Atomic Force Microscopy-Based Nanolithography on Silicon Using Colloidal Au Nanoparticles As a Nanooxidation Mask

Langmuir ◽  
2000 ◽  
Vol 16 (24) ◽  
pp. 9673-9676 ◽  
Author(s):  
Jiwen Zheng ◽  
Zhucheng Chen ◽  
Zhongfan Liu
Keyword(s):  
Atomic Force Microscopy ◽  
Au Nanoparticles ◽  
Force Microscopy ◽  
Atomic Force ◽  
Colloidal Au

scholarly journals Au Nanoparticles as Template for Defect Formation in Memristive SrTiO3 Thin Films

Nanomaterials ◽  
2018 ◽  
Vol 8 (11) ◽  
pp. 869 ◽  
Author(s):  
Nicolas Raab ◽  
Dirk Schmidt ◽  
Hongchu Du ◽  
Maximilian Kruth ◽  
Ulrich Simon ◽  
...  
Keyword(s):  
Thin Film ◽  
Thin Films ◽  
Atomic Force Microscopy ◽  
Au Nanoparticles ◽  
Defect Formation ◽  
Subsequent Growth ◽  
Force Microscopy ◽  
Atomic Force ◽  
Oxygen Exchange Reaction ◽  
Defect Nucleation

We investigated the possibility of tuning the local switching properties of memristive crystalline SrTiO 3 thin films by inserting nanoscale defect nucleation centers. For that purpose, we employed chemically-synthesized Au nanoparticles deposited on 0.5 wt%-Nb-doped SrTiO 3 single crystal substrates as a defect formation template for the subsequent growth of SrTiO 3 . We studied in detail the resulting microstructure and the local conducting and switching properties of the SrTiO 3 thin films. We revealed that the Au nanoparticles floated to the SrTiO 3 surface during growth, leaving behind a distorted thin film region in their vicinity. By employing conductive-tip atomic force microscopy, these distorted SrTiO 3 regions are identified as sites of preferential resistive switching. These findings can be attributed to the enhanced oxygen exchange reaction at the surface in these defective regions.

Measuring the Influence of Solution Chemistry on the Adhesion of Au Nanoparticles to Mica Using Colloid Probe Atomic Force Microscopy

Langmuir ◽  
2010 ◽  
Vol 26 (17) ◽  
pp. 13995-14003 ◽  
Author(s):  
Beng Joo Reginald Thio ◽  
Jung-Hyun Lee ◽  
J. Carson Meredith ◽  
Arturo A. Keller
Keyword(s):  
Atomic Force Microscopy ◽  
Au Nanoparticles ◽  
Solution Chemistry ◽  
Force Microscopy ◽  
Atomic Force

scholarly journals Conductive Atomic Force Microscopy Study of the Resistive Switching in Yttria-Stabilized Zirconia Films with Au Nanoparticles

Scanning ◽  
2018 ◽  
Vol 2018 ◽  
pp. 1-9 ◽  
Author(s):  
Dmitry Filatov ◽  
Inga Kazantseva ◽  
Dmitry Antonov ◽  
Ivan Antonov ◽  
Maria Shenina ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Resistive Switching ◽  
Au Nanoparticles ◽  
Film Surface ◽  
Yttria Stabilized Zirconia ◽  
Stabilized Zirconia ◽  
Conductive Atomic Force Microscopy ◽  
Au Nps ◽  
Force Microscopy ◽  
Atomic Force

We report on the investigation of the resistive switching (RS) in the ultrathin (≈5 nm in thickness) yttria-stabilized zirconia (YSZ) films with single layers of Au nanoparticles (NPs) by conductive atomic force microscopy (CAFM). Besides the butterfly-type hysteresis loops in the current-voltage (I-V) curves of the contact of the CAFM probe to the investigated film surface corresponding to the bipolar RS, the negative differential resistance (NDR) has been observed in the I-V curves of the AFM probe contact to the YSZ films with Au NPs in the conductive (“ON”) state. The NDR has been related to the resonant tunneling of electrons through the size-quantized energy states in the ultrafine (1 to 2 nm in diameter) Au NPs built in the conductive filaments in the YSZ films.

Lifting and Sorting of Charged Au Nanoparticles by Electrostatic Forces in Atomic Force Microscopy

Small ◽  
2010 ◽  
Vol 6 (19) ◽  
pp. 2105-2108 ◽  
Author(s):  
JiaPeng Xu ◽  
Kwang Joo Kwak ◽  
James L. Lee ◽  
Gunjan Agarwal
Keyword(s):  
Atomic Force Microscopy ◽  
Au Nanoparticles ◽  
Electrostatic Forces ◽  
Force Microscopy ◽  
Atomic Force
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