Time-Resolved in-Situ Experiments on the Crystallization of Natural Gas Hydrates

1996 ◽  
Vol 100 (16) ◽  
pp. 6412-6414 ◽  
Author(s):  
Carolyn A. Koh ◽  
Jeffrey L. Savidge ◽  
Chiu C. Tang
Keyword(s):  
Natural Gas ◽  
Gas Hydrates ◽  
Time Resolved ◽  
Natural Gas Hydrates ◽  
In Situ Experiments

In situ X-Ray Diffraction Method to Study Natural Gas Hydrates

1998 ◽  
Vol 278-281 ◽  
pp. 335-341 ◽  
Author(s):  
C.C. Tang ◽  
M.C. Miller ◽  
Robert J. Cernik ◽  
S.M. Clark ◽  
C.A. Koh ◽  
...  
Keyword(s):  
Natural Gas ◽  
Gas Hydrates ◽  
Diffraction Method ◽  
X Ray Diffraction ◽  
X Ray ◽  
Natural Gas Hydrates

Natural gas hydrates: myths, facts and issues

2004 ◽  
Vol 336 (9) ◽  
pp. 751-765 ◽  
Author(s):  
Benoı̂t Beauchamp
Keyword(s):  
Natural Gas ◽  
Gas Hydrates ◽  
Natural Gas Hydrates

Pulsed Microwave Processing of High-TC Superconducting Films

1992 ◽  
Vol 269 ◽  
Author(s):  
R. B. James ◽  
R. A. Alvarez ◽  
A. K. Stamper ◽  
X. J. Bao ◽  
T. E. Schlesinger ◽  
...  
Keyword(s):  
Phase Transition ◽  
Barium Copper Oxide ◽  
Precursor Film ◽  
Silicon Substrates ◽  
Molten Layer ◽  
Time Resolved ◽  
Barium Copper ◽  
In Situ Experiments ◽  
Yttrium Barium

ABSTRACTWe have used 2.0-μsec microwave pulses at a frequency of 2.856 GHz to rapidly heat thin amorphous yttrium-barium-copper-oxide (YBCO) films deposited onto silicon substrates. The samples were irradiated inside a WR-284 waveguide by single-pass TE10 pulses in a traveling wave geometry. X-ray diffractometry studies show that an amorphous-to-crystalline phase transition occurs for incident pulse powers exceeding about 6 MW, in which case the amorphous YBCO layer is converted to Y2BaCuO5. Microscopy of the irradiated film reveals that the phase transition is brought about by melting of the YBCO precursor film and crystallization of the molten layer upon solidification. Time-resolved in situ experiments of the microwave reflectivity (R) and transmissivity (T) show that there is an abrupt change in R for microwave pulse powers exceeding the melt threshold, so that measurements of R and T can be used to monitor the onset of surface melting.

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