Extended Spectral Analysis of Multiple Beam Interferometry: A Technique To Study Metallic Films in the Surface Forces Apparatus

Langmuir ◽  
1994 ◽  
Vol 10 (7) ◽  
pp. 2389-2394 ◽  
Author(s):  
John M. Levins ◽  
T. Kyle Vanderlick
2015 ◽  
Vol 162 (7) ◽  
pp. C327-C332 ◽  
Author(s):  
Buddha Ratna Shrestha ◽  
Qingyun Hu ◽  
Theodoros Baimpos ◽  
Kai Kristiansen ◽  
Jacob N. Israelachvili ◽  
...  

2014 ◽  
Vol 85 (1) ◽  
pp. 013702 ◽  
Author(s):  
Gutian Zhao ◽  
Qiyan Tan ◽  
Li Xiang ◽  
Di Zhang ◽  
Zhonghua Ni ◽  
...  

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