Determination of Singlet Exciton Diffusion Length in Thin Evaporated C60 Films for Photovoltaics

2012 ◽  
Vol 3 (17) ◽  
pp. 2367-2373 ◽  
Author(s):  
Maria C. Fravventura ◽  
Jaehyung Hwang ◽  
John W. A. Suijkerbuijk ◽  
Peter Erk ◽  
Laurens D. A. Siebbeles ◽  
...  
Keyword(s):  
Diffusion Length ◽  
Singlet Exciton ◽  
Exciton Diffusion ◽  
Exciton Diffusion Length ◽  
C60 Films

scholarly journals Effect of Quencher, Geometry, and Light Out‐Coupling on the Determination of Exciton Diffusion Length in Non‐Fullerene Acceptors

Solar RRL ◽  
2021 ◽  
Author(s):  
Valentina Belova ◽  
Aleksandr Perevedentsev ◽  
Julien Gorenflot ◽  
Catherine S. P. De Castro ◽  
Miquel Casademont-Viñas ◽  
...  
Keyword(s):  
Diffusion Length ◽  
Exciton Diffusion ◽  
Exciton Diffusion Length

Singlet exciton diffusion length in organic light-emitting diodes

2012 ◽  
Vol 85 (24) ◽  
Author(s):  
Simone Hofmann ◽  
Thomas C. Rosenow ◽  
Malte C. Gather ◽  
Björn Lüssem ◽  
Karl Leo
Keyword(s):  
Light Emitting Diodes ◽  
Diffusion Length ◽  
Organic Light Emitting Diodes ◽  
Light Emitting ◽  
Singlet Exciton ◽  
Exciton Diffusion ◽  
Exciton Diffusion Length ◽  
Organic Light

Peak Force Visible Microscopy for Determination of Exciton Diffusion Length in Organic Photovoltaic Blends

2018 ◽  
Author(s):  
Haomin Wang ◽  
Le Wang ◽  
Yuequn Shang ◽  
Zhijun Ning ◽  
Xiaoji Xu
Keyword(s):  
Diffusion Length ◽  
Spectroscopic Technique ◽  
Peak Force ◽  
Organic Photovoltaic ◽  
Phase Separations ◽  
Blend Films ◽  
Exciton Diffusion ◽  
Exciton Diffusion Length ◽  
Atomic Force

In this article, we developed a new nano spectroscopic technique, peak force visible (PF-vis) microscopy, which is based on the peak force tapping mode in an atomic force microscope to both visualize nanoscale morphology and estimate exciton diffusion lengths of donor domains in organic photovoltaic blends. Nano phase-separations in P3HT:PCBM and TFB:PCBM blend films were clearly revealed by PF-vis microscopy with a high spatial resolution less than 10 nm. A model that correlates PF-vis signal and the exciton diffusion length was also developed to estimate the diffusion lengths of P3HT and TFB to be 2.9±0.3 and 9.0±1.5 nm, respectively. PF-vis microscopy is expected to assist the evaluation of OPV materials, therefore accelerating the pace of innovation of OPVs.

Fast predictions of exciton diffusion length in organic materials

2019 ◽  
Vol 7 (14) ◽  
pp. 4066-4071 ◽  
Author(s):  
Leonardo Evaristo de Sousa ◽  
Fernando Teixeira Bueno ◽  
Geraldo Magela e Silva ◽  
Demétrio Antônio da Silva Filho ◽  
Pedro Henrique de Oliveira Neto
Keyword(s):  
Organic Materials ◽  
Diffusion Length ◽  
Singlet Exciton ◽  
Exciton Diffusion ◽  
Exciton Diffusion Length ◽  
Computational Protocol

Simple computational protocol for the estimation of singlet exciton diffusion length in organic materials.

Determination of exciton diffusion length from photoconductivity low-temperature spectra

1971 ◽  
Vol 48 (2) ◽  
pp. 473-480 ◽  
Author(s):  
B. V. Novikov ◽  
A. V. Ilinskii ◽  
K. F. Lieder ◽  
N. S. Sokolov
Keyword(s):  
Low Temperature ◽  
Diffusion Length ◽  
Exciton Diffusion ◽  
Exciton Diffusion Length ◽  
Temperature Spectra

Peak Force Visible Microscopy for Determination of Exciton Diffusion Length in Organic Photovoltaic Blends

2018 ◽  
Author(s):  
Haomin Wang ◽  
Le Wang ◽  
Yuequn Shang ◽  
Zhijun Ning ◽  
Xiaoji Xu
Keyword(s):  
Diffusion Length ◽  
Spectroscopic Technique ◽  
Peak Force ◽  
Organic Photovoltaic ◽  
Phase Separations ◽  
Blend Films ◽  
Exciton Diffusion ◽  
Exciton Diffusion Length ◽  
Atomic Force

In this article, we developed a new nano spectroscopic technique, peak force visible (PF-vis) microscopy, which is based on the peak force tapping mode in an atomic force microscope to both visualize nanoscale morphology and estimate exciton diffusion lengths of donor domains in organic photovoltaic blends. Nano phase-separations in P3HT:PCBM and TFB:PCBM blend films were clearly revealed by PF-vis microscopy with a high spatial resolution less than 10 nm. A model that correlates PF-vis signal and the exciton diffusion length was also developed to estimate the diffusion lengths of P3HT and TFB to be 2.9±0.3 and 9.0±1.5 nm, respectively. PF-vis microscopy is expected to assist the evaluation of OPV materials, therefore accelerating the pace of innovation of OPVs.

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