Simple Electrochemical Procedure for Measuring the Rates of Electron Transfer across Liquid/Liquid Interfaces Formed by Coating Graphite Electrodes with Thin Layers of Nitrobenzene

1998 ◽  
Vol 102 (49) ◽  
pp. 9850-9854 ◽  
Author(s):  
Chunnian Shi ◽  
Fred C. Anson
2006 ◽  
Vol 110 (39) ◽  
pp. 19433-19442 ◽  
Author(s):  
William J. Royea ◽  
Thomas W. Hamann ◽  
Bruce S. Brunschwig ◽  
Nathan S. Lewis

1982 ◽  
Vol 141 ◽  
pp. 23-32 ◽  
Author(s):  
Robert M. Ianniello ◽  
Thomas J. Lindsay ◽  
Alexander M. Yacynych

2002 ◽  
Vol 14 (19-20) ◽  
pp. 1411-1418 ◽  
Author(s):  
Elena E. Ferapontova ◽  
N. Scott Reading ◽  
Steven D. Aust ◽  
Tautgirdas Ruzgas ◽  
Lo Gorton

2018 ◽  
Vol 20 (30) ◽  
pp. 20010-20022 ◽  
Author(s):  
Anthony J. Slate ◽  
Dale A. C. Brownson ◽  
Ahmed S. Abo Dena ◽  
Graham C. Smith ◽  
Kathryn A. Whitehead ◽  
...  

A direct relationship is shown with respect to the lateral flake size comprising graphene and graphite electrodes and their corresponding electron transfer properties, with smaller flake sizes (increased edge plane contributions) resulting in improved performance.


Surfaces ◽  
2020 ◽  
Vol 3 (3) ◽  
pp. 392-407
Author(s):  
Marco Favaro

Molecular-level understanding of electrified solid/liquid interfaces has recently been enabled thanks to the development of novel in situ/operando spectroscopic tools. Among those, ambient pressure photoelectron spectroscopy performed in the tender/hard X-ray region and coupled with the “dip and pull” method makes it possible to simultaneously interrogate the chemical composition of the interface and built-in electrical potentials. On the other hand, only thin liquid films (on the order of tens of nanometers at most) can be investigated, since the photo-emitted electrons must travel through the electrolyte layer to reach the photoelectron analyzer. Due to the challenging control and stability of nm-thick liquid films, a detailed experimental electrochemical investigation of such thin electrolyte layers is still lacking. This work therefore aims at characterizing the electrochemical behavior of solid/liquid interfaces when confined in nanometer-sized regions using a stochastic simulation approach. The investigation was performed by modeling (i) the electron transfer between a solid surface and a one-electron redox couple and (ii) its diffusion in solution. Our findings show that the well-known thin-layer voltammetry theory elaborated by Hubbard can be successfully applied to describe the voltammetric behavior of such nanometer-sized interfaces. We also provide an estimation of the current densities developed in these confined interfaces, resulting in values on the order of few hundreds of nA·cm−2. We believe that our results can contribute to the comprehension of the physical/chemical properties of nano-interfaces, thereby aiding to a better understanding of the capabilities and limitations of the “dip and pull” method.


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