Neutron Reflection Study of Phenol Adsorbed at the Surface of Its Aqueous Solutions:  An Unusual Adsorbed Layer

1998 ◽  
Vol 102 (1) ◽  
pp. 185-192 ◽  
Author(s):  
Z. X. Li ◽  
R. K. Thomas ◽  
A. R. Rennie ◽  
J. Penfold
1996 ◽  
Vol 464 ◽  
Author(s):  
U. Sawhney ◽  
C.J. Durning ◽  
B. O'Shaughnessy ◽  
G.S. Smith ◽  
J. Majewski

ABSTRACTWe studied the equilibrium architecture of polymer layers strongly adsorbed from the melt. Immobilized layers of poly-(methyl methacrylate) (PMMA) were produced by the following method: 1) The polymer was spin-coated onto silanol bearing surfaces of single crystal and fused quartz, and annealed at melt conditions, 2) The annealed layer was quenched to room temperature (below the glass transition temperature) in order to “freeze in” the melt structure near the substrate, 3) Unbound material was leached away in good solvent (benzene) to leave a residual, strongly-adsorbed layer. The architecture of this layer was studied by neutron reflection. Data on dried adsorbed layers indicates a dense PMMA film whose thickness gradually increases with annealing time in the melt from a minimal value. Evidently, annealing gradually relaxes a rather flat non-equilibrium structure produced by spin-coating. The thicknesses, h, in a series of dry layers annealed long enough to achieve equilibrium conditions in the melt scale as h ∼ N1/2. Data on swollen layers suggest a dilute, extended layer, but the preliminary results cannot give a definitive confirmation of the brush structure predicted by Guiselin.11


1997 ◽  
Vol 101 (36) ◽  
pp. 7121-7126 ◽  
Author(s):  
J. D. Hines ◽  
P. R. Garrett ◽  
G. K. Rennie ◽  
R. K. Thomas ◽  
J. Penfold

Surfactants ◽  
2019 ◽  
pp. 156-174
Author(s):  
Bob Aveyard

Some widely used techniques for the direct physical investigation of the structure of adsorbed surfactant films are introduced. Neutron reflection has yielded very detailed information about adsorbed surfactant films, although it is not readily accessible to many researchers. There are however commercial instruments available for a number of other techniques which are to be found in numerous laboratories. Scanning probe microscopies (STM and AFM) are capable of producing quite remarkable images of surfactant layers on solids and clearly show how surfactants form aggregates at surfaces. Ellipsometry is capable of yielding adsorbed layer thickness and refractive index from which composition with respect to solvent and surfactant can be deduced. The quartz crystal microbalance (QCM) and its variant, QCM-D, can give adsorbed amounts (including hydration in aqueous systems). Brewster angle microscopy (BAM) is a useful tool for the visualization of phase behaviour in surfactant films.


1995 ◽  
Vol 99 (12) ◽  
pp. 4113-4123 ◽  
Author(s):  
J. R. Lu ◽  
R. K. Thomas ◽  
B. P. Binks ◽  
P. D. I. Fletcher ◽  
J. Penfold

Langmuir ◽  
1998 ◽  
Vol 14 (7) ◽  
pp. 1637-1645 ◽  
Author(s):  
I. P. Purcell ◽  
J. R. Lu ◽  
R. K. Thomas ◽  
A. M. Howe ◽  
J. Penfold

2000 ◽  
Vol 2 (22) ◽  
pp. 5214-5221 ◽  
Author(s):  
G. Fragneto ◽  
T. J. Su ◽  
J. R. Lu ◽  
R. K. Thomas ◽  
A. R. Rennie

1996 ◽  
Vol 92 (4) ◽  
pp. 565 ◽  
Author(s):  
Z. X. Li ◽  
J. R. Lu ◽  
R. K. Thomas ◽  
A. R. Rennie ◽  
J. Penfold

Sign in / Sign up

Export Citation Format

Share Document