Nanomechanical Properties of Polysiloxane−Oxide Interphases Measured by Interfacial Force Microscopy

Langmuir ◽  
2001 ◽  
Vol 17 (7) ◽  
pp. 2160-2166 ◽  
Author(s):  
H. Cabibil ◽  
H. Celio ◽  
J. Lozano ◽  
J. M. White ◽  
R. Winter
Keyword(s):  
Force Microscopy ◽  
Nanomechanical Properties ◽  
Interfacial Force Microscopy ◽  
Interfacial Force

scholarly journals Adhesion and Nanomechanical Studies by Interfacial Force Microscopy

1997 ◽  
Vol 3 (S2) ◽  
pp. 1277-1278
Author(s):  
J. E. Houston
Keyword(s):  
Adhesive Bond ◽  
Force Sensor ◽  
Crystal Surfaces ◽  
Single Crystal Surfaces ◽  
Force Microscopy ◽  
Interfacial Force Microscopy ◽  
Self Assembling ◽  
Morphological Defects ◽  
Scanning Force ◽  
Interfacial Force

Scanning probe techniques have shown dramatic growth recently and are presently making significant impact on surface and interfacial problems in material science. The Interfacial Force Microscopy (IFM) differs from other scanning force-probe techniques by its use of a self-balancing, zero compliance force sensor. This allows carefully controlled and mechanically stable force vs. interfacial separation measurements to be obtained which yield unique and valuable information concerning the interfacial adhesive bond and its failure, as well as enabling the study of the mechanical properties of materials, both on the nanometer scale. I will demonstrate the enhanced capabilities of the IFM by presenting two examples involving: 1) the bonding interaction between chemically distinct end groups on self assembling molecules adsorbed on both the sample and probe tip and 2) a study of the effect of morphological defects on the nanomechanical properties of Au(l 11) single-crystal surfacesInterfacial adhesion is of extraordinary technological importance and has long been of intense scientific interest.

Chemically-sensitive interfacial force microscopy: Contact potential measurements of self-assembling monolayer films

1994 ◽  
Vol 98 (17) ◽  
pp. 4493-4494 ◽  
Author(s):  
R. C. Thomas ◽  
P. Tangyunyong ◽  
J. E. Houston ◽  
T. A. Michalske ◽  
R. M. Crooks
Keyword(s):  
Monolayer Films ◽  
Contact Potential ◽  
Force Microscopy ◽  
Interfacial Force Microscopy ◽  
Self Assembling ◽  
Interfacial Force

Surface derivatization of nanoscale tungsten probes for interfacial force microscopy

1999 ◽  
Vol 17 (4) ◽  
pp. 2240-2245 ◽  
Author(s):  
J. F. Graham ◽  
K. Griffiths ◽  
M. Kovar ◽  
P. R. Norton ◽  
F. Ogini ◽  
...  
Keyword(s):  
Force Microscopy ◽  
Interfacial Force Microscopy ◽  
Interfacial Force

Interfacial Force Microscopy and its Application in Metal Matrix Composites

2001 ◽  
Vol 697 ◽  
Author(s):  
Berthold E. Liebig ◽  
Athanasios Chantis ◽  
Craig E. Steffan ◽  
Jan A. Puszynski ◽  
Robb M. Winter
Keyword(s):  
Mechanical Properties ◽  
Metal Matrix Composites ◽  
Contact Mechanics ◽  
Metal Matrix ◽  
Hertzian Contact ◽  
Matrix Composites ◽  
Depth Sensing ◽  
Force Microscopy ◽  
Interfacial Force Microscopy ◽  
Interfacial Force

AbstractMetal matrix composites (MMCs) combine the properties of metal and ceramic or intermetallic materials. Common examples of metal matrix composites are Cu-Al2O3, SiCw-Al, Al-Al2O3, Al-B4C, and Ni-NiAl3. Mechanical or thermal properties, such as strain-stress behavior, or thermal expansion coefficient can be tailored by changing the content of the reinforcing phase. The most common techniques of measuring mechanical properties of composite materials rely on macroscopic approach. During the past fifteen years, a significant effort has been made to develop various techniques of measuring mechanical properties on a microscopic level. These techniques include atomic force microscope (AFM) and depth sensing indentation techniques, based on Hertzian contact mechanics. However, it is still a challenge to measure reliably and quantitatively the Young's modulus and Poisson's ratio of individual phases as well as properties at the interfaces. This presentation will focus on fundamental aspects of measuring of mechanical properties of metal matrix composites at nano-scale using Interfacial Force Microscopy (IFM). The IFM is a scanning probe microscope, which utilizes a unique self-balancing capacitance force sensor. Force-displacement curves obtained with the IFM are analyzed using Hertzian contact mechanics to extract the Young's moduli of the individual phases and interface region with high spatial resolution. The properties of Cu-Al2O3, Al-SiCp composites will be discussed in detail. Furthermore, a comparison of experimental data with mechanical properties calculated from first principles will be discussed.

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