X-ray, Micro-Raman, and Infrared Spectroscopy Structural Characterization of Self-Assembled Multilayer Silane Films with Variable Numbers of Stacked Layers

Langmuir ◽  
2002 ◽  
Vol 18 (10) ◽  
pp. 3916-3922 ◽  
Author(s):  
A. Baptiste ◽  
A. Gibaud ◽  
J. F. Bardeau ◽  
K. Wen ◽  
R. Maoz ◽  
...  
Keyword(s):  
Infrared Spectroscopy ◽  
Structural Characterization ◽  
X Ray ◽  
Raman And Infrared Spectroscopy ◽  
Self Assembled

scholarly journals Structural characterization of self-assembled quantum dot structures by X-ray diffraction techniques

1997 ◽  
Vol 306 (2) ◽  
pp. 198-204 ◽  
Author(s):  
A.A. Darhuber ◽  
J. Stangl ◽  
V. Holy ◽  
G. Bauer ◽  
A. Krost ◽  
...  
Keyword(s):  
Quantum Dot ◽  
Structural Characterization ◽  
X Ray Diffraction ◽  
X Ray ◽  
Self Assembled

Structural characterization of self-assembled semiconductor islands by three-dimensional X-ray diffraction mapping in reciprocal space

2008 ◽  
Vol 516 (22) ◽  
pp. 8022-8028 ◽  
Author(s):  
V. Holý ◽  
K. Mundboth ◽  
C. Mokuta ◽  
T.H. Metzger ◽  
J. Stangl ◽  
...  
Keyword(s):  
Structural Characterization ◽  
Three Dimensional ◽  
Reciprocal Space ◽  
X Ray Diffraction ◽  
X Ray ◽  
Self Assembled

Synthesis and structural characterization of two copper(II) complexes with 3-(4-(1H-benzo[d]imidazol-1-yl)-4-methoxyphenyl)-1-phenylprop- 2-en-1-one ligands

2015 ◽  
Vol 70 (3) ◽  
pp. 165-169 ◽  
Author(s):  
Gao-Feng Wang
Keyword(s):  
Infrared Spectroscopy ◽  
Single Crystal ◽  
Structural Characterization ◽  
X Ray Diffraction ◽  
Distorted Octahedral Environment ◽  
X Ray ◽  
Octahedral Environment ◽  
Distorted Octahedral ◽  
Elemental Analyses

AbstractThe synthesis of two new copper(II) complexes with benzimidazole type ligands, Cu(tta)2(L1)2 (1) and Cu(tta)2(L1) (2) (where L1 is 3-(4-(1H-benzo[d]imidazol-1-yl)-4-methoxy phenyl)-1-phenylprop-2-en-1-one; tta is 2-thenoyltrifluoroacetonate), are reported. Their structures have been characterized by infrared spectroscopy, elemental analyses and single-crystal X-ray diffraction. The copper(II) ion of 1 is in a distorted octahedral environment, while that of 2 is in a distorted square-pyramidal environment. In both cases, the donor atoms are provided by oxygen atoms of the tta ligands and nitrogen atoms of the L1 ligands.

scholarly journals Complementarity of Raman and Infrared Spectroscopy for Structural Characterization of Plant Epicuticular Waxes

ACS Omega ◽  
2019 ◽  
Vol 4 (2) ◽  
pp. 3700-3707 ◽  
Author(s):  
Charles Farber ◽  
Jingbai Li ◽  
Elizabeth Hager ◽  
Robert Chemelewski ◽  
John Mullet ◽  
...  
Keyword(s):  
Infrared Spectroscopy ◽  
Structural Characterization ◽  
Epicuticular Waxes ◽  
Raman And Infrared Spectroscopy

Synthesis and structural characterization of a Ni(II) coordination polymer with a tripodal 4-imidazolyl-functional ligand

2019 ◽  
Vol 74 (11-12) ◽  
pp. 857-860
Author(s):  
Hai-Wei Kuai ◽  
Xiao-Hong Zhu ◽  
Ding-Yun Jiang ◽  
Xiao-Chun Cheng ◽  
Deng-Hao Li
Keyword(s):  
Infrared Spectroscopy ◽  
Coordination Polymer ◽  
Single Crystal ◽  
Network Structure ◽  
Structural Characterization ◽  
Monoclinic Space Group ◽  
X Ray Diffraction ◽  
Hydrothermal Conditions ◽  
X Ray

Abstract1,3,5-Tri(1H-imidazol-4-yl)benzene (H3L) reacts with Ni(ClO4)2 · 6H2O under hydrothermal conditions at T = 100°C to yield a new complex: [Ni(H2L)2] · 5.5H2O (1). The product is characterized by single crystal and powder X-ray diffraction, infrared spectroscopy, and elemental and thermogravimetric analyses. Complex 1 crystallizes in the monoclinic space group C2/c and exhibits a binodal (3,6)-connected 2D kgd network structure with (43)2(46.66.83) topology.

Expert System for Structural Characterization of Phyllosilicates: I. Description of the Expert System

Clay Minerals ◽  
1994 ◽  
Vol 29 (1) ◽  
pp. 33-38 ◽  
Author(s):  
A. Plançon ◽  
V. A. Drits
Keyword(s):  
Infrared Spectroscopy ◽  
Expert System ◽  
Mixed Layer ◽  
Structural Characterization ◽  
Stacking Faults ◽  
X Ray Diffraction ◽  
Application Field ◽  
X Ray ◽  
Human Expert

AbstractAn expert system has been designed for the structural characterization of disordered phyllosilicates as well as the mixed-layer minerals and the minerals containing stacking faults or isomorphic substitutions. X-ray diffraction being the simplest tool for structural characterization, the expert system uses such data but can account for data provided by any characterization technique (infrared spectroscopy, EXAFS, etc.). The expert system aims to summarize in a unique set the different approaches of the structural characterization using diagrams or tables which have been proposed, avoiding the requirement of the knowledge of their application field and excluding calculations. It runs in an interactive way, to mimic the way a human expert would draw its conclusions.

Structural characterization of self-assembled Ge dot multilayers by X-ray diffraction and reflectivity methods

1998 ◽  
Vol 2 (1-4) ◽  
pp. 789-793 ◽  
Author(s):  
A.A Darhuber ◽  
V Holy ◽  
P Schittenhelm ◽  
J Stangl ◽  
I Kegel ◽  
...  
Keyword(s):  
Structural Characterization ◽  
X Ray Diffraction ◽  
X Ray ◽  
Self Assembled
Sign in / Sign up

Export Citation Format

Share Document