Human Plasma Fibrinogen Adsorption on Ultraflat Titanium Oxide Surfaces Studied with Atomic Force Microscopy

Langmuir ◽  
2000 ◽  
Vol 16 (21) ◽  
pp. 8167-8175 ◽  
Author(s):  
Paola Cacciafesta ◽  
Andrew D. L. Humphris ◽  
Klaus D. Jandt ◽  
Mervyn J. Miles
Keyword(s):  
Atomic Force Microscopy ◽  
Human Plasma ◽  
Titanium Oxide ◽  
Plasma Fibrinogen ◽  
Oxide Surfaces ◽  
Force Microscopy ◽  
Atomic Force ◽  
Fibrinogen Adsorption

Fibrinogen and cellular adherability on differently treated titanium as implants

Open Physics ◽  
2012 ◽  
Vol 10 (1) ◽  
Author(s):  
Lukáš Fojt ◽  
Petr Klapetek ◽  
Luděk Strašák ◽  
Vladimír Vetterl
Keyword(s):  
Atomic Force Microscopy ◽  
Surface Treatment ◽  
Human Plasma ◽  
Titanium Surface ◽  
Plasma Fibrinogen ◽  
Cell Counting ◽  
Surface Material ◽  
Material Loss ◽  
Force Microscopy ◽  
Atomic Force

AbstractAdsorption of human plasma fibrinogen, osteoblasts, and fibroblasts on differently treated titanium samples as implants were examined in this study. Titanium samples were mechanically polished, chemically etched (with and without surface material loss), and grinded. The main goal of this study is to find the best surface treatment of titanium for its possible use as implants. Atomic force microscopy was used to evaluate the adsorption of human plasma fibrinogen onto the titanium samples. Cell counting was used to determine the adherability of osteoblasts and fibroblasts on the titanium samples. Our preliminary results show that the etched titanium surface with surface material loss is the best surface treatment used in our experiments.

A non-contact atomic force microscopy and  force spectroscopy  study of charging on oxide surfaces

2004 ◽  
Vol 15 (7) ◽  
pp. 862-866 ◽  
Author(s):  
C L Pang ◽  
T V Ashworth ◽  
H Raza ◽  
S A Haycock ◽  
G Thornton
Keyword(s):  
Atomic Force Microscopy ◽  
Force Spectroscopy ◽  
Oxide Surfaces ◽  
Spectroscopy Study ◽  
Force Microscopy ◽  
Atomic Force

Research on the atomic force microscopy-based fabrication of nanochannels on silicon oxide surfaces

2010 ◽  
Vol 55 (30) ◽  
pp. 3466-3471 ◽  
Author(s):  
ZhiQian Wang ◽  
NianDong Jiao ◽  
Steve Tung ◽  
ZaiLi Dong
Keyword(s):  
Atomic Force Microscopy ◽  
Silicon Oxide ◽  
Oxide Surfaces ◽  
Force Microscopy ◽  
Atomic Force
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