X-ray Scattering Studies of Maquette Peptide Monolayers. 1. Reflectivity and Grazing Incidence Diffraction at the Air/Water Interface

Langmuir ◽  
2000 ◽  
Vol 16 (26) ◽  
pp. 10404-10418 ◽  
Author(s):  
Joseph Strzalka ◽  
Xiaoxi Chen ◽  
Christopher C. Moser ◽  
P. Leslie Dutton ◽  
Benjamin M. Ocko ◽  
...  
Keyword(s):  
Grazing Incidence ◽  
Water Interface ◽  
X Ray ◽  
X Ray Scattering ◽  
Grazing Incidence Diffraction ◽  
Air Water Interface ◽  
Ray Scattering

X-ray Scattering Studies of Mixed Monolayers of Tetrakis(3,5-di-tert-butylphenyl)porphinatocopper(II) with Cadmium Arachidate at the Air/Water Interface

Langmuir ◽  
2000 ◽  
Vol 16 (17) ◽  
pp. 7051-7055 ◽  
Author(s):  
Jian Bang Peng ◽  
Gwen A. Lawrie ◽  
Geoffrey T. Barnes ◽  
Ian R. Gentle ◽  
Garry J. Foran ◽  
...  
Keyword(s):  
Water Interface ◽  
Mixed Monolayers ◽  
X Ray ◽  
X Ray Scattering ◽  
Air Water Interface ◽  
Ray Scattering

Real‐Time Probing of Nanowire Assembly Kinetics at the Air–Water Interface by In Situ Synchrotron X‐Ray Scattering

2018 ◽  
Vol 130 (27) ◽  
pp. 8262-8266 ◽  
Author(s):  
Zhen He ◽  
Hui‐Jun Jiang ◽  
Long‐Long Wu ◽  
Jian‐Wei Liu ◽  
Geng Wang ◽  
...  
Keyword(s):  
Real Time ◽  
Water Interface ◽  
X Ray ◽  
X Ray Scattering ◽  
Air Water Interface ◽  
Assembly Kinetics ◽  
Ray Scattering

An X-ray scattering study of lipid monolayers at the air-water interface and on solid supports

1988 ◽  
Vol 159 (1-2) ◽  
pp. 17-28 ◽  
Author(s):  
K. Kjaer ◽  
J. Als-Neilsen ◽  
C.A. Heln ◽  
P. Tippmann-Krayer ◽  
H. Möhwald
Keyword(s):  
Lipid Monolayers ◽  
Water Interface ◽  
Solid Supports ◽  
X Ray ◽  
X Ray Scattering ◽  
Air Water Interface ◽  
Scattering Study ◽  
Ray Scattering

scholarly journals Morphology of nanostructured materials

2002 ◽  
Vol 74 (9) ◽  
pp. 1553-1570 ◽  
Author(s):  
M. K. Sanyal ◽  
A. Datta ◽  
S. Hazra
Keyword(s):  
Thin Films ◽  
Nanostructured Materials ◽  
Small Angle ◽  
Grazing Incidence ◽  
Bulk Properties ◽  
X Ray ◽  
X Ray Scattering ◽  
Grazing Incidence Diffraction ◽  
Ray Scattering

Here we shall discuss the importance of grazing incidence X-ray scattering techniques in studying morphology of nanostructured materials confined in thin films and multilayers. In these studies, the shapes, sizes, and structures of nanostructured materials and their distribution in composites are investigated. These studies are important for understanding properties that may deviate considerably from the known bulk properties. We shall first outline basics of three X-ray scattering techniques, namely X-ray reflectivity, grazing incidence small-angle X-ray scattering, and grazing incidence diffraction, used for these studies. We shall then demonstrate the utility of these techniques using some known results.

scholarly journals X-ray Reflectometry and Related Surface Near X-ray Scattering Methods

2014 ◽  
Vol 228 (10-12) ◽  
Author(s):  
Oliver H. Seeck
Keyword(s):  
Grazing Incidence ◽  
Surface Structures ◽  
Wave Optics ◽  
Near Surface ◽  
X Ray ◽  
Full Theory ◽  
X Ray Scattering ◽  
Grazing Incidence Diffraction ◽  
Non Destructive ◽  
Ray Scattering

AbstractSurface sensitive X-ray scattering methods are mostly non-destructive tools which are frequently used to investigate the nature of thin films, interfaces and artificial near surface structures. Discussed here are diffraction based methods, namely reflectometry and the related techniques grazing incidence diffraction and crystal truncation rod measurements. For the experiment, an X-ray beam is diffracted from surface near structures of the sample and detected by adequate detectors. To analyze the data the according X-ray scattering theory has to be applied. The full theory of surface sensitive X-ray scattering is complex and based on general considerations from wave optics. However, instructive insights into the scattering processes are provided by the Born-approximation which in many cases yields sufficient results. The methods are applied to solve the structure of a mercury-electrolyte interface during a chemical reaction and to determine the strain distribution in surface near SiGe quantum dots.

Real‐Time Probing of Nanowire Assembly Kinetics at the Air–Water Interface by In Situ Synchrotron X‐Ray Scattering

2018 ◽  
Vol 57 (27) ◽  
pp. 8130-8134 ◽  
Author(s):  
Zhen He ◽  
Hui‐Jun Jiang ◽  
Long‐Long Wu ◽  
Jian‐Wei Liu ◽  
Geng Wang ◽  
...  
Keyword(s):  
Real Time ◽  
Water Interface ◽  
X Ray ◽  
X Ray Scattering ◽  
Air Water Interface ◽  
Assembly Kinetics ◽  
Ray Scattering
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