):  
Sally L. McArthur ◽  
Marie C. Vendettuoli ◽  
Buddy D. Ratner ◽  
David G. Castner
Keyword(s):  
Molecular Ions ◽  
Tof Sims

Cell and Tissue Imaging by TOF-SIMS and MALDI-TOF: An Overview for Biological and Pharmaceutical Analysis

2021 ◽  
pp. 1-26
Author(s):  
Manale Noun ◽  
Rayane Akoumeh ◽  
Imane Abbas
Keyword(s):  
Mass Spectrometry ◽  
Spatial Distribution ◽  
Time Of Flight ◽  
Molecular Ions ◽  
Tissue Imaging ◽  
Diagnostic Tools ◽  
Good Precision ◽  
Maldi Tof ◽  
Tof Sims ◽  
Wide Range

Abstract The potential of mass spectrometry imaging (MSI) has been demonstrated in cell and tissue research since 1970. MSI can reveal the spatial distribution of a wide range of atomic and molecular ions detected from biological sample surfaces, it is a powerful and valuable technique used to monitor and detect diverse chemical and biological compounds, such as drugs, lipids, proteins, and DNA. MSI techniques, notably matrix-assisted laser desorption/ionization time of flight (MALDI-TOF) and time of flight secondary ion mass spectrometry (TOF-SIMS), witnessed a dramatic upsurge in studying and investigating biological samples especially, cells and tissue sections. This advancement is attributed to the submicron lateral resolution, the high sensitivity, the good precision, and the accurate chemical specificity, which make these techniques suitable for decoding and understanding complex mechanisms of certain diseases, as well as monitoring the spatial distribution of specific elements, and compounds. While the application of both techniques for the analysis of cells and tissues is thoroughly discussed, a briefing of MALDI-TOF and TOF-SIMS basis and the adequate sampling before analysis are briefly covered. The importance of MALDI-TOF and TOF-SIMS as diagnostic tools and robust analytical techniques in the medicinal, pharmaceutical, and toxicology fields is highlighted through representative published studies.

Molecular surface analysis by TOF-SIMS

1992 ◽  
Vol 50 (2) ◽  
pp. 1556-1557
Author(s):  
Robert W. Odom
Keyword(s):  
Mass Spectrometry ◽  
Surface Analysis ◽  
Secondary Ion Mass Spectrometry ◽  
Molecular Ions ◽  
Molecular Surface ◽  
Tof Sims ◽  
Ion Mass Spectrometry ◽  
Static Conditions ◽  
Primary Ions ◽  
Secondary Ion

Time-of-flight secondary ion mass spectrometry (TOF-SIMS) performs surface sensitive analysis of the elemental and molecular composition of solids. TOFSIMS is a relatively new embodiment of static secondary ion mass spectrometry (SSIMS) in which the dose of primary ions incident on the surface is typically less than 1012 ions/cm2. Since typical solid surfaces have an atomic density of 1015 atoms/cm2, this primary ion dose nominally removes less than 0.1% of a monolayer. Hence, SIMS analyses performed under these static conditions represent near surface analysis in which secondary ions are produced from the top few monolayers of the surface. The actual sampling depth is determined by the primary ion momentum, angle of incidence and chemistry of the surface. Since low dose primary ions cause minimal perturbation of the chemistry of the solid surface, SSIMS analyses often produce molecular or pseudo-molecular ions characteristic of the chemical composition of the surface. Thus, molecular ions or structurally significant fragment ions are often observed in SSIMS analyses of surfaces containing inorganic and organic residues, polymers surfaces, coatings, and biological materials such as tissues and membranes.

Carbon Black Surface Characterization by TOF-SIMS and XPS

1999 ◽  
Vol 72 (2) ◽  
pp. 384-397 ◽  
Author(s):  
P. Bertrand ◽  
L. T. Weng
Keyword(s):  
Carbon Black ◽  
Functional Groups ◽  
Surface Characterization ◽  
Secondary Ion Mass Spectrometry ◽  
Structural Information ◽  
Chemical Shifts ◽  
Molecular Ions ◽  
Chemical Information ◽  
Trace Detection ◽  
Tof Sims

Abstract The functional groups present at the carbon black (CB) surface contribute, along with the surface microstructure, to the CB surface activity which is known to be an important parameter for the rubber reinforcing properties. A direct detection of the foreign elements (H, N, O, S, Cl, …) present at the CB surface can be achieved with surface analytical techniques such as Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS) and X-ray Photoelectron Spectoscopy (XPS). The combination of these two techniques is found to be very fruitful. Indeed, although the TOF-SIMS sensitivity is much higher than for XPS, allowing trace detection, this technique suffers from a lack of quantification which can be fulfilled by XPS. The chemical information on the functional groups obtained by both methods is complementary. In XPS, this information is deduced from the electron core level chemical shifts which are mainly influenced by the first neighboring atoms; whereas, in TOF-SIMS, the full molecular environment can be detected. Not only information on the surface groups, but also some structural information can be obtained. Indeed, the TOF-SIMS spectra of carbon black exhibit molecular ions which are characteristic of the surface aromaticity (graphene structure) and also specific clusters at high masses which seem to be related to the basic building block of carbon black particles.

Mass scale calibration of TOF-SIMS spectra with molecular ions of internal additives

2016 ◽  
Vol 48 (11) ◽  
pp. 1185-1189
Author(s):  
Daisuke Kobayashi ◽  
Satoka Aoyagi ◽  
Shinya Otomo ◽  
Hiroto Itoh
Keyword(s):  
Mass Scale ◽  
Molecular Ions ◽  
Tof Sims ◽  
Scale Calibration

ToF-SIMS characterization of molecular ions from Fomblin Z-DOL on Ag substrates

2003 ◽  
Vol 203-204 ◽  
pp. 175-179
Author(s):  
Yoshimi Abe ◽  
Hidekazu Okuhira
Keyword(s):  
Molecular Ions ◽  
Tof Sims ◽  
Fomblin Z

scholarly journals Subcellular localisation of cholesterol and phosphocholine with pattern-recognition-imaging-TOF-SIMS

2004 ◽  
Vol 18 (4) ◽  
pp. 503-511 ◽  
Author(s):  
Per Malmberg ◽  
Håkan Nygren ◽  
Peter Sjövall ◽  
Jukka Lausmaa
Keyword(s):  
Pattern Recognition ◽  
Membrane Lipids ◽  
Molecular Ions ◽  
Mass Resolution ◽  
High Mass ◽  
Subcellular Localisation ◽  
Silver Foil ◽  
Tof Sims ◽  
High Mass Resolution ◽  
Recognition Imaging

Molecular ions of cholesterol, and its fragments, and phosphocholine fragments of phospholipids, were localized in single cells with a resolution of <1μm. This is the first example of subcellular localisation of membrane lipids with pattern-recognition, imaging time-of-flight secondary ion mass spectrometry (PRITS) here utilized for identification and subcellular localisation of cholesterol and phosphocholine in PMN leukocytes. Cell imprints were produced by transferring the cell constituents of freeze-dried cells to a silver foil, and the silver surface was analyzed by TOF-SIMS. TOF-SIMS spectra were recorded by scanning the primary ion beam over the analysis area and acquiring a positive mass spectrum of the ions leaving the surface. Data were collected at either high mass resolutionm/Δm >7000 or high lateral resolution. High mass resolution spectra were recorded on reference samples of pure cholesterol and phosphatidylcholine. Characteristic fragment peaks and the silver cationised quasimolecular ion [M+Ag]+were selected as a pattern for the identification of the lipids in TOF-SIMS images of surface-adhering leukocytes. The localisation of membrane lipids showed lateral heterogeneity over the cell surface.

scholarly journals Chemical Separation on Silver Nanorods Surface Monitored by TOF-SIMS

2017 ◽  
Vol 2017 ◽  
pp. 1-6
Author(s):  
Ondrej Petruš ◽  
Andrej Oriňak ◽  
Renáta Oriňaková ◽  
Christian Muhmann ◽  
Ján Macko ◽  
...  
Keyword(s):  
Secondary Ion Mass Spectrometry ◽  
Rhodamine 6G ◽  
Chemical Separation ◽  
Molecular Ions ◽  
Chemical Components ◽  
Sampling Point ◽  
Self Assembled Monolayer ◽  
Component Mixture ◽  
Silver Nanorods ◽  
Tof Sims

The article introduces a possible chemical separation of a mixture of two compounds on the metal nanorods surface. A silver nanorods surface has been prepared by controlled electrochemical deposition in anodic alumina oxide (AAO) template. Rhodamine 6G and 4-aminothiophenol have been directly applied to the sampling point on a silver nanorods surface in an aliquot mixture. The position of the resolved compounds was analysed by time-of-flight secondary ion mass spectrometry (TOF-SIMS) which measured the fragments and the molecular ions of the two compounds separated on the silver nanorods surface. Rhodamine 6G has been preconcentrated as 1.5 mm radial from the sampling point while 4-aminothiophenol formed a continuous self-assembled monolayer on the silver nanorods surface with a maximum molecular ion intensity at a distance of 0.5 mm from the sampling point. The separation of the single chemical components from the two-component mixture over the examined silver nanostructured films could clearly be shown. A fast separation on the mentioned nanotextured films was observed (within 50 s). This procedure can be easily integrated into the micro/nanofluidic systems or chips and different detection systems can be applied.

Applications of Time-OF-Flight Secondary Ion Mass Spectrometry (TOF-SIMS)

1990 ◽  
Vol 48 (2) ◽  
pp. 308-309
Author(s):  
Bruno Schueler ◽  
Robert W. Odom
Keyword(s):  
Mass Spectrometry ◽  
Secondary Ion Mass Spectrometry ◽  
Structural Information ◽  
Time Of Flight ◽  
Biological Tissues ◽  
Polymer Surfaces ◽  
Tof Sims ◽  
Secondary Ions ◽  
Ion Mass Spectrometry ◽  
Secondary Ion

Time-of-flight secondary ion mass spectrometry (TOF-SIMS) provides unique capabilities for elemental and molecular compositional analysis of a wide variety of surfaces. This relatively new technique is finding increasing applications in analyses concerned with determining the chemical composition of various polymer surfaces, identifying the composition of organic and inorganic residues on surfaces and the localization of molecular or structurally significant secondary ions signals from biological tissues. TOF-SIMS analyses are typically performed under low primary ion dose (static SIMS) conditions and hence the secondary ions formed often contain significant structural information.This paper will present an overview of current TOF-SIMS instrumentation with particular emphasis on the stigmatic imaging ion microscope developed in the authors’ laboratory. This discussion will be followed by a presentation of several useful applications of the technique for the characterization of polymer surfaces and biological tissues specimens. Particular attention in these applications will focus on how the analytical problem impacts the performance requirements of the mass spectrometer and vice-versa.

Radiation less transitions in gas phase molecular ions

1980 ◽  
Vol 77 ◽  
pp. 705-718 ◽  
Author(s):  
Sydney Leach ◽  
Gérald Dujardin ◽  
Guy Taieb
Keyword(s):  
Gas Phase ◽  
Molecular Ions
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