Application of Ultraviolet Photoelectron Spectroscopy in the Surface Characterization of Polycrystalline Oxide Catalysts. 2. Depth Variation of the Reduction Degree in the Surface Region of Partially Reduced V2O5

2000 ◽  
Vol 104 (22) ◽  
pp. 5288-5297 ◽  
Author(s):  
M. Heber ◽  
W. Grünert
Keyword(s):  
Photoelectron Spectroscopy ◽  
Surface Characterization ◽  
Surface Region ◽  
Oxide Catalysts ◽  
Ultraviolet Photoelectron Spectroscopy ◽  
Reduction Degree ◽  
Depth Variation

Surface Characterization of Carbon-Bearing Magnetite (CBM) and Carbon-Bearing Ni(II)-Ferrite (CBNF)

1994 ◽  
Vol 344 ◽  
Author(s):  
T. Sano ◽  
K. Akanuma ◽  
M. Tsuji ◽  
Y. Tamaura
Keyword(s):  
Photoelectron Spectroscopy ◽  
Spinel Structure ◽  
Surface Characterization ◽  
Carbon Deposition ◽  
X Ray Diffraction ◽  
Xps Spectra ◽  
X Ray ◽  
Oxygen Ions ◽  
Diffraction Patterns

AbstractOxygen-deficient magnetite (ODM; Fe3O4-δ, δ>0) synthesized by reduction of magnetite with H2 at 300°C decomposed CO2 to carbon with an efficiency of nearly 100% at 300°C. In this reaction, two oxygen ions of the CO2 were incorporated into the spinel structure of ODM and carbon was deposited on the surface of ODM with zero valence to form visible particles. The particles of carbon separated from ODM were studied by Raman, energy-dispersive X-ray and wave-dispersive X-ray spectroscopies. The carbon which had been deposited on the ODM was found to be a mixture of graphite and amorphous carbon in at least two levels of crystallization. X-ray photoelectron spectroscopy and X-ray diffraction patterns of the carbon-bearing magnetite (CBM) showed no indication of carbide (Fe3C) or metallic iron (α-Fe) phase formation. In the C 1s XPS spectra of the CBM, no peaks were observed which could be assigned to CO2 or CO. X-ray diffractometry, chemical analysis and TG-MS measurement showed that the carbon-bearing Ni(II)-ferrite (CBNF) (Ni(II)/Fetotal = 0.15) synthesized by the carbon deposition reaction from CO2 with the H2-reduced Ni(II)-ferrite was represented by (Ni0.28Fe2.72O4.00)1-δ (Ni2+06.9Fe2+2.31O3.00)δCτ (δ= 0.27, τ= 0.17). The carbon of the CBNF gave the CIOlayer-like oxide containing some Ni2+ ions.

Surface characterization of the high voltage LiCoO2/Li cell by X-ray photoelectron spectroscopy and 2D correlation analysis

2010 ◽  
Vol 53 (1) ◽  
pp. 60-63 ◽  
Author(s):  
Yeonju Park ◽  
Nam Hoon Kim ◽  
Ja Young Kim ◽  
In-Yong Eom ◽  
Yeon Uk Jeong ◽  
...  
Keyword(s):  
Correlation Analysis ◽  
High Voltage ◽  
Photoelectron Spectroscopy ◽  
Surface Characterization ◽  
X Ray ◽  
2D Correlation Analysis

Surface Characterization of an Extruded 6060 Al Alloy

2007 ◽  
Vol 29-30 ◽  
pp. 67-70
Author(s):  
Wei Zhang ◽  
Jim Metson ◽  
C.L. Nguyen ◽  
S. Chen
Keyword(s):  
Aluminium Alloy ◽  
Photoelectron Spectroscopy ◽  
Surface Characterization ◽  
Extrusion Direction ◽  
Surface Characteristics ◽  
Al Alloy ◽  
X Ray ◽  
Film Instability ◽  
Mg Content

The surface characteristics of an extruded 6060 aluminium alloy were investigated with X-ray Photoelectron Spectroscopy (XPS). The results revealed that the extruded surface was covered by oxides of aluminium and magnesium. The thickness of aluminium oxide was found to change along the extrusion direction with the thinnest and thickest oxide at the beginning and end of the extrudate, respectively. Magnesium segregation was found on the surface of the extrusion with the highest and lowest Mg concentration at the beginning and end of the extrudate, respectively. This is the inverse result of that expected where increasing Mg content was believed to be associated with film instability and thicker films.

Energetic Deposition and Surface Characterization of Thin Carbon Films on Nickel

1998 ◽  
Vol 12 (10) ◽  
pp. 383-391
Author(s):  
K. P. Adhi ◽  
A. K. Sharma ◽  
S. S. Wagal ◽  
D. S. Joag ◽  
S. K. Kulkarni
Keyword(s):  
Photoelectron Spectroscopy ◽  
Surface Characterization ◽  
Carbon Films ◽  
Polycrystalline Nickel ◽  
Thin Carbon ◽  
Nickel Substrates ◽  
Phase Surface ◽  
Electron Energy Loss ◽  
Deposited Films

Thin films deposited by rapidly quenching the energetic carbon species impinging onto polycrystalline nickel substrates were studied by X-ray photoelectron spectroscopy (XPS), electron energy loss spectroscopy (EELS), and field ion microscopy (FIM). XPS and EELS of the deposited films, when compared with those recorded for graphite and synthetic diamond, indicated the growth of diamond like carbon films and amorphic diamond (a-D) phase. Surface atomic arrangement in the film is observed by FIM which magnifies the surface ~105 to 106 times. Facetting, lack of graphitic ordering, stability of the image inspite of raising or lowering the voltage about the field evaporation voltage indicate that the field ion micrograph is that of a-D.

Characterization of Surface Contaminants by a Silver Film-Enhanced IR—Johnson Method

1997 ◽  
Vol 51 (10) ◽  
pp. 1460-1463 ◽  
Author(s):  
Nobuaki Marino ◽  
Kiichirou Murai ◽  
Yoshinori Kataora
Keyword(s):  
Polymer Film ◽  
Silicon Wafer ◽  
Photoelectron Spectroscopy ◽  
Present Method ◽  
Surface Characterization ◽  
Diffuse Reflectance ◽  
Silver Film ◽  
Wafer Surface ◽  
Surface Contaminants

Characterization of nanometer-order organic contaminants on polymer film and silicon wafer surface has been investigated by a modified IR–Johnson method. We have proposed a silver film-enhanced IR–Johnson method that is useful for surface contaminant analysis. In the present method, organic traces are transferred from the surface of a polymer film or silicon wafer onto the KBr particles deposited with silver film, and then the KBr particles are analyzed directly by diffuse reflectance infrared Fourier transform spectroscopy (DRIFTS). Infrared absorption of organic traces was enhanced by the presence of silver island film. With this method, a spectrum of nanometer-order organic traces can be obtained without any interference from the polymer film substrate. The present method is as surface-sensitive as X-ray photoelectron spectroscopy (XPS) and provides a large amount of information on the chemical structure of surface contaminants. This is a promising method for the surface characterization of polymer films and silicon wafer. Index Headings: Infrared; Diffuse reflectance; Surface enhancement.

Surface characterization of colloidal polypyrrole particles synthesized with reactive steric stabilizers using X-ray photoelectron spectroscopy

Polymer ◽  
1996 ◽  
Vol 37 (13) ◽  
pp. 2743-2749 ◽  
Author(s):  
M.R. Simmons ◽  
P.A. Chaloner ◽  
S.P. Armes ◽  
E.T. Kang ◽  
K.L. Tan ◽  
...  
Keyword(s):  
Photoelectron Spectroscopy ◽  
Surface Characterization ◽  
X Ray
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