Quantitative Characterization of DNA Films by X-ray Photoelectron Spectroscopy
Keyword(s):
A quantitative characterization of tellurium suboxide thin films by x‐ray photoelectron spectroscopy
1988 ◽
Vol 6
(3)
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pp. 1859-1861
2009 ◽
Vol 54
(16)
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pp. 4025-4030
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Keyword(s):
2013 ◽
Vol 52
(2R)
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pp. 021101
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Keyword(s):
2014 ◽
Vol 34
(3)
◽
pp. 841-849
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2003 ◽
Vol 18
(5)
◽
pp. 1123-1130
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1986 ◽
Vol 4
(3)
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pp. 1580-1584
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2011 ◽
Vol 415-417
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pp. 642-647