Surface Transitions by Shear Modulation Force Microscopy

Langmuir ◽  
2001 ◽  
Vol 17 (19) ◽  
pp. 5865-5871 ◽  
Author(s):  
Y. Pu ◽  
Shouren Ge ◽  
M. Rafailovich ◽  
J. Sokolov ◽  
Y. Duan ◽  
...  
Keyword(s):  
Force Microscopy ◽  
Shear Modulation

Shear Modulation Force Microscopy Study of Near Surface Glass Transition Temperatures

2000 ◽  
Vol 85 (11) ◽  
pp. 2340-2343 ◽  
Author(s):  
S. Ge ◽  
Y. Pu ◽  
W. Zhang ◽  
M. Rafailovich ◽  
J. Sokolov ◽  
...  
Keyword(s):  
Glass Transition ◽  
Microscopy Study ◽  
Transition Temperatures ◽  
Near Surface ◽  
Glass Transition Temperatures ◽  
Force Microscopy ◽  
Surface Glass ◽  
Shear Modulation

Shear Modulation Force Microscopy Studies on Cross-linked Elastomer Thin Films

2000 ◽  
Vol 649 ◽  
Author(s):  
Y. Zhang ◽  
S. Ge ◽  
M.H. Rafailovich ◽  
J.C. Sokolov ◽  
D.G. Peiffer ◽  
...  
Keyword(s):  
Thin Films ◽  
Cross Link ◽  
Bulk Materials ◽  
Shear Moduli ◽  
Force Microscopy ◽  
Atomic Force ◽  
Link Density ◽  
Cross Link Density ◽  
The Cross ◽  
Shear Modulation

ABSTRACTThe atomic force microscope in the shear force modulation microscopy (SMFM) mode has been used to characterize the surface modulus and cross-link density of elastomer thin films, where standard rheological methods cannot be applied. Brominated poly(isobutylene-co-4-methylstyrene) (BIMS) is a synthetic terpolymer which can be stoichiometrically cross-linked by N, N'-dicinnamylidene-1,6-hexanediamine. The results on several types of BIMS elastomers with different bromide content are reported. The cross-linking reaction at the surface is found to be significantly faster than that of bulk. The estimated shear moduli of the thin films were found to be proportional to the cross-link density, as expected from the rubber elasticity theory for bulk materials.

Surface characterization of cross-linked elastomers by shear modulation force microscopy

Polymer ◽  
2003 ◽  
Vol 44 (11) ◽  
pp. 3327-3332 ◽  
Author(s):  
Y. Zhang ◽  
S. Ge ◽  
M.H. Rafailovich ◽  
J.C. Sokolov ◽  
R.H. Colby
Keyword(s):  
Surface Characterization ◽  
Force Microscopy ◽  
Shear Modulation

Biomimetic Mineralization and Shear Modulation Force Microscopy of Self-Assembled Protein Fibers

2008 ◽  
pp. 119-133 ◽  
Author(s):  
Elaine Dimasi ◽  
Seo-Young Kwak ◽  
Nadine Pernodet ◽  
Xiaolan Ba ◽  
Yizhi Meng ◽  
...  
Keyword(s):  
Biomimetic Mineralization ◽  
Force Microscopy ◽  
Protein Fibers ◽  
Self Assembled ◽  
Shear Modulation

Cryogenic atomic force microscopy

1991 ◽  
Vol 49 ◽  
pp. 54-55
Author(s):  
K. A. Fisher ◽  
M. G. L. Gustafsson ◽  
M. B. Shattuck ◽  
J. Clarke
Keyword(s):  
Room Temperature ◽  
Rapid Freezing ◽  
Cryogenic Temperatures ◽  
Soft Or ◽  
Electrically Conductive ◽  
Force Microscopy ◽  
Flexible Molecules ◽  
Advantages And Disadvantages ◽  
Atomic Force ◽  
Chemical Perturbation

The atomic force microscope (AFM) is capable of imaging electrically conductive and non-conductive surfaces at atomic resolution. When used to image biological samples, however, lateral resolution is often limited to nanometer levels, due primarily to AFM tip/sample interactions. Several approaches to immobilize and stabilize soft or flexible molecules for AFM have been examined, notably, tethering coating, and freezing. Although each approach has its advantages and disadvantages, rapid freezing techniques have the special advantage of avoiding chemical perturbation, and minimizing physical disruption of the sample. Scanning with an AFM at cryogenic temperatures has the potential to image frozen biomolecules at high resolution. We have constructed a force microscope capable of operating immersed in liquid n-pentane and have tested its performance at room temperature with carbon and metal-coated samples, and at 143° K with uncoated ferritin and purple membrane (PM).

AFM study of the dynamics of α-alumina surface faceting during high-temperature processing

1995 ◽  
Vol 53 ◽  
pp. 334-335 ◽  
Author(s):  
Michael W. Bench ◽  
Jason R. Heffelfinger ◽  
C. Barry Carter
Keyword(s):  
High Temperature ◽  
Thin Foil ◽  
Sem Analysis ◽  
Conductive Coatings ◽  
Force Microscopy ◽  
Minimal Sample ◽  
Atomic Force ◽  
Formation And Evolution ◽  
High Temperature Processing ◽  
Nominal Surface

To gain a better understanding of the surface faceting that occurs in α-alumina during high temperature processing, atomic force microscopy (AFM) studies have been performed to follow the formation and evolution of the facets. AFM was chosen because it allows for analysis of topographical details down to the atomic level with minimal sample preparation. This is in contrast to SEM analysis, which typically requires the application of conductive coatings that can alter the surface between subsequent heat treatments. Similar experiments have been performed in the TEM; however, due to thin foil and hole edge effects the results may not be representative of the behavior of bulk surfaces.The AFM studies were performed on a Digital Instruments Nanoscope III using microfabricated Si3N4 cantilevers. All images were recorded in air with a nominal applied force of 10-15 nN. The alumina samples were prepared from pre-polished single crystals with (0001), , and nominal surface orientations.

Attractive mode force microscopy of chiral liquid crystal surfaces

1992 ◽  
Vol 50 (1) ◽  
pp. 268-269
Author(s):  
B.D. Terris ◽  
R. J. Twieg ◽  
C. Nguyen ◽  
G. Sigaud ◽  
H. T. Nguyen
Keyword(s):  
Liquid Crystal ◽  
Crystal Surfaces ◽  
Free Surfaces ◽  
Control Range ◽  
Force Microscopy ◽  
Liquid Crystal Films ◽  
Chiral Liquid Crystal ◽  
Crystal Films ◽  
Electrostatic Charging ◽  
And Shifts

We have used a force microscope in the attractive, or noncontact, mode to image a variety of surfaces. In this mode, the microscope tip is oscillated near its resonant frequency and shifts in this frequency due to changes in the surface-tip force gradient are detected. We have used this technique in a variety of applications to polymers, including electrostatic charging, phase separation of ionomer surfaces, and crazing of glassy films.Most recently, we have applied the force microscope to imaging the free surfaces of chiral liquid crystal films. The compounds used (Table 1) have been chosen for their polymorphic variety of fluid mesophases, all of which exist within the temperature control range of our force microscope.

Scanning tunneling microscopy and atomic force microscopy: New tools for biology

1989 ◽  
Vol 47 ◽  
pp. 778-779
Author(s):  
CE Bracker ◽  
P. K. Hansma
Keyword(s):  
Physical Property ◽  
Scanning Probe ◽  
Scanning Tunneling ◽  
Small Scale ◽  
Tunneling Microscopy ◽  
Force Microscopy ◽  
New Family ◽  
Small Probe ◽  
Atomic Force ◽  
Transmission Electron

A new family of scanning probe microscopes has emerged that is opening new horizons for investigating the fine structure of matter. The earliest and best known of these instruments is the scanning tunneling microscope (STM). First published in 1982, the STM earned the 1986 Nobel Prize in Physics for two of its inventors, G. Binnig and H. Rohrer. They shared the prize with E. Ruska for his work that had led to the development of the transmission electron microscope half a century earlier. It seems appropriate that the award embodied this particular blend of the old and the new because it demonstrated to the world a long overdue respect for the enormous contributions electron microscopy has made to the understanding of matter, and at the same time it signalled the dawn of a new age in microscopy. What we are seeing is a revolution in microscopy and a redefinition of the concept of a microscope.Several kinds of scanning probe microscopes now exist, and the number is increasing. What they share in common is a small probe that is scanned over the surface of a specimen and measures a physical property on a very small scale, at or near the surface. Scanning probes can measure temperature, magnetic fields, tunneling currents, voltage, force, and ion currents, among others.

Scanned tip measurement of deep vertical facets on a flat surface: Measuring roughness on gaas laser waveguide mirrors

1993 ◽  
Vol 51 ◽  
pp. 532-533
Author(s):  
Chang Shen ◽  
Phil Fraundorf ◽  
Robert W. Harrick
Keyword(s):  
Integrated Circuits ◽  
Flat Surface ◽  
Scanning Force Microscopy ◽  
Scanning Tunneling ◽  
Tunneling Microscopy ◽  
Force Microscopy ◽  
Optoelectronic Integrated Circuits ◽  
Laser Waveguide ◽  
Scanning Force ◽  
Gaas Laser

Monolithic integration of optoelectronic integrated circuits (OEIC) requires high quantity etched laser facets which prevent the developing of more-highly-integrated OEIC's. The causes of facet roughness are not well understood, and improvement of facet quality is hampered by the difficulty in measuring the surface roughness. There are several approaches to examining facet roughness qualitatively, such as scanning force microscopy (SFM), scanning tunneling microscopy (STM) and scanning electron microscopy (SEM). The challenge here is to allow more straightforward monitoring of deep vertical etched facets, without the need to cleave out test samples. In this presentation, we show air based STM and SFM images of vertical dry-etched laser facets, and discuss the image acquisition and roughness measurement processes. Our technique does not require precision cleaving. We use a traditional tip instead of the T shape tip used elsewhere to preventing “shower curtain” profiling of the sidewall. We tilt the sample about 30 to 50 degrees to avoid the curtain effect.

Sign in / Sign up

Export Citation Format

Share Document